scholarly journals The Microstructure and Properties of Laser Shock Peened CMSX4 Superalloy

2021 ◽  
Author(s):  
Magdalena Rozmus-Górnikowska ◽  
Jan Kusiński ◽  
Łukasz Cieniek ◽  
Jerzy Morgiel
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Surface Layer ◽  
Chemical Elements ◽  
Laser Shock Peening ◽  
Laser Shock ◽  
Localized Deformation ◽  
Gamma Prime ◽  
Transmission Electron ◽  
Shock Peening

AbstractThe influence of laser shock peening on the surface morphology and microstructure of single-crystal CMSX4 nickel-based superalloy was investigated by optical profilometry and atomic force microscopy, scanning and transmission electron microscopy as well as scanning-transmission electron microscopy in high-angle annular dark-field mode. Maps of chemical elements distribution in the laser-affected areas were determined using energy-dispersive X-ray spectroscopy. Furthermore, after the LSP, nanohardness tests were conducted on the cross section of the treated samples as well as the untreated material. Laser shock peening caused an ablation and melting of the surface layer and hence enlarged the surface roughness. Beneath the surface, in the laser shock-peened areas, severe distortion of the regular $$ {\gamma \mathord{\left/ {\vphantom {\gamma {\gamma^{\prime}}}} \right. \kern-0pt} {\gamma^{\prime}}} $$ γ / γ ′ microstructure was observed. In the surface layer, down to about 15 μm, shear bands of localized deformation were formed. Moreover, the result showed that the average nano-hardness value was obviously increased in the laser-treated region.

Controlled Nanocrystallization of NiTi Shape Memory Alloy by Laser Shock Peening

2011 ◽  
Author(s):  
Chang Ye ◽  
Gary J. Cheng
Keyword(s):  
Electron Microscopy ◽  
High Strain ◽  
Laser Shock Peening ◽  
Niti Shape Memory Alloy ◽  
Deformation Characteristics ◽  
Laser Shock ◽  
Transmission Electron ◽  
High Strain Rate Deformation ◽  
Shock Peening ◽  
Different Grain Size

In this paper, partial amorphization of NiTi alloys by laser shock peening (LSP) is reported. The microstructure of NiTi after LSP was characterized by transmission electron microscopy (TEM). The amorphization mechanism was discussed in light of the high strain rate deformation characteristics of LSP. With subsequent controlled annealing after LSP, nanostructure with different grain size distribution was achieved.

scholarly journals Effect of Aging Time on Crushing Performance of Al-0.5Mg-0.4Si Alloy for Safety Components of Automobile

Metals ◽  
2021 ◽  
Vol 11 (4) ◽  
pp. 608
Author(s):  
Jinkun Lu ◽  
Haichun Jiang ◽  
Lingying Ye ◽  
Daxiang Sun ◽  
Yong Zhang ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Tensile Test ◽  
Aging Time ◽  
Uniform Elongation ◽  
Total Elongation ◽  
Localized Deformation ◽  
Ductility Index ◽  
Transmission Electron ◽  
The Difference

The effect of aging time on the crushing performance of Al-0.5Mg-0.4Si alloy used for safety components of automobile was investigated by tensile test and crush test. Moreover, the microstructure of the alloy was investigated by transmission electron microscopy (TEM). The results show that the localized deformation ductility index, ΔAabs, which is defined as the difference between total elongation and uniform elongation, of Al-0.5Mg-0.4Si alloy is 6.5%, 7.0% and 8.5%, respectively, after being aged at 210 °C for 1, 3 and 6 h, and this tendency is the same as that of the crushing performance. The spacing of grain boundary precipitates (GBPs) from TEM results are found to be 94.9, 193.6 and 408.2 nm after being aged at 210 °C for 1, 3 and 6 h, respectively, and this tendency is same to that of ΔAabs. A mechanism about the relation between the spacing of GBPs and the ductility index ΔAabs has been proposed based on localized deformation around GBPs. With the increase of GBPs spacing, the ΔAabs increases, and the crushing performance is improved.

