scholarly journals Development of a compact focus variation microscopy sensor for on-machine surface topography measurement

Measurement ◽  
2021 ◽  
pp. 110311
Author(s):  
Teguh Santoso ◽  
Wahyudin P. Syam ◽  
Subbareddy Darukumalli ◽  
Richard Leach
Keyword(s):  
Surface Topography ◽  
Machine Surface ◽  
Focus Variation

Focus Variation Measurement and Prediction of Surface Texture Parameters Using Machine Learning in Laser Powder Bed Fusion

2019 ◽  
Vol 142 (1) ◽  
Author(s):  
Tuğrul Özel ◽  
Ayça Altay ◽  
Bilgin Kaftanoğlu ◽  
Richard Leach ◽  
Nicola Senin ◽  
...  
Keyword(s):  
Machine Learning ◽  
Energy Density ◽  
Surface Topography ◽  
Process Parameters ◽  
Surface Texture ◽  
Powder Bed Fusion ◽  
Laser Powder Bed Fusion ◽  
Powder Bed ◽  
Texture Parameters ◽  
Focus Variation

Abstract The powder bed fusion-based additive manufacturing process uses a laser to melt and fuse powder metal material together and creates parts with intricate surface topography that are often influenced by laser path, layer-to-layer scanning strategies, and energy density. Surface topography investigations of as-built, nickel alloy (625) surfaces were performed by obtaining areal height maps using focus variation microscopy for samples produced at various energy density settings and two different scan strategies. Surface areal height maps and measured surface texture parameters revealed the highly irregular nature of surface topography created by laser powder bed fusion (LPBF). Effects of process parameters and energy density on the areal surface texture have been identified. Machine learning methods were applied to measured data to establish input and output relationships between process parameters and measured surface texture parameters with predictive capabilities. The advantages of utilizing such predictive models for process planning purposes are highlighted.

scholarly journals Comparative Analysis of Surface Topography of Custom CAD/CAM ZirconiaAbutments by means of Optical Profilometry

2017 ◽  
Author(s):  
Peter Gehrke ◽  
Wolfgang Kaiser ◽  
Carsten Fischer ◽  
Günter Dhom
Keyword(s):  
Surface Topography ◽  
In Vitro Study ◽  
Maximum Height ◽  
Manufacturing Method ◽  
Increased Risk ◽  
Implant Abutments ◽  
Cad Cam ◽  
Optimal Surface ◽  
Focus Variation

Objective: CAD/CAM generated ceramic implant abutments have recently attracted interest due to their superior customization possibilities and aesthetic advantages. Despite their widespread clinical use, little information is currently available on their surface topography, however. The transmucosal portion of the abutment shoulder is of particular interest, as it ideally supports soft tissue but minimizes mechanical plaque retention. The aim of this in vitro study was to topographically characterize the trans- and subgingival roughness of CAD/CAM zirconia abutments from different manufacturers and compare them with zirconia stock abutments. Material and Method: The surface topography of eight CAD/CAM zirconia implant abutments (tests) and two prefabricated zirconia stock abutments (controls) was determined using focus variation microscopy. Two points on the abutment shoulder were subjected to profilometric examination. 2D and 3D parameters of roughness were obtained and compared. Results: The surface roughness of all the test abutments exceeded the recommended threshold of Ra = 0.2 µm and therefore exhibited an increased risk of mechanical plaque retention. Obvious differences in surface structure were apparent, allowing conclusions to be drawn about the manufacturing method and subsequent reworking processes. Conclusion: Manually reworking the trans- and submucosal area of the investigated CAD/CAM zirconia abutments appears necessary to fulfil the conditions for optimal surface topography. The Sa value as arithmetic mean, taking the maximum height (Sz value) and surface excess (Sdr) into account, is an essential parameter for assessing the surface topography of implant abutments.

Phase-locked loop based on machine surface topography measurement using lensed fibers

2011 ◽  
Vol 50 (4) ◽  
pp. 460 ◽  
Author(s):  
Jin-Ho Kang ◽  
ChaBum Lee ◽  
Jae-Young Joo ◽  
Sun-Kyu Lee
Keyword(s):  
Surface Topography ◽  
Machine Surface ◽  
Phase Locked Loop

The Broad Applications of the Scanning Electron Microscope

1969 ◽  
Vol 27 ◽  
pp. 20-21
Author(s):  
C. T. Nightingale ◽  
S. E. Summers ◽  
T. P. Turnbull
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Light Microscopy ◽  
Surface Topography ◽  
Great Depth ◽  
Resolving Power ◽  
Depth Of Field ◽  
Pictorial Representations ◽  
Scanning Electron

The ease of operation of the scanning electron microscope has insured its wide application in medicine and industry. The micrographs are pictorial representations of surface topography obtained directly from the specimen. The need to replicate is eliminated. The great depth of field and the high resolving power provide far more information than light microscopy.

