scholarly journals First multispacecraft ion measurements in and near the Earth’s magnetosphere with the identical Cluster ion spectrometry (CIS) experiment

2001 ◽  
Vol 19 (10/12) ◽  
pp. 1303-1354 ◽  
Author(s):  
H. Rème ◽  
C. Aoustin ◽  
J. M. Bosqued ◽  
I. Dandouras ◽  
B. Lavraud ◽  
...  
Keyword(s):  
Solar Wind ◽  
Angular Resolution ◽  
Dynamic Range ◽  
Ion Beam ◽  
Three Dimensional ◽  
Charge Composition ◽  
Ion Distribution ◽  
Central Plasma ◽  
Cluster Ion ◽  
High Level

Abstract. On board the four Cluster spacecraft, the Cluster Ion Spectrometry (CIS) experiment measures the full, three-dimensional ion distribution of the major magnetospheric ions (H+, He+, He++, and O+) from the thermal energies to about 40 keV/e. The experiment consists of two different instruments: a COmposition and DIstribution Function analyser (CIS1/CODIF), giving the mass per charge composition with medium (22.5°) angular resolution, and a Hot Ion Analyser (CIS2/HIA), which does not offer mass resolution but has a better angular resolution (5.6°) that is adequate for ion beam and solar wind measurements. Each analyser has two different sensitivities in order to increase the dynamic range. First tests of the instruments (commissioning activities) were achieved from early September 2000 to mid January 2001, and the operation phase began on 1 February 2001. In this paper, first results of the CIS instruments are presented showing the high level performances and capabilities of the instruments. Good examples of data were obtained in the central plasma sheet, magnetopause crossings, magnetosheath, solar wind and cusp measurements. Observations in the auroral regions could also be obtained with the Cluster spacecraft at radial distances of 4–6 Earth radii. These results show the tremendous interest of multispacecraft measurements with identical instruments and open a new area in magnetospheric and solar wind-magnetosphere interaction physics.Key words. Magnetospheric physics (magnetopause, cusp and boundary layers; magnetopheric configuration and dynamics; solar wind - magnetosphere interactions)

Three-Dimensional Texture Analysis

2005 ◽  
Vol 495-497 ◽  
pp. 237-244 ◽  
Author(s):  
J.J.L. Mulders ◽  
A.P. Day
Keyword(s):  
Focused Ion Beam ◽  
Electron Backscatter Diffraction ◽  
Ion Beam ◽  
Three Dimensional ◽  
Level Of Automation ◽  
Complete Automation ◽  
Third Dimension ◽  
Sample Reconstruction ◽  
High Level ◽  
Backscatter Diffraction

Three-dimensional (3D) microscopy is a new and rapidly expanding area. A DualBeam system, with both a focused ion beam (FIB) column and an electron column, is a powerful instrument for imaging and sectioning microstructures to generate a full 3D sample reconstruction. When an electron backscatter diffraction (EBSD) system is attached to the DualBeam, it becomes a unique tool for making 3D crystallographic measurements on a wide variety of materials. Combining the successive removal by FIB, with sequential EBSD maps taken with the electron beam requires clear geometric considerations and a high level of automation to obtain a decent resolution in the third dimension, including positional sub-pixel re-alignment. Complete automation allows controlled sectioning and analysis of a significant volume of material without operator intervention: a process that may run continuously and automatically for many hours. Using a Nova600, a Channel 6 EBSD system and dedicated control software, Aluminium, Nickel and Steel specimens have been examined and volumes with up to 200 slices have been successfully analysed.