Direct UHV-TEM Observation of Palladium Clusters on a Silicon Surface

2004 ◽  
Vol 10 (1) ◽  
pp. 134-138 ◽  
Author(s):  
Masaki Takeguchi ◽  
Kazutaka Mitsuishi ◽  
Miyoko Tanaka ◽  
Kazuo Furuya
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Surface Layer ◽  
Silicon Surface ◽  
Lattice Structure ◽  
Plan View ◽  
Palladium Clusters ◽  
Transmission Electron ◽  
Pd Clusters

About 1 monolayer of palladium was deposited onto a silicon (111) 7 × 7 surface at a temperature of about 550 K inside an ultrahigh vacuum transmission electron microscope, resulting in formation of Pd2Si nanoislands and a 1 × 1 surface layer. Pd clusters created from an excess of Pd atoms on the 1 × 1 surface layer were directly observed byin situplan view high-resolution transmission electron microscopy. When an objective aperture was introduced so that electron diffractions less than 0.20 nm were filtered out, the lattice structure of the 1 × 1 surface with 0.33 nm spacing and the Pd clusters with a trimer shape were visualized. It was found that image contrast of the 1 × 1 lattice on the specific height terraces disappeared, and thereby an atomic structure of the Pd clusters was clearly observed. The appearance and disappearance of the 1 × 1 lattice was explained by the effect of the kinematical diffraction. It was identified that a Pd cluster was composed of three Pd atoms without a centered Si atom, which is consistent with the model proposed previously. The feature of the Pd clusters stuck at the surface step was also described.

scholarly journals Improvement of Fatigue Life of GH3039 Superalloy by Laser Shock Peening

Materials ◽  
2020 ◽  
Vol 13 (17) ◽  
pp. 3849
Author(s):  
Yang Tang ◽  
MaoZhong Ge ◽  
Yongkang Zhang ◽  
Taiming Wang ◽  
Wen Zhou
Keyword(s):  
Residual Stress ◽  
Fatigue Life ◽  
Surface Profile ◽  
Optical Microscope ◽  
Laser Shock Peening ◽  
Laser Shock ◽  
Transmission Electron ◽  
Before And After ◽  
Shock Peening ◽  
Improve Fatigue

In order to improve fatigue life of GH3039 superalloy, GH3039 superalloy sheets were treated by laser shock peening (LSP). The microstructure of GH3039 superalloy before and after LSP was characterized using an optical microscope, transmission electron microscope (TEM), and X-ray diffractometer. The fatigue life of the samples with and without LSP was investigated by fatigue experiments. Moreover, surface profile and residual stress were also examined. Experimental results indicated that the grains in the surface layer of the LSP sample were remarkably refined and reached the nanometer scale. The average surface roughness increased from 0.024 μm to 0.19 μm after LSP. The average fatigue life of the laser treated samples was 2.01 times larger than that of the untreated specimens. Additionally, mathematical statistical analysis confirms that LSP has a significant influence on the fatigue life of GH3039 superalloy. The improvement of fatigue life for the laser processed GH3039 superalloy was mainly attributed to compressive residual stress and grain refinement generated by LSP.

Electron Microscope Investigation of PVD Coated Aluminium Alloy Surface Layer

2012 ◽  
Vol 186 ◽  
pp. 192-197 ◽  
Author(s):  
Tomasz Tański ◽  
Krzysztof Labisz
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Surface Layer ◽  
Electron Microscope ◽  
Aluminium Alloy ◽  
Aluminium Alloys ◽  
Wear Resistant ◽  
Electron Microscope Investigation ◽  
Microscope Investigation ◽  
Transmission Electron

