The Initial Stages of Oxide Film Formation on Copper and Some Copper Alloys

CORROSION ◽  
1969 ◽  
Vol 25 (7) ◽  
pp. 291-299 ◽  
Author(s):  
M. D. SANDERSON ◽  
J. C. SCULLY
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
Film Formation ◽  
Copper Alloys ◽  
Amorphous Layer ◽  
Oxide Formation ◽  
Thin Foils ◽  
Transmission Electron ◽  
Crystallographic Planes

Abstract The initial stages of oxide formation on thin foils of copper, Cu-2.5Al-2.5Si, and Cu-7.5Al-2Si alloys in moist atmospheres of oxygen and sulfur dioxide have been studied by transmission electron microscopy and electron diffraction over the temperature range 200-380 C (392-716 F). On the Cu-2.5Al-2.5Si alloy grain boundaries and twin boundaries are preferential sites for oxide nucleation. On the Cu-7.5Al-2Si alloy no preferential sites are observed. The relative reactivities of different crystallographic planes are the same for the alloys as for the metal. On oxidized thin foils a prenucleation thermal pitting phenomenon has been observed at temperatures very much lower than the thermal pitting observed by other workers. Oxide nuclei have been observed to form on a thin amorphous layer of oxide even when there is no metal directly underneath. These results are discussed with reference to current theories on the initial stages of oxide formation. It is concluded that in the prenucleation stage the metal surface is covered with a highly mobile layer of cations and anions.

Phenomena Associated with Oxygen in Titanium

1967 ◽  
Vol 25 ◽  
pp. 310-311
Author(s):  
E. U. Lee ◽  
P. A. Garner ◽  
J. S. Owens
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Microstructural Changes ◽  
Electrolytic Polishing ◽  
Interstitial Impurities ◽  
Thin Foils ◽  
Transmission Electron ◽  
Iodide Titanium ◽  
Alpha Titanium

Evidence for ordering (1-6) of interstitial impurities (O and C) has been obtained in b.c.c. metals, such as niobium and tantalum. In this paper we report the atomic and microstructural changes in an oxygenated c.p.h. metal (alpha titanium) as observed by transmission electron microscopy and diffraction.Oxygen was introduced into zone-refined iodide titanium sheets of 0.005 in. thickness in an atmosphere of oxygen and argon at 650°C, homogenized at 800°C and furnace-cooled in argon. Subsequently, thin foils were prepared by electrolytic polishing and examined in a JEM-7 electron microscope, operated at 100 KV.

Simulation of three Dimensional Defect Images in Transmission Electron Microscopy

1976 ◽  
Vol 34 ◽  
pp. 470-471
Author(s):  
W. D. Cooper ◽  
C. S. Hartley ◽  
J. J. Hren
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Three Dimensional ◽  
Crystalline Lattice ◽  
Continuum Models ◽  
Thin Foils ◽  
Transmission Electron ◽  
Microscope Images ◽  
General Computer Program ◽  
General Computer

Interpretation of electron microscope images of crystalline lattice defects can be greatly aided by computer simulation of theoretical contrast from continuum models of such defects in thin foils. Several computer programs exist at the present time, but none are sufficiently general to permit their use as an aid in the identification of the range of defect types encountered in electron microscopy. This paper presents progress in the development of a more general computer program for this purpose which eliminates a number of restrictions contained in other programs. In particular, the program permits a variety of foil geometries and defect types to be simulated.The conventional approximation of non-interacting columns is employed for evaluation of the two-beam dynamical scattering equations by a piecewise solution of the Howie-Whelan equations.

Transmission Electron Microscopy of Evaporated Perylene Thin Films

1990 ◽  
Vol 48 (2) ◽  
pp. 336-337
Author(s):  
C. Ewins ◽  
J.R. Fryer
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Transmission Electron Microscopy ◽  
Molecular Electronics ◽  
High Vacuum ◽  
Amorphous Layer ◽  
Electric Heater ◽  
Transmission Electron ◽  
Polycyclic Aromatic

The preparation of thin films of organic molecules is currently receiving much attention because of the need to produce good quality thin films for molecular electronics. We have produced thin films of the polycyclic aromatic, perylene C10H12 by evaporation under high vacuum onto a potassium chloride (KCl) substrate. The role of substrate temperature in determining the morphology and crystallography of the films was then investigated by transmission electron microscopy (TEM).The substrate studied was the (001) face of a freshly cleaved crystal of KCl. The temperature of the KCl was controlled by an electric heater or a cold finger. The KCl was heated to 200°C under a vacuum of 10-6 torr and allowed to cool to the desired temperature. The perylene was then evaporated over a period of one minute from a molybdenum boat at a distance of 10cm from the KCl. The perylene thin film was then backed with an amorphous layer of carbon and floated onto copper microscope grids.

