scholarly journals High-Speed Decoders for Polar Codes

Author(s):  
Pascal Giard ◽  
Claude Thibeault ◽  
Warren J. Gross
Keyword(s):  
2021 ◽  
Vol 69 (2) ◽  
pp. 405-415
Author(s):  
Aleksandar Minja ◽  
Dušan Dobromirov ◽  
Vojin Šenk

Introduction/purpose: The paper introduces a reduced latency stack decoding algorithm of polar codes, inspired by the bidirectional stack decoding of convolutional codes and based on the folding technique. Methods: The stack decoding algorithm (also known as stack search) that is useful for decoding tree codes, the list decoding technique introduced by Peter Elias and the folding technique for polar codes which is used to reduce the latency of the decoding algorithm. The simulation was done using the Monte Carlo procedure. Results: A new polar code decoding algorithm, suitable for parallel implementation, is developed and the simulation results are presented. Conclusions: Polar codes are a class of capacity achieving codes that have been adopted as the main coding scheme for control channels in 5G New Radio. The main decoding algorithm for polar codes is the successive cancellation decoder. This algorithm performs well at large blocklengths with a low complexity, but has very low reliability at short and medium blocklengths. Several decoding algorithms have been proposed in order to improve the error correcting performance of polar codes. The successive cancellation list decoder, in conjunction with a cyclic redundancy check, provides very good error-correction performance, but at the cost of a high implementation complexity. The successive cancellation stack decoder provides similar error-correction performance at a lower complexity. Future machine-type and ultra reliable low latency communication applications require high-speed low latency decoding algorithms with good error correcting performance. In this paper, we propose a novel decoding algorithm, inspired by the bidirectional stack decoding of classical convolutional codes, with reduced latency that achieves similar performance as the classical successive cancellation list and successive cancellation stack decoding algorithms. The results are presented analytically and verified by simulation.


An emerging error-detection and correcting technique developed in the recent years is Polar codes. The technique does not focus on randomization of the bits like other techniques does, but is based on the Shannon theory and channel polarization. This paper presents a successive cancellation (SC) algorithm based FPGA implementation of Polar codes. The implementation focuses on low complexity decoder for high speed applications. Software Simulation outcomes represent the execution to polar codes can outperform those are turbo or LDPC codes.


Author(s):  
E.D. Wolf

Most microelectronics devices and circuits operate faster, consume less power, execute more functions and cost less per circuit function when the feature-sizes internal to the devices and circuits are made smaller. This is part of the stimulus for the Very High-Speed Integrated Circuits (VHSIC) program. There is also a need for smaller, more sensitive sensors in a wide range of disciplines that includes electrochemistry, neurophysiology and ultra-high pressure solid state research. There is often fundamental new science (and sometimes new technology) to be revealed (and used) when a basic parameter such as size is extended to new dimensions, as is evident at the two extremes of smallness and largeness, high energy particle physics and cosmology, respectively. However, there is also a very important intermediate domain of size that spans from the diameter of a small cluster of atoms up to near one micrometer which may also have just as profound effects on society as “big” physics.


Author(s):  
N. Yoshimura ◽  
K. Shirota ◽  
T. Etoh

One of the most important requirements for a high-performance EM, especially an analytical EM using a fine beam probe, is to prevent specimen contamination by providing a clean high vacuum in the vicinity of the specimen. However, in almost all commercial EMs, the pressure in the vicinity of the specimen under observation is usually more than ten times higher than the pressure measured at the punping line. The EM column inevitably requires the use of greased Viton O-rings for fine movement, and specimens and films need to be exchanged frequently and several attachments may also be exchanged. For these reasons, a high speed pumping system, as well as a clean vacuum system, is now required. A newly developed electron microscope, the JEM-100CX features clean high vacuum in the vicinity of the specimen, realized by the use of a CASCADE type diffusion pump system which has been essentially improved over its predeces- sorD employed on the JEM-100C.


Author(s):  
William Krakow

In the past few years on-line digital television frame store devices coupled to computers have been employed to attempt to measure the microscope parameters of defocus and astigmatism. The ultimate goal of such tasks is to fully adjust the operating parameters of the microscope and obtain an optimum image for viewing in terms of its information content. The initial approach to this problem, for high resolution TEM imaging, was to obtain the power spectrum from the Fourier transform of an image, find the contrast transfer function oscillation maxima, and subsequently correct the image. This technique requires a fast computer, a direct memory access device and even an array processor to accomplish these tasks on limited size arrays in a few seconds per image. It is not clear that the power spectrum could be used for more than defocus correction since the correction of astigmatism is a formidable problem of pattern recognition.


Author(s):  
C. O. Jung ◽  
S. J. Krause ◽  
S.R. Wilson

Silicon-on-insulator (SOI) structures have excellent potential for future use in radiation hardened and high speed integrated circuits. For device fabrication in SOI material a high quality superficial Si layer above a buried oxide layer is required. Recently, Celler et al. reported that post-implantation annealing of oxygen implanted SOI at very high temperatures would eliminate virtually all defects and precipiates in the superficial Si layer. In this work we are reporting on the effect of three different post implantation annealing cycles on the structure of oxygen implanted SOI samples which were implanted under the same conditions.


Author(s):  
Z. Liliental-Weber ◽  
C. Nelson ◽  
R. Ludeke ◽  
R. Gronsky ◽  
J. Washburn

The properties of metal/semiconductor interfaces have received considerable attention over the past few years, and the Al/GaAs system is of special interest because of its potential use in high-speed logic integrated optics, and microwave applications. For such materials a detailed knowledge of the geometric and electronic structure of the interface is fundamental to an understanding of the electrical properties of the contact. It is well known that the properties of Schottky contacts are established within a few atomic layers of the deposited metal. Therefore surface contamination can play a significant role. A method for fabricating contamination-free interfaces is absolutely necessary for reproducible properties, and molecularbeam epitaxy (MBE) offers such advantages for in-situ metal deposition under UHV conditions


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