Evaluation of case depth in induction-hardened steels: Magnetic hysteresis measurements and hardness-depth profiling by differential permeability analysis

2013 ◽  
Vol 343 ◽  
pp. 112-118 ◽  
Author(s):  
Satoru Kobayashi ◽  
Hiroko Takahashi ◽  
Yasuhiro Kamada
Keyword(s):  
Magnetic Hysteresis ◽  
Depth Profiling ◽  
Case Depth ◽  
Hardened Steels ◽  
Differential Permeability ◽  
Hardness Depth

scholarly journals Surface engineering of titanium by multi-interstitial diffusion using plasma processing

2020 ◽  
Vol 321 ◽  
pp. 11010
Author(s):  
M. Drouet ◽  
L. Pichon ◽  
J.B. Dubois ◽  
E. Le Bourhis ◽  
T. L. Christiansen
Keyword(s):  
Surface Engineering ◽  
Plasma Nitriding ◽  
Compound Layer ◽  
Case Depth ◽  
Surface Compound ◽  
Specific Strength ◽  
High Specific Strength ◽  
Excellent Corrosion Resistance ◽  
Composition Profiles ◽  
Hardness Depth

Titanium and its alloys possess a range of highly interesting properties such as excellent corrosion resistance, high specific strength and biocompatibility, but suffers from poor wear resistance. The present work addresses plasma assisted surface treatment of CP 2 titanium using various combinations of oxygen and nitrogen, i.e. mixed interstitials. The sequence of controlled plasma nitriding and oxidizing treatments plays a significant role for the evolution of the hardness depth profiles and the development of the surface compound layer and the underlying diffusion/transition zone. Composition profiles of oxygen and nitrogen are obtained by GDOES; Mixed interstitial solubility of nitrogen and oxygen is found in both h.c.p. α titanium and in the compound layer. The combination of interstitials leads to larger case depth, in particular for the diffusion zone (expanded h.c.p. α titanium). Therefore, it highlights the advantages of combined nitriding and oxidizing compared to single nitriding treatments on the mechanical properties.

Studying Structure and Magnetic Properties of Armco Steel after Mechanical Treatment

2011 ◽  
Vol 495 ◽  
pp. 216-219
Author(s):  
D. Kokkoris
Keyword(s):  
Electron Microscopy ◽  
Magnetic Properties ◽  
Mechanical Treatment ◽  
Magnetic Hysteresis ◽  
Stress Relief ◽  
Optical Metallography ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Differential Permeability

Results on the correlation of structure and magnetic properties in ARMCO steels after mechanical treatment are reported in this paper. Samples have undergone plastic deformation by means of cold rolling and tensile stress in their as-bought state and after stress-relief process. Minor magnetic hysteresis measurements in 1 Hz have been performed in the as-bought, annealed and plastically deformed samples. X-ray diffraction, optical metallography and transmission electron microscopy have been employed to determine the microstructure of the samples. A clear decreasing monotonic dependence of the maximum differential permeability on applied stress and dislocation density has been observed.

Hardness-depth profiling on nanometer scale

2001 ◽  
Vol 32 (5) ◽  
pp. 1201-1209 ◽  
Author(s):  
M. Kunert ◽  
B. Baretzky ◽  
E. J. Mittemeijer ◽  
S. P. Baker
Keyword(s):  
Depth Profiling ◽  
Nanometer Scale ◽  
Hardness Depth

Hardness depth profiling of ion-implanted polymer thin films

2002 ◽  
Vol 725 ◽  
Author(s):  
Gunnar Suchaneck ◽  
Bodo Wolf ◽  
Margarita Guenther ◽  
Gerald Gerlach
Keyword(s):  
Thin Films ◽  
Ion Beam ◽  
Depth Profiling ◽  
Silicon Substrates ◽  
Depth Sensing ◽  
Elastic Module ◽  
Deposited Energy ◽  
Modified Surface ◽  
Hardness Depth ◽  
Ion Implanted

AbstractHardness measurements in ion implanted polymers are complicated by the fact that the hardness of the material varies as a function of depth within the modified layer. This effect is induced by the distribution of deposited energy, which produces a depth-dependent variation in microstructure. We have used the depth-sensing nano-indentation technique to investigate the mechanical properties of thin films of ion-beam modified aromatic polymers deposited onto silicon substrates. The depth of the ion-modified surface layer was determined using the load variation technique from the hardness and elastic module depth profile and the depth dependence of the power law coefficient of the unloading curve.

Outlook of Preisach Modeling and Magnetic Non Destructive Testing

2013 ◽  
Vol 543 ◽  
pp. 1-4
Author(s):  
Aphrodite Ktena ◽  
Evangelos Hristoforou
Keyword(s):  
Residual Stresses ◽  
Magnetic Hysteresis ◽  
Soft Magnetic Materials ◽  
Vector Model ◽  
Destructive Testing ◽  
Demagnetizing Fields ◽  
Stress Dependent ◽  
Non Destructive ◽  
Differential Permeability

The Preisach formalism is used as a basis for a vector model of magnetic hysteresis in soft magnetic materials subject to tensile stress. The model uses as vector elementary hysteresis operator the Stoner-Wohlfarth mechanism of coherent rotation while the Preisach density is constructed as the weighed sum of probability density functions corresponding to the high and low induction regions. The model reproduces the basic phenomenology of stress-dependent hysteresis: the double peak in differential permeability modeled as the effect of internal demagnetizing fields emerging from residual stresses; the increase in coercivity due to increased pinning; the decrease in magnetic induction as the result of non-180o domain rotation. The role of the negative differential permeability near remanence and its derivative is discussed with respect to residual stresses and magnetic NDT.

Preferential Sputtering of Ni3Al Single Crystals Studied Using Atom-Probe Field-Ion Microscopy and XPS

1981 ◽  
Vol 39 ◽  
pp. 16-17
Author(s):  
M.P. Thomas ◽  
A.R. Waugh ◽  
M.J. Southon ◽  
Brian Ralph
Keyword(s):  
Single Crystals ◽  
Photoelectron Spectroscopy ◽  
Surface Composition ◽  
Depth Profiling ◽  
Analytical Techniques ◽  
Atom Probe ◽  
Probe Field ◽  
Preferential Sputtering ◽  
Argon Ion Bombardment ◽  
Argon Ion

It is well known that ion-induced sputtering from numerous multicomponent targets results in marked changes in surface composition (1). Preferential removal of one component results in surface enrichment in the less easily removed species. In this investigation, a time-of-flight atom-probe field-ion microscope A.P. together with X-ray photoelectron spectroscopy XPS have been used to monitor alterations in surface composition of Ni3Al single crystals under argon ion bombardment. The A.P. has been chosen for this investigation because of its ability using field evaporation to depth profile through a sputtered surface without the need for further ion sputtering. Incident ion energy and ion dose have been selected to reflect conditions widely used in surface analytical techniques for cleaning and depth-profiling of samples, typically 3keV and 1018 - 1020 ion m-2.

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