Effects of Ion Beam Milling on Surface Topography

1973 ◽  
Vol 31 ◽  
pp. 84-85
Author(s):  
P.G. Pawar ◽  
P. Duhamel ◽  
G.W. Monk
Keyword(s):  
Surface Topography ◽  
Ion Beam ◽  
Solid Material ◽  
Beam Current ◽  
Atomic Mass ◽  
Micro Milling ◽  
Ion Milling ◽  
Controlled Atmospheres ◽  
Milling Operations ◽  
Sufficient Energy

A beam of ions of mass greater than a few atomic mass units and with sufficient energy can remove atoms from the surface of a solid material at a useful rate. A system used to achieve this purpose under controlled atmospheres is called an ion miliing machine. An ion milling apparatus presently available as IMMI-III with a IMMIAC was used in this investigation. Unless otherwise stated, all the micro milling operations were done with Ar+ at 6kv using a beam current of 100 μA for each of the two guns, with a specimen tilt of 15° from the horizontal plane.It is fairly well established that ion bombardment of the surface of homogeneous materials can produce surface topography which resembles geological erosional features.

Low-Loss Images in a Stem/Tem Microscope

1976 ◽  
Vol 34 ◽  
pp. 496-497 ◽  
Author(s):  
David C. Joy ◽  
Dennis M. Maher
Keyword(s):  
High Resolution ◽  
Surface Topography ◽  
Beam Direction ◽  
Low Loss ◽  
Specimen Holder ◽  
Glancing Angle ◽  
High Resolution Images ◽  
Set Up ◽  
Conventional Manner ◽  
Objective Type

High-resolution images of the surface topography of solid specimens can be obtained using the low-loss technique of Wells. If the specimen is placed inside a lens of the condenser/objective type, then it has been shown that the lens itself can be used to collect and filter the low-loss electrons. Since the probeforming lenses in TEM instruments fitted with scanning attachments are of this type, low-loss imaging should be possible.High-resolution, low-loss images have been obtained in a JEOL JEM 100B fitted with a scanning attachment and a thermal, fieldemission gun. No modifications were made to the instrument, but a wedge-shaped, specimen holder was made to fit the side-entry, goniometer stage. Thus the specimen is oriented initially at a glancing angle of about 30° to the beam direction. The instrument is set up in the conventional manner for STEM operation with all the lenses, including the projector, excited.

A procedure for cross-sectioning materials for TEM analysis without ion milling

1990 ◽  
Vol 48 (4) ◽  
pp. 742-743
Author(s):  
J.P. Benedict ◽  
Ron Anderson ◽  
S. J. Klepeis
Keyword(s):  
Surface Topography ◽  
Milling Time ◽  
Specimen Preparation ◽  
Ion Milling ◽  
Cleaning Operation ◽  
Tem Analysis ◽  
Platinum Silicide ◽  
Surface Alteration ◽  
Polishing Damage ◽  
Tools And Methods

Traditional specimen preparation procedures for non-biological samples, especially cross section preparation procedures, involves subjecting the specimen to ion milling for times ranging from minutes to tens of hours. Long ion milling time produces surface alteration, atomic number and rough-surface topography artifacts, and high temperatures. The introduction of new tools and methods in this laboratory improved our ability to mechanically thin specimens to a point where ion milling time was reduced to one to ten minutes. Very short ion milling times meant that ion milling was more of a cleaning operation than a thinning operation. The preferential thinning and the surface topography that still existed in briefly ion milled samples made the study of interfaces between materials such as platinum silicide and silicon difficult. These two problems can be eliminated by completely eliminating the ion milling step and mechanically polishing the sample to TEM transparency with the procedure outlined in this communication. Previous successful efforts leading to mechanically thinned specimens have shown that problems center on tool tilt control, removal of polishing damage, and specimen cleanliness.

High Resolution Low Loss Microscopy of Crystalline Surfaces

1980 ◽  
Vol 38 ◽  
pp. 162-163
Author(s):  
William Krakow ◽  
Alec N. Broers
Keyword(s):  
Electron Microscopy ◽  
High Resolution ◽  
Surface Topography ◽  
Secondary Electron ◽  
Objective Lens ◽  
Surface Imaging ◽  
Low Loss ◽  
Fine Grained ◽  
Scanning Electron ◽  
Crystalline Surfaces

Low-loss scanning electron microscopy can be used to investigate the surface topography of solid specimens and provides enhanced image contrast over secondary electron images. A high resolution-condenser objective lens has allowed the low-loss technique to resolve separations of Au nucleii of 50Å and smaller dimensions of 25Å in samples coated with a fine grained carbon-Au-palladium layer. An estimate of the surface topography of fine grained vapor deposited materials (20 - 100Å) and the surface topography of underlying single crystal Si in the 1000 - 2000Å range has also been investigated. Surface imaging has also been performed on single crystals using diffracted electrons scattered through 10−2 rad in a conventional TEM. However, severe tilting of the specimen is required which degrades the resolution 15 to 100 fold due to image forshortening.

How nanoscale surface steps promote ice growth on feldspar: microscopy observation of morphology-enhanced condensation and freezing

Nanoscale ◽  
2019 ◽  
Vol 11 (44) ◽  
pp. 21147-21154 ◽  
Author(s):  
Raymond W. Friddle ◽  
Konrad Thürmer
Keyword(s):  
Surface Topography ◽  
Video Microscopy ◽  
Microscopy Observation ◽  
Atmospheric Dust ◽  
Ice Growth ◽  
Surface Steps

Video microscopy and AFM are used to relate surface topography to a mineral's ability to promote ice growth. On feldspar, abundant as atmospheric dust, basic surface steps can facilitate condensation and freezing when air becomes saturated.

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