Anomalous Hot-Carrier-Induced On-Resistance Degradation in High-Voltage LDMOS Transistors

2007 ◽  
Author(s):  
Shiang-Yu Chen ◽  
Jone F. Chen ◽  
Kuo-Ming Wu ◽  
J. R. Lee ◽  
C. M. Liu ◽  
...  
Keyword(s):  
High Voltage ◽  
Hot Carrier ◽  
Resistance Degradation

Investigation of characteristics and hot-carrier reliability of high-voltage MOS transistors with various doping concentrations in the drift region

2018 ◽  
Vol 33 (12) ◽  
pp. 125019
Author(s):  
Yen-Lin Tsai ◽  
Jone F Chen ◽  
Shang-Feng Shen ◽  
Hao-Tang Hsu ◽  
Chia-Yu Kao ◽  
...  
Keyword(s):  
High Voltage ◽  
Drift Region ◽  
Mos Transistors ◽  
Hot Carrier

Hot carrier stress degradation modes in p-type high voltage LDMOS transistors

2009 ◽  
Author(s):  
H. Enichlmair ◽  
J. M. Park ◽  
S. Carniello ◽  
B. Loeffler ◽  
R. Minixhofer ◽  
...  
Keyword(s):  
High Voltage ◽  
Hot Carrier ◽  
Hot Carrier Stress ◽  
Stress Degradation ◽  
P Type ◽  
Degradation Modes

Hot-Carrier Reliability Improvement in Submicron High-Voltage DMOS Transistors

2006 ◽  
Author(s):  
Jone F. Chen ◽  
J. R. Lee ◽  
Kuo-Ming Wu ◽  
Yan-Kuin Su ◽  
H. C. Wang ◽  
...  
Keyword(s):  
High Voltage ◽  
Hot Carrier ◽  
Reliability Improvement

Hot-Carrier-Induced Degradation in P-type High-Voltage DEMOS Transistors

2008 ◽  
Author(s):  
J. F. Chen ◽  
J. R. Lee ◽  
S. Y. Chen ◽  
K. S. Tian ◽  
K. M. Wu ◽  
...  
Keyword(s):  
High Voltage ◽  
Hot Carrier ◽  
P Type
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