Characterization of submicrometer fluid Inclusions in minerals by Analytical/Transmission Electron Microscopy and electron diffraction

1990 ◽  
Vol 48 (4) ◽  
pp. 424-424
Author(s):  
George Guthrie ◽  
David Veblen
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Microscope ◽  
Electron Diffraction ◽  
Light Microscopy ◽  
Fluid Inclusions ◽  
Energy Dispersive Spectrometer ◽  
Analytical Transmission Electron Microscopy ◽  
Transmission Electron

The nature of a geologic fluid can often be inferred from fluid-filled cavities (generally <100 μm in size) that are trapped during the growth of a mineral. A variety of techniques enables the fluids and daughter crystals (any solid precipitated from the trapped fluid) to be identified from cavities greater than a few micrometers. Many minerals, however, contain fluid inclusions smaller than a micrometer. Though inclusions this small are difficult or impossible to study by conventional techniques, they are ideally suited for study by analytical/ transmission electron microscopy (A/TEM) and electron diffraction. We have used this technique to study fluid inclusions and daughter crystals in diamond and feldspar.Inclusion-rich samples of diamond and feldspar were ion-thinned to electron transparency and examined with a Philips 420T electron microscope (120 keV) equipped with an EDAX beryllium-windowed energy dispersive spectrometer. Thin edges of the sample were perforated in areas that appeared in light microscopy to be populated densely with inclusions. In a few cases, the perforations were bound polygonal sides to which crystals (structurally and compositionally different from the host mineral) were attached (Figure 1).

Transmission Electron Microscopy of Epitaxial silicides grown by ultra high vacuum deposition

1989 ◽  
Vol 47 ◽  
pp. 462-463
Author(s):  
D. Loretto ◽  
J. M. Gibson ◽  
S. M. Yalisove
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
High Vacuum ◽  
High Energy ◽  
Energy Electron ◽  
Ultra High Vacuum ◽  
Ex Situ ◽  
Transmission Electron

The silicides CoSi2 and NiSi2 are both metallic with the fee flourite structure and lattice constants which are close to silicon (1.2% and 0.6% smaller at room temperature respectively) Consequently epitaxial cobalt and nickel disilicide can be grown on silicon. If these layers are formed by ultra high vacuum (UHV) deposition (also known as molecular beam epitaxy or MBE) their thickness can be controlled to within a few monolayers. Such ultrathin metal/silicon systems have many potential applications: for example electronic devices based on ballistic transport. They also provide a model system to study the properties of heterointerfaces. In this work we will discuss results obtained using in situ and ex situ transmission electron microscopy (TEM).In situ TEM is suited to the study of MBE growth for several reasons. It offers high spatial resolution and the ability to penetrate many monolayers of material. This is in contrast to the techniques which are usually employed for in situ measurements in MBE, for example low energy electron diffraction (LEED) and reflection high energy electron diffraction (RHEED), which are both sensitive to only a few monolayers at the surface.

scholarly journals Electron Microscopy Investigation of Magnetization Process in Thin Foils and Nanostructures

2007 ◽  
Vol 1026 ◽  
Author(s):  
Pascale Bayle-Guillemaud ◽  
Aurelien Masseboeuf ◽  
Fabien Cheynis ◽  
Jean-Christophe Toussaint ◽  
Olivier Fruchart ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Magnetic Anisotropy ◽  
Magnetic Induction ◽  
Perpendicular Magnetic Anisotropy ◽  
In Situ Observation ◽  
Magnetic Imaging ◽  
Thin Foils ◽  
Transmission Electron

AbstractThis paper presents investigations of magnetization configuration evolution during in-situ magnetic processes in materials exhibiting planar and perpendicular magnetic anisotropy. Transmission electron microscopy has been used to perform magnetic imaging. Fresnel contrasts in Lorentz Transmission Electron Microscopy (LTEM) and phase retrieval methods such as Transport of Intensity Equation (TIE) solving or electron holography have been implemented. These techniques are sensitive to magnetic induction perpendicular to the electron beam and can give access to a spatially resolved (resolution better than 10 nm) mapping of magnetic induction distribution and could be extended to dynamical studies during in-situ observation. Thin foils of FePd alloys with a strong perpendicular magnetic anisotropy (PMA) and self-assembled Fe dots are presented. Both are studied during magnetization processes exhibiting the capacities of in-situ magnetic imaging in a TEM.