Surface Smoothing of Polycrystalline Si Waveguides With Gas-Cluster Ion Beams

1999 ◽  
Vol 597 ◽  
Author(s):  
N. Toyoda ◽  
K. K. Lee ◽  
H-C. Luan ◽  
D. R. Lim ◽  
A. M. Agarwal ◽  
...  
Keyword(s):  
Rough Surface ◽  
Ion Irradiation ◽  
Ion Beam ◽  
Three Dimensional ◽  
Optical Loss ◽  
Surface Smoothing ◽  
Multilayered Structures ◽  
Average Roughness ◽  
Scattering Loss ◽  
Cluster Ion

AbstractPolycrystalline Si (poly-Si) waveguides offer design flexibility and multilayered structures in Si-integrated photonic devices. However, as-deposited poly-Si surfaces are rough compared with single-crystalline Si, and a rough surface causes significant waveguide scattering loss at the surface. In this study, surface smoothing of poly-Si waveguides with a gas-cluster ion beam (GCIB) was demonstrated as a new smoothing technique. As the GCIB process is a directional ion-beam process, in principle it can be applied not only to plane surfaces but also to three-dimensional or non-flat structures, such as waveguide ridges.The initial average roughness of as-deposited poly-Si films (625°C, 1 μm thick) ranged from 15 nm to 22 nm, and the grain sizes were distributed from 0.2 to 0.4μm. This rough surface was dramatically smoothed to a roughness of 1.5 nm by Ar cluster ion irradiation. From the relation between the sputtered depth and the surface roughness, the sputtered depth must be greater than the height difference of the roughness (peak-to-valley) to obtain smooth surfaces. Optical transmission losses at λ =1.54 μm were measured using cutback measurement from samples before and after the smoothing by GCIB. After surface smoothing with GCIB, the optical loss decreased from 85 dB/cm to 54 dB/cm.

Three-dimensional compositional mapping using ion microscopy and volume-rendering techniques

1992 ◽  
Vol 50 (2) ◽  
pp. 1614-1615
Author(s):  
Richard W. Linton
Keyword(s):  
Secondary Ion Mass Spectrometry ◽  
Dynamic Range ◽  
Ion Beam ◽  
Three Dimensional ◽  
Depth Profiling ◽  
Range Image ◽  
Ion Beam Sputtering ◽  
Data Set ◽  
Depth Profiles ◽  
Image Depth

Secondary ion mass spectrometry (SIMS), using ion microprobe or microscope instrumentation, couples lateral imaging and dynamic ion beam sputtering to provide 3-D compositional maps (image depth profiles). A data set acquired with an ion microscope may involve more than 100 massresolved ion images, each containing at least 64,000 pixels, with typical lateral and depth resolutions of 1 μm and 10 nm, respectively. The vast majority of prior quantitative surface analysis studies have addressed depth profiling, thin film, or overlayer measurements without the additional feature of laterally resolved imaging. The ability to create 3-D compositional maps using SIMS creates enormous challenges for quantification. In principle, each volume element requires individual calibration reflecting the combined effects of spatial resolution, sample heterogeneity, and variations in instrumental response. An overview of analytical considerations will be presented involving aspects of data acquisition, display, and processing, with a special emphasis on sector field mass spectrometers that provide high dynamic range image depth profiles.

scholarly journals The Properties of the Solar Corona and Its Connection to the Solar Wind

2019 ◽  
Vol 57 (1) ◽  
pp. 157-187 ◽  
Author(s):  
Steven R. Cranmer ◽  
Amy R. Winebarger
Keyword(s):  
Solar Wind ◽  
Dynamic Range ◽  
Interplanetary Space ◽  
Three Dimensional ◽  
Scaling Relations ◽  
Physical Processes ◽  
Fundamental Physics ◽  
Weather Events ◽  
Hot Plasma ◽  
Complex Magnetic Field

