scholarly journals Aontia: un antico toponimo dalle Mappe Aragonesi

X ◽  
2020 ◽  
Author(s):  
Antonio Pecci ◽  
Ida Campanile
Keyword(s):  
Fifteenth Century ◽  
Historical Study ◽  
Topographic Survey ◽  
Kingdom Of Naples ◽  
Geographical Maps ◽  
State Archives ◽  
Ancient Maps ◽  
High Degree

Aontia: an ancient toponym from the Aragon mapsThe Aragon geographical maps represent the territory of the ancient Kingdom of Naples. they date back to the second half of the fifteenth century, probably some of them or some copies were subsequently modified or updated. These ancient maps were rediscovered about thirty years ago in the State Archives of Naples and in the Bibliothèque Nationale de France in Paris, and they have been under study for some years. They are unfortunately still little used in the scientific field, although several contributions have demonstrated their validity as an investigation tool thanks to their undoubted information potential. In fact, thanks to the very high degree of characterization of these maps it is possible to advance hypotheses and considerations of a historical-archaeological nature of the territories they represent. It is often toponymic analysis that offers insights and guides the early stages of research: toponyms relating to natural and anthropic elements inform about landscapes rich of medieval and classical references. The case study proposed here relates to the toponym Aontia, located on the Aragon maps near the centers of the Basilicata of Cirigliano and Gorgoglione. It is a place currently unidentified and not attested in any medieval or modern source; its toponym may refer to some references relating to an epithet of the well-known Greek divinity Artemis and to the presence of a sanctuary dedicated to it or to an ancient settlement. Starting from the analysis of the toponym Aontia, a localization proposal will be carried out based on the etymological and historical study, on the topographic survey and on the remote sensing analysis.

scholarly journals Iron Making in Fornovolasco (Italy) at the End of the Fifteenth Century, the Canecchio Furnace, and an Artifact Characterization

2021 ◽  
Author(s):  
Andrea Gruttadauria ◽  
Silvia Barella ◽  
Carlo Mapelli ◽  
Davide Mombelli
Keyword(s):  
Cast Iron ◽  
Fifteenth Century ◽  
Final Section ◽  
The State ◽  
Iron Production ◽  
15Th Century ◽  
State Archives

AbstractThis study investigates the rise of the Este family in Garfagnana (Tuscany, Italy) during the first half of the 15th century. The Este wanted to annex this region to improve their cast-iron production both for military and economic advantages. This article, thanks to a document found in the State Archives of Modena, encompasses an overview of the Fornovolasco settlement, a description of the furnace room, an analysis of the first casting campaign, and an attempt at furnace sizing. In the final section, a brief characterization of a cast-iron artifact found in that region and probably coming from this casting campaign is provided.

Characterization of RF Sputtered ZnO Piezoelectric Films Using Transmission Electron Microscope

1975 ◽  
Vol 33 ◽  
pp. 86-87
Author(s):  
Kemining W. Yeh ◽  
Richard S. Muller ◽  
Wei-Kuo Wu ◽  
Jack Washburn
Keyword(s):  
Integrated Circuit ◽  
Acoustic Waves ◽  
New Technology ◽  
Surface Acoustic Waves ◽  
Electromechanical Properties ◽  
Leading Role ◽  
Saw Devices ◽  
Transmission Electron ◽  
High Degree

Considerable and continuing interest has been shown in the thin film transducer fabrication for surface acoustic waves (SAW) in the past few years. Due to the high degree of miniaturization, compatibility with silicon integrated circuit technology, simplicity and ease of design, this new technology has played an important role in the design of new devices for communications and signal processing. Among the commonly used piezoelectric thin films, ZnO generally yields superior electromechanical properties and is expected to play a leading role in the development of SAW devices.

