Water repellent treatment of cotton fabrics by electron beam irradiation

2016 ◽  
Vol 17 (7) ◽  
pp. 1013-1017 ◽  
Author(s):  
Zhiming Jiang ◽  
Yahui Wang ◽  
Yin Liu ◽  
Xuehong Ren
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Cotton Fabrics ◽  
Water Repellent ◽  
Beam Irradiation

Flame-retardant cotton fabrics modified with phosphoramidate derivative via electron beam irradiation process

2019 ◽  
pp. 152808371988181
Author(s):  
Ying Liu ◽  
Li Zhou ◽  
Fang Ding ◽  
Shanshan Li ◽  
Rong Li ◽  
...  
Keyword(s):  
Electron Beam ◽  
Flame Retardant ◽  
Photoelectron Spectroscopy ◽  
Electron Beam Irradiation ◽  
Cotton Fabrics ◽  
Beam Irradiation ◽  
Limiting Oxygen Index ◽  
Flammability Test ◽  
Lower Temperature ◽  
Irradiation Process

In this study, a novel flame-retardant diethyl methacryloylphosphoramidate containing phosphorus and nitrogen was synthesized and characterized by Fourier transform infrared and nuclear magnetic resonance. The synthesized compound was grafted onto cotton fabrics using electron beam irradiation and pad dry cure processes. Scanning electron microscope and X-ray photoelectron spectroscopy were used to characterize the surfaces of the modified cotton fabrics to confirm that diethyl methacryloylphosphoramidate was grafted on cotton fabrics successfully. Both electron beam–cotton and pad dry cure–cotton exhibited efficient flame retardancy which was proved by limiting oxygen index and vertical flammability test. Thermogravimetric analysis results showed that both electron beam-cotton and pad dry cure–cotton degraded at lower temperature and produced higher yields at 600℃. The tensile loss of electron beam–cotton was lower than that of pad dry cure–cotton, and within the acceptable range in flame retardant finishing.

Improving of thermal stability and water repellency of cotton fabrics via coating with silicone rubber under the effect of electron beam irradiation

2021 ◽  
pp. 152808372110466
Author(s):  
Mahmoud S Hassan ◽  
Mona K Attia ◽  
Rehab M Attia
Keyword(s):  
Thermal Stability ◽  
Electron Beam ◽  
Silicone Rubber ◽  
Electron Beam Irradiation ◽  
Water Repellency ◽  
Cotton Fabrics ◽  
Beam Irradiation ◽  
Swelling Properties ◽  
Gel Content ◽  
Coated Fabrics

Cotton fabrics for outdoor use were coated with room-temperature vulcanizing silicone rubber (RTVSR) and its catalyst to obtain improved thermal stability and water repellency properties. The coated fabrics were exposed to different doses of electron beam irradiation as an extra curing step for the coating. The effect of RTVSR coating and subsequent electron beam irradiation on the cotton fabrics was then studied. The thermal stability was investigated by thermogravimetric analysis, and surface morphologies were observed by scanning electron microscopy. The mechanical properties, crease recovery, gel content, swelling property, and water repellency of the fabrics were also investigated. The results showed that the thermal stability and the water repellency of the cotton fabrics were improved as a result of the coating process. Moreover, the crease recovery and swelling properties of the fabrics were enhanced, accompanied by decreases in their gel content, as a function of the increase in the electron beam irradiation dose. These findings recommend the produced coated fabrics under the optimum conditions for use in the industrial purposes as isolation sheets through the pipes connecting points, especially those that contain hot fluids.

Methods to Monitor and Improve the Performance of Specimen Holders for Transmission Electron Cryomicroscopy

1996 ◽  
Vol 54 ◽  
pp. 454-455
Author(s):  
B. L. Armbruster ◽  
B. Kraus ◽  
M. Pan
Keyword(s):  
Electron Microscopy ◽  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Beam Irradiation ◽  
Quality Of Data ◽  
Electron Cryomicroscopy ◽  
Thermal Equilibration ◽  
Transmission Electron ◽  
Electron Microscopes

One goal in electron microscopy of biological specimens is to improve the quality of data to equal the resolution capabilities of modem transmission electron microscopes. Radiation damage and beam- induced movement caused by charging of the sample, low image contrast at high resolution, and sensitivity to external vibration and drift in side entry specimen holders limit the effective resolution one can achieve. Several methods have been developed to address these limitations: cryomethods are widely employed to preserve and stabilize specimens against some of the adverse effects of the vacuum and electron beam irradiation, spot-scan imaging reduces charging and associated beam-induced movement, and energy-filtered imaging removes the “fog” caused by inelastic scattering of electrons which is particularly pronounced in thick specimens.Although most cryoholders can easily achieve a 3.4Å resolution specification, information perpendicular to the goniometer axis may be degraded due to vibration. Absolute drift after mechanical and thermal equilibration as well as drift after movement of a holder may cause loss of resolution in any direction.

A Study of Electron Beam Irradiation Influence on Device Contact Junction Characteristics of Advanced DRAM Using Atomic Force Probing

2013 ◽  
Author(s):  
Wei-Chih Wang ◽  
Jian-Shing Luo
Keyword(s):  
Electron Beam ◽  
Electron Beam Irradiation ◽  
Forward Bias ◽  
Irradiation Damage ◽  
Beam Irradiation ◽  
Excess Current ◽  
Atomic Force ◽  
Order Of Magnitude ◽  
Voltage Contrast ◽  
Acceleration Voltage

Abstract In this paper, we revealed p+/n-well and n+/p-well junction characteristic changes caused by electron beam (EB) irradiation. Most importantly, we found a device contact side junction characteristic is relatively sensitive to EB irradiation than its whole device characteristic; an order of magnitude excess current appears at low forward bias region after 1kV EB acceleration voltage irradiation (Vacc). Furthermore, these changes were well interpreted by our Monte Carlo simulation results, the Shockley-Read Hall (SRH) model and the Generation-Recombination (G-R) center trap theory. In addition, four essential examining items were suggested and proposed for EB irradiation damage origins investigation and evaluation. Finally, by taking advantage of the excess current phenomenon, a scanning electron microscope (SEM) passive voltage contrast (PVC) fault localization application at n-FET region was also demonstrated.

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