Comparison of single-event upset generated by heavy ion and pulsed laser

2017 ◽  
Vol 60 (7) ◽  
Author(s):  
Bin Liang ◽  
Ruiqiang Song ◽  
Jianwei Han ◽  
Yaqing Chi ◽  
Rui Chen ◽  
...  
Keyword(s):  
Pulsed Laser ◽  
Heavy Ion ◽  
Single Event Upset ◽  
Single Event

Impact of heavy ion energy and species on single-event upset in commercial floating gate cells

2021 ◽  
Vol 120 ◽  
pp. 114128
Author(s):  
Bing Ye ◽  
Li-Hua Mo ◽  
Peng-Fei Zhai ◽  
Li Cai ◽  
Tao Liu ◽  
...  
Keyword(s):  
Heavy Ion ◽  
Floating Gate ◽  
Single Event Upset ◽  
Single Event ◽  
Ion Energy

Implications of the spatial dependence of the single-event-upset threshold in SRAMs measured with a pulsed laser

1994 ◽  
Vol 41 (6) ◽  
pp. 2195-2202 ◽  
Author(s):  
S. Buchner ◽  
J.B. Langworthy ◽  
W.J. Stapor ◽  
A.B. Campbell ◽  
S. Rivet
Keyword(s):  
Spatial Dependence ◽  
Pulsed Laser ◽  
Single Event Upset ◽  
Single Event

Dependence of Temperature and Back-gate Bias on Single Event Upset Induced by Heavy Ion in a 0.2 μm DSOI CMOS Technology

2021 ◽  
pp. 1-1
Author(s):  
Yuchong Wang ◽  
Fanyu Liu ◽  
Bo Li ◽  
Binhong Li ◽  
Yang Huang ◽  
...  
Keyword(s):  
Cmos Technology ◽  
Heavy Ion ◽  
Gate Bias ◽  
Single Event Upset ◽  
Single Event ◽  
Back Gate

Simulation of Thermal-Neutron-Induced Single-Event Upset Using Particle and Heavy-Ion Transport Code System

2007 ◽  
Vol 46 (6A) ◽  
pp. 3377-3379
Author(s):  
Yutaka Arita ◽  
Koji Niita ◽  
Yuji Kihara ◽  
Junich Mitsuhasi ◽  
Mikio Takai ◽  
...  
Keyword(s):  
Ion Transport ◽  
Thermal Neutron ◽  
Heavy Ion ◽  
Single Event Upset ◽  
Single Event ◽  
Code System ◽  
Transport Code

Fundamentals of the Pulsed Laser Technique for Single-Event Upset Testing

2007 ◽  
pp. 121-141 ◽  
Author(s):  
Pascal Fouillat ◽  
Vincent Pouget ◽  
Dale McMorrow ◽  
Frédéric Darracq ◽  
Stephen Buchner ◽  
...  
Keyword(s):  
Pulsed Laser ◽  
Single Event Upset ◽  
Single Event ◽  
Laser Technique

Single-Event Transient Measurements on a DC/DC Pulse Width Modulator Using Heavy Ion, Proton, and Pulsed Laser

2014 ◽  
Vol 30 (1) ◽  
pp. 149-154 ◽  
Author(s):  
Y. Ren ◽  
A.-L. He ◽  
S.-T. Shi ◽  
G. Guo ◽  
L. Chen ◽  
...  
Keyword(s):  
Pulse Width ◽  
Pulsed Laser ◽  
Heavy Ion ◽  
Single Event ◽  
Single Event Transient ◽  
Pulse Width Modulator ◽  
Ion Proton ◽  
Transient Measurements

scholarly journals Influence of Orbital Parameters on SEU Rate of Low-Energy Proton in Nano-SRAM Device

Symmetry ◽  
2020 ◽  
Vol 12 (12) ◽  
pp. 2030
Author(s):  
Bing Ye ◽  
Li-Hua Mo ◽  
Tao Liu ◽  
You-Mei Sun ◽  
Jie Liu
Keyword(s):  
Heavy Ion ◽  
High Energy ◽  
Low Energy ◽  
Single Event Upset ◽  
Single Event ◽  
High Energy Proton ◽  
Orbital Parameters ◽  
Energy Proton ◽  
Orbital Height ◽  
Selection Of

The on-orbit single-event upset (SEU) rate of nanodevices is closely related to the orbital parameters. In this paper, the on-orbit SEU rate (OOSR) induced by a heavy ion (HI), high-energy proton (HEP) and low-energy proton (LEP) for a 65 nm SRAM device is calculated by using the software SPACE RADIATION under different orbits based on the experimental data. The results indicate that the OOSR induced by the HI, HEP and LEP varies with the orbital parameters. In particular, the orbital height, inclination and shieling thickness are the key parameters that affect the contribution of the LEP to the total OOSR. Our results provide guidance for the selection of nanodevices on different orbits.

Heavy-ion and pulsed-laser single event effects in 130-nm CMOS-based thin/thick gate oxide anti-fuse PROMs

2019 ◽  
Vol 30 (5) ◽  
Author(s):  
Chang Cai ◽  
Tian-Qi Liu ◽  
Xiao-Yuan Li ◽  
Jie Liu ◽  
Zhan-Gang Zhang ◽  
...  
Keyword(s):  
Pulsed Laser ◽  
Gate Oxide ◽  
Heavy Ion ◽  
Single Event ◽  
Single Event Effects

scholarly journals Impact of Heavy Ion Energy and Nuclear Interactions on Single-Event Upset and Latchup in Integrated Circuits

2007 ◽  
Vol 54 (6) ◽  
pp. 2303-2311 ◽  
Author(s):  
P. E. Dodd ◽  
J. R. Schwank ◽  
M. R. Shaneyfelt ◽  
J. A. Felix ◽  
P. Paillet ◽  
...  
Keyword(s):  
Integrated Circuits ◽  
Heavy Ion ◽  
Single Event Upset ◽  
Single Event ◽  
Ion Energy ◽  
Nuclear Interactions

Single-Event Multiple Transients in Conventional and Guard-Ring Hardened Inverter Chains Under Pulsed Laser and Heavy-Ion Irradiation

2017 ◽  
Vol 64 (9) ◽  
pp. 2511-2518 ◽  
Author(s):  
Rongmei Chen ◽  
Fengqi Zhang ◽  
Wei Chen ◽  
Lili Ding ◽  
Xiaoqiang Guo ◽  
...  
Keyword(s):  
Ion Irradiation ◽  
Pulsed Laser ◽  
Heavy Ion ◽  
Guard Ring ◽  
Single Event ◽  
Heavy Ion Irradiation
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