Characterization of crystal lattice constant and dislocation density of crack-free GaN films grown on Si(111)
2010 ◽
Vol 257
(4)
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pp. 1161-1165
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Keyword(s):
2002 ◽
Vol 16
(03)
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pp. 481-496
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Keyword(s):
1994 ◽
Vol 90
(5)
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pp. 295-297
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2009 ◽
Vol 156-158
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pp. 473-476
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