Reliability analysis of AlGaN/GaN HEMT on SopSiC composite substrate under long-term DC-life test

2009 ◽  
Vol 49 (9-11) ◽  
pp. 1207-1210 ◽  
Author(s):  
N. Ronchi ◽  
F. Zanon ◽  
A. Stocco ◽  
A. Tazzoli ◽  
E. Zanoni ◽  
...  
Keyword(s):  
Reliability Analysis ◽  
Life Test ◽  
Gan Hemt ◽  
Composite Substrate

Thermal Laser Stimulation Technique for AlGaN/GaN HEMT Technologies Improvement

2013 ◽  
Author(s):  
Dominique Carisetti ◽  
Nicolas Sarazin ◽  
Nathalie Labat ◽  
Nathalie Malbert ◽  
Arnaud Curutchet ◽  
...  
Keyword(s):  
Surface States ◽  
Leakage Currents ◽  
Laser Stimulation ◽  
Long Term Stability ◽  
Field Plate ◽  
Gan Hemt ◽  
Die Surface ◽  
Scan Speed ◽  
Stimulation Technique

Abstract To improve the long-term stability of AlGaN/GaN HEMTs, the reduction of gate and drain leakage currents and electrical anomalies at pinch-off is required. As electron transport in these devices is both coupled with traps or surface states interactions and with polarization effects, the identification and localization of the preeminent leakage path is still challenging. This paper demonstrates that thermal laser stimulation (TLS) analysis (OBIRCh, TIVA, XIVA) performed on the die surface are efficient to localize leakage paths in GaN based HEMTs. The first part details specific parameters, such as laser scan speed, scan direction, wavelength, and laser power applied for leakage gate current paths identification. It compares results obtained with Visible_NIR electroluminescence analysis with the ones obtained by the TLS techniques on GaN HEMT structures. The second part describes some failure analysis case studies of AlGaN/GaN HEMT with field plate structure which were successful, thanks to the OBIRCh technique.

Photon Emission Spectral Signatures of AlGaN/GaN HEMT for Functional and Reliability Analysis

2008 ◽  
Author(s):  
Arkadiusz Glowacki ◽  
Christian Boit ◽  
Richard Lossy ◽  
Joachim Würfl
Keyword(s):  
Reliability Analysis ◽  
Gate Voltage ◽  
Near Infrared ◽  
Photon Emission ◽  
Electrical Characterization ◽  
Spectral Signatures ◽  
Operating Modes ◽  
Gan Hemt ◽  
Spectrally Resolved ◽  
Performance Variations

Abstract Non-degraded and degraded AlGaN/GaN HEMT devices have been characterized electrically and investigated in various operating modes using integral and spectrally resolved photon emission (PE). In degraded devices the PE dependence on the gate voltage differs from the non-degraded devices. Various types of dependencies on the gate voltage have been identified when investigating local degradation sites. PE spectroscopy was performed at various bias conditions. For both devices broad spectra have been obtained in a wavelength regime from visible to near-infrared, including local performance variations. Signatures of the degradation have been determined in the electrical characterization, in integral PE distribution and in the PE spectrum.

Comparative Reliability Prediction Using Physics of Failure Models

2011 ◽  
Vol 2011 (HITEN) ◽  
pp. 000189-000195
Author(s):  
Milton Watts ◽  
K. Rob Harker
Keyword(s):  
Circuit Complexity ◽  
High Impact ◽  
Reliability Prediction ◽  
Life Test ◽  
Physics Of Failure ◽  
Failure Models ◽  
The Individual ◽  
Aging Models ◽  
Device Test

Quartzdyne Electronics has invested millions of device test hours in life testing of circuits in