The purpose of this work is electron microscope investigation of the Ti/TiCN/TiAlN and Cr/CrN/CrN coatings deposited by PVD process. The investigations were performed using scanning and transmission electron microscopy for the microstructure determination. By mind of the transmission electron microscopy the high resolution and phase determination was possible to obtain. The morphology was studied as well the lattice parameters for the layer matrix and substrate phase identification using diffraction methods was applied. After the coating of the aluminium alloys AlSi9Cu and AlSi9Cu4 with the selected coatings there are crystallites detected with the size of several tenth of diameter. The investigated samples were examined metallographically using electron microscope with different image techniques, also EDS microanalysis and electron diffraction was made. As an implication for the practice a new layer sequence can be possible to develop, based on PVD technique. Some other investigation should be performed in the future, but the knowledge found in this research shows an interesting investigation direction. The originality and value of this combination of TEM investigation for PVD deposited surface lasers on aluminium alloys makes the investigation very attractive for automotive and other industry branches. Some practical implications and employment of the surface treatment technology for elements, made from tool materials, with the PVD and CVD methods, to obtain the high wear resistant coatings, makes it possible to improve the properties of these materials by – among others – decreasing for example their friction coefficient, microhardness increase, improvement of the tribological contact conditions in practical use. One original value is it also to applied the PVD method on a common material like aluminium alloy. The double layer coatings worked out In the PVD process on the Al0Si-Cu alloys substrate hale the following configuration of the layers: bottom layer/gradient layer/wear resistant hard surface layer.

The distribution of condensed defect structures formed in annealed boron-implanted silicon

1969 ◽  
Vol 311 (1504) ◽  
pp. 75-78 ◽  
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Surface Layer ◽  
Electron Beam ◽  
Electron Microscope ◽  
Turbulent Jet ◽  
Doping Profile ◽  
Defect Structures ◽  
Transmission Electron ◽  
Boron Ions

Silicon has been implanted with between 10 14 and 10 16 boron ions/cm 2 at energies of 25, 50, 75 and 100 keV; it has also been annealed at temperatures of between 873 and 1073 °K when the implanted boron ions occupy substitutional sites and form a ‘doped’ surface layer in which the doping profile can be accurately controlled, a desirable property in the manufacture of solid state circuits and devices (Large & Bicknell 1967). The implanted layers have been examined by both electron microscopy and electron diffraction before, during and after annealing to study the changes in crystal structures involved. For transmission electron microscope studies the silicon must be thinned to provide areas less than 1 p m in thickness, otherwise the electron beam is entirely absorbed within the specimen. It has been found that a modified form of jet etching using a turbulent jet enables large areas suitable for transmission electron microscopy to be easily produced from all types of specimens, both annealed and unannealed. Although specimens have been prepared and implanted with boron ions of different energies and doses the results discussed, which are typical of the range covered, are those obtained from silicon implanted with single energy 50 keV boron ions with a dose of 2 x 10 15 ions/cm 2 .

Relaxed Si1−xGex Layers on Simox Avoiding a Lattice Mismatched Heterointerface

1992 ◽  
Vol 263 ◽  
Author(s):  
B. Holländer ◽  
S. Mantl ◽  
R. Butz ◽  
W. Michelsen ◽  
Ch. Dieker
Keyword(s):  
Electron Microscopy ◽  
Transmission Electron Microscopy ◽  
Surface Layer ◽  
Rapid Thermal Annealing ◽  
Alternative Methods ◽  
Cross Sectional ◽  
Transmission Electron ◽  
Yield Values ◽  
First Time ◽  
Minimum Yield

ABSTRACTFor the first time, Si1 xGex layers on amorphous SiO 2 were produced by modification of the Si surface layer of a SIMOX wafer. We used two alternative methods. An additional Si1.. Gey layer was deposited epitaxially on a SIMOX wafer followed by rapid thermal annealing. Diffusional intermixing of the layers produced a homogeneous Si1 xGex layer on SiO 2. In a second attempt, Ge was implanted into the Si surface layer and thermally treated. In both cases epitaxial Si1 xGex layers on SiO2 with minimum yield values around 9% were obtained. Rutherford backscattering and cross sectional transmission electron microscopy were used to characterize the new structures.

Sign in / Sign up

Export Citation Format

Share Document