Oxide scale behavior of Al–7.5 mass%Mg alloy containing trace Ca during short-term oxidation

2021 ◽  
Vol 11 (11) ◽  
pp. 1881-1886
Author(s):  
Seong-Ho Ha ◽  
Young-Ok Yoon ◽  
Bong-Hwan Kim ◽  
Hyun-Kyu Lim ◽  
Sung-Hwan Lim ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Oxide Film ◽  
Phase Diagrams ◽  
Film Formation ◽  
Mg Alloy ◽  
Short Term ◽  
Spinel Formation ◽  
Transmission Electron ◽  
Significant Difference

In this study, using transmission electron microscopy and phase diagrams from thermodynamic calculations, we investigated the oxide film formation of Al–7.5 mass%Mg alloy containing Ca traces during short-term oxidation in terms of the thermodynamic stability and multi-element oxides by inter-diffusion based on the results of analysis for the oxide film. For the oxidation test at 515 ˚C, for 1 h, its results showed that there is no significant difference between the Ca-added and Ca-free Al–7.5 mass%Mg alloys was observed, while further exposure caused the Ca-free alloy to gain significant weight. Based on the standard Gibbs free energy for oxide production calculated in this study, CaO was the most preferential product among the single metal oxides examined. As per calculations for MgAl2O4-spinel formation reactions, the spinel formation from MgO was thermodynamically the most favorable. According to the phase diagrams calculated in this study, various multi-element oxides including Ca could possibly form in the oxide layer of Ca-added alloy. The analysis results of transmission electron microscopy confirmed that MgO is the primary oxide in the Al–Mg binary alloys. In oxidation tests conducted for less than 1 h, the spinel was rarely found. The outmost areas of oxide layers correspond to MgO and CaO in Ca-free and Ca-added alloys, respectively. However, in the Ca-added alloy, the inner layer contains certain amounts of Ca, Al, and Mg.

scholarly journals Spore Coat Architecture of Clostridium novyi NT Spores

2007 ◽  
Vol 189 (17) ◽  
pp. 6457-6468 ◽  
Author(s):  
Marco Plomp ◽  
J. Michael McCaffery ◽  
Ian Cheong ◽  
Xin Huang ◽  
Chetan Bettegowda ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Anaerobic Bacterium ◽  
Amorphous Layer ◽  
Spore Coat ◽  
Experimental Animals ◽  
Force Microscopy ◽  
Atomic Force ◽  
Clostridium Novyi ◽  
Transmission Electron

ABSTRACT Spores of the anaerobic bacterium Clostridium novyi NT are able to germinate in and destroy hypoxic regions of tumors in experimental animals. Future progress in this area will benefit from a better understanding of the germination and outgrowth processes that are essential for the tumorilytic properties of these spores. Toward this end, we have used both transmission electron microscopy and atomic force microscopy to determine the structure of both dormant and germinating spores. We found that the spores are surrounded by an amorphous layer intertwined with honeycomb parasporal layers. Moreover, the spore coat layers had apparently self-assembled, and this assembly was likely to be governed by crystal growth principles. During germination and outgrowth, the honeycomb layers, as well as the underlying spore coat and undercoat layers, sequentially dissolved until the vegetative cell was released. In addition to their implications for understanding the biology of C. novyi NT, these studies document the presence of proteinaceous growth spirals in a biological organism.

Laser-Induced Oxidation and Crystallization of Thin Amorphous Sputtered Cr Films

1983 ◽  
Vol 29 ◽  
Author(s):  
M. I. Birjega ◽  
C. A. Constantin ◽  
M. Dinescu ◽  
I. Th. Florescu ◽  
I. N. Mihailescu ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Electron Diffraction ◽  
Laser Irradiation ◽  
Dwell Time ◽  
Free Standing ◽  
Transmission Electron Diffraction ◽  
Oxidation Processes ◽  
Transmission Electron ◽  
Power Densities

ABSTRACTThe crystallization and oxidation processes of thin, free-standing (FS), sputtered Cr films under the action of cw CO2 laser irradiation were studied by transmission electron microscopy (TEM) and transmission electron diffraction (TED). The crystallization is induced at power densities above 28.65 W cm−2, dwell time of 1 s, and the oxidation at power densities of 48.1 W cm−2 and longer dwell times.

Nano-Thermometry: Transmission Electron Microscopy of Femtosecond Laser Irradiated Co/Si Multilayer Thin Foils

2005 ◽  
Vol 899 ◽  
Author(s):  
Yoosuf Picard ◽  
Steven M. Yalisove
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Amorphous Silicon ◽  
Heat Dissipation ◽  
Crystalline Silicon ◽  
Pulse Length ◽  
Multilayer Systems ◽  
Hole Edge ◽  
Thin Foils ◽  
Transmission Electron

AbstractPre-thinned foils composed of amorphous silicon and polycrystalline cobalt were irradiated using femtosecond pulse-length lasers at fluences sufficient for ablation (material removal). The resultant ablated hole and surrounding vicinity was studied using transmission electron microscopy to determine modifications to the structure. Evidence of cobalt silicide formation was observed within a 3 micron radius of the laser hole edge by use of selected area electron diffraction (SAED). In addition, elongated grains of crystalline silicon was observed within 500 nm of the laser hole edge, indicating melting of the amorphous silicon and heat dissipation slow enough to allow recyrstallization. This initial work demonstrates the use of pre-designed nanostructured multilayer systems as a method for nanoscale profiling of heat dissipation following pulsed laser irradiation.

Sign in / Sign up

Export Citation Format

Share Document