The corona is a layer of hot plasma that surrounds the Sun, traces out its complex magnetic field, and ultimately expands into interplanetary space as the supersonic solar wind. Although much has been learned in recent decades from advances in observations, theory, and computer simulations, we still have not identified definitively the physical processes that heat the corona and accelerate the solar wind. In this review, we summarize these recent advances and speculate about what else is required to finally understand the fundamental physics of this complex system. Specifically: ▪ We discuss recent subarcsecond observations of the corona, some of which appear to provide evidence for tangled and braided magnetic fields and some of which do not. ▪ We review results from three-dimensional numerical simulations that, despite limitations in dynamic range, reliably contain sufficient heating to produce and maintain the corona. ▪ We provide a new tabulation of scaling relations for a number of proposed coronal heating theories that involve waves, turbulence, braiding, nanoflares, and helicity conservation. An understanding of these processes is important not only for improving our ability to forecast hazardous space-weather events but also for establishing a baseline of knowledge about a well-resolved star that is relevant to other astrophysical systems.

scholarly journals In-flight calibration of Hot Ion Analyser onboard Cluster

2013 ◽  
Vol 3 (2) ◽  
pp. 407-435 ◽  
Author(s):  
A. Blagau ◽  
I. Dandouras ◽  
A. Barthe ◽  
S. Brunato ◽  
G. Facskó ◽  
...  
Keyword(s):  
Solar Wind ◽  
Detection Efficiency ◽  
Radiation Detector ◽  
Three Dimensional ◽  
High Sensitivity ◽  
Operating Parameters ◽  
Cluster Ion ◽  
Low Sensitivity ◽  
Changes Over Time ◽  
Over Time

Abstract. The Hot Ion Analyser (HIA), part of the Cluster Ion Spectrometry experiment, has the objective to measure the three-dimensional velocity distributions of ions. Due to a variety of factors (exposure to radiation, detector fatigue and aging, changes in the operating parameters etc.), the particles detection efficiency changes over time, prompting for continuous in-flight calibration. This is achieved by comparing the HIA data with the data provided by the WHISPER experiment on magnetosheath intervals, for the high sensitivity section of the instrument, or solar wind intervals, for the low sensitivity section. The paper presents in detail the in-flight calibration methodology, reports on the work carried out for calibrating HIA and discusses plans to extend this activity in order to ensure the instrument highest data accuracy.

Preparation and Analysis of Atom Probe Tips by Xenon Focused Ion Beam Milling

2016 ◽  
Vol 22 (3) ◽  
pp. 576-582 ◽  
Author(s):  
Robert Estivill ◽  
Guillaume Audoit ◽  
Jean-Paul Barnes ◽  
Adeline Grenier ◽  
Didier Blavette
Keyword(s):  
Inductively Coupled Plasma ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Three Dimensional ◽  
Atom Probe ◽  
Milling Process ◽  
Ion Distribution ◽  
Distribution Maps ◽  
Inductively Coupled ◽  
Dimensional Reconstruction

AbstractThe damage and ion distribution induced in Si by an inductively coupled plasma Xe focused ion beam was investigated by atom probe tomography. By using predefined patterns it was possible to prepare the atom probe tips with a sub 50 nm end radius in the ion beam microscope. The atom probe reconstruction shows good agreement with simulated implantation profiles and interplanar distances extracted from spatial distribution maps. The elemental profiles of O and C indicate co-implantation during the milling process. The presence of small disc-shaped Xe clusters are also found in the three-dimensional reconstruction. These are attributed to the presence of Xe nanocrystals or bubbles that open during the evaporation process. The expected accumulated dose points to a loss of >95% of the Xe during analysis, which escapes undetected.

Nanoscale Self-Assembly Using Ion and Electron Beam Techniques: A Rapid Review

MRS Advances ◽  
2020 ◽  
Vol 5 (64) ◽  
pp. 3507-3520
Author(s):  
Chunhui Dai ◽  
Kriti Agarwal ◽  
Jeong-Hyun Cho
Keyword(s):  
Electron Beam ◽  
Self Assembly ◽  
Ion Beam ◽  
Three Dimensional ◽  
The Self ◽  
Stress Generation ◽  
Rapid Review ◽  
High Yield ◽  
3D Nanostructures ◽  
Self Assembled