Construction of plastic contact deformation maps on ceramics: a case study on aluminum nitride

1996 ◽  
Vol 54 ◽  
pp. 636-637
Author(s):  
D. L. Callahan
Keyword(s):  
Plastic Deformation ◽  
Aluminum Nitride ◽  
Mechanical Response ◽  
Three Dimensional ◽  
Bright Field Image ◽  
Perfectly Plastic ◽  
Contrast Analysis ◽  
Deformation Patterns

Modern polishing, precision machining and microindentation techniques allow the processing and mechanical characterization of ceramics at nanometric scales and within entirely plastic deformation regimes. The mechanical response of most ceramics to such highly constrained contact is not predictable from macroscopic properties and the microstructural deformation patterns have proven difficult to characterize by the application of any individual technique. In this study, TEM techniques of contrast analysis and CBED are combined with stereographic analysis to construct a three-dimensional microstructure deformation map of the surface of a perfectly plastic microindentation on macroscopically brittle aluminum nitride.The bright field image in Figure 1 shows a lg Vickers microindentation contained within a single AlN grain far from any boundaries. High densities of dislocations are evident, particularly near facet edges but are not individually resolvable. The prominent bend contours also indicate the severity of plastic deformation. Figure 2 is a selected area diffraction pattern covering the entire indentation area.

Integrating The Geophysical Characterization Of Seismic Thin Beds With Stochastic Reservoir Modeling: A Case Study From The Kutei Basin (Offshore Kalimantan, Indonesia)

2011 ◽  
Author(s):  
Giorgio Rocco Cavanna ◽  
Ernesto Caselgrandi ◽  
Elisa Corti ◽  
Alessandro Amato del Monte ◽  
Massimo Fervari ◽  
...  
Keyword(s):  
Reservoir Modeling ◽  
Geophysical Characterization

Failure Analysis of CDM-ESD Damage in a GaAs RFIC

2000 ◽  
Author(s):  
Amy Poe ◽  
Steve Brockett ◽  
Tony Rubalcava
Keyword(s):  
Radio Frequency ◽  
Failure Analysis ◽  
Integrated Circuit ◽  
Production Test ◽  
Analysis Techniques ◽  
Device Model ◽  
Charged Device ◽  
Subsequent Failure

Abstract The intent of this work is to demonstrate the importance of charged device model (CDM) ESD testing and characterization by presenting a case study of a situation in which CDM testing proved invaluable in establishing the reliability of a GaAs radio frequency integrated circuit (RFIC). The problem originated when a sample of passing devices was retested to the final production test. Nine of the 200 sampled devices failed the retest, thus placing the reliability of all of the devices in question. The subsequent failure analysis indicated that the devices failed due to a short on one of two capacitors, bringing into question the reliability of the dielectric. Previous ESD characterization of the part had shown that a certain resistor was likely to fail at thresholds well below the level at which any capacitors were damaged. This paper will discuss the failure analysis techniques which were used and the testing performed to verify the failures were actually due to ESD, and not caused by weak capacitors.

dC/dV and CV Characterization of Gate Resistance Defects in eDRAM Circuits

2013 ◽  
Author(s):  
Sweta Pendyala ◽  
Dave Albert ◽  
Katherine Hawkins ◽  
Michael Tenney
Keyword(s):  
Deep Submicron ◽  
Work Flow ◽  
Localization Technique ◽  
Characterization Techniques ◽  
Capacitance Voltage ◽  
Gate Resistance

Abstract Resistive gate defects are unusual and difficult to detect with conventional techniques [1] especially on advanced devices manufactured with deep submicron SOI technologies. An advanced localization technique such as Scanning Capacitance Imaging is essential for localizing these defects, which can be followed by DC probing, dC/dV, CV (Capacitance-Voltage) measurements to completely characterize the defect. This paper presents a case study demonstrating this work flow of characterization techniques.

Case Study and Fault Modeling for Wrong Redundancy Evaluation on DRAM Devices

2007 ◽  
Author(s):  
Martin Versen ◽  
Dorina Diaconescu ◽  
Jerome Touzel
Keyword(s):  
Failure Mode ◽  
Failure Modes ◽  
Fault Modeling ◽  
Mode Analysis ◽  
Root Cause ◽  
Failure Mode Analysis

Abstract The characterization of failure modes of DRAM is often straight forward if array related hard failures with specific addresses for localization are concerned. The paper presents a case study of a bitline oriented failure mode connected to a redundancy evaluation in the DRAM periphery. The failure mode analysis and fault modeling focus both on the root-cause and on the test aspects of the problem.

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