AbstractNanoscale self-assembly, as a technique to transform two-dimensional (2D) planar patterns into three-dimensional (3D) nanoscale architectures, has achieved tremendous success in the past decade. However, an assembly process at nanoscale is easily affected by small unavoidable variations in sample conditions and reaction environment, resulting in a low yield. Recently, in-situ monitored self-assembly based on ion and electron irradiation has stood out as a promising candidate to overcome this limitation. The usage of ion and electron beam allows stress generation and real-time observation simultaneously, which significantly enhances the controllability of self-assembly. This enables the realization of various complex 3D nanostructures with a high yield. The additional dimension of the self-assembled 3D nanostructures opens the possibility to explore novel properties that cannot be demonstrated in 2D planar patterns. Here, we present a rapid review on the recent achievements and challenges in nanoscale self-assembly using electron and ion beam techniques, followed by a discussion of the novel optical properties achieved in the self-assembled 3D nanostructures.

Guided surgery with 3D printed device: a case report

2020 ◽  
Author(s):  
Michelle Carvalho de Sales ◽  
Rafael Maluza Flores ◽  
Julianny da Silva Guimaraes ◽  
Gustavo Vargas da Silva Salomao ◽  
Tamara Kerber Tedesco ◽  
...  
Keyword(s):  
Operating Time ◽  
Three Dimensional ◽  
Conventional Technique ◽  
Cervical Region ◽  
Mean Deviation ◽  
Apical Region ◽  
Virtual Planning ◽  
Surgical Guide ◽  
Surgical Guides ◽  
High Level

Dental surgeons need in-depth knowledge of the bone tissue status and gingival morphology of atrophic maxillae. The aim of this study is to describe preoperative virtual planning of placement of five implants and to compare the plan with the actual surgical results. Three-dimensional planning of rehabilitation using software programs enables surgical guides to be specially designed for the implant site and manufactured using 3D printing. A patient with five teeth missing was selected for this study. The patient’s maxillary region was scanned with CBCT and a cast model was produced. After virtual planning using ImplantViewer, five implants were placed using a printed surgical guide. Two weeks after the surgical procedure, the patient underwent another CBCT scan of the maxilla. Statistically significant differences were detected between the virtually planned positions and the actual positions of the implants, with a mean deviation of 0.36 mm in the cervical region and 0.7 mm in the apical region. The surgical technique used enables more accurate procedures when compared to the conventional technique. Implants can be better positioned, with a high level of predictability, reducing both operating time and patient discomfort.

3D Observation of Elemental Distribution of Si-Device using a Dedicated FIB/STEM System

2005 ◽  
Author(s):  
T. Yaguchi ◽  
M. Konno ◽  
T. Kamino ◽  
M. Ogasawara ◽  
K. Kaji ◽  
...  
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Three Dimensional ◽  
Elemental Distribution ◽  
Multivariate Statistical ◽  
X Ray ◽  
Sample Rotation ◽  
Transmission Electron ◽  
Scanning Transmission ◽  
Elemental Maps

Abstract A technique for preparation of a pillar shaped sample and its multi-directional observation of the sample using a focused ion beam (FIB) / scanning transmission electron microscopy (STEM) system has been developed. The system employs an FIB/STEM compatible sample rotation holder with a specially designed rotation mechanism, which allows the sample to be rotated 360 degrees [1-3]. This technique was used for the three dimensional (3D) elemental mapping of a contact plug of a Si device in 90 nm technology. A specimen containing a contact plug was shaped to a pillar sample with a cross section of 200 nm x 200 nm and a 5 um length. Elemental analysis was performed with a 200 kV HD-2300 STEM equipped with the EDAX genesis Energy dispersive X-ray spectroscopy (EDX) system. Spectrum imaging combined with multivariate statistical analysis (MSA) [4, 5] was used to enhance the weak X-ray signals of the doped area, which contain a low concentration of As-K. The distributions of elements, especially the dopant As, were successfully enhanced by MSA. The elemental maps were .. reconstructed from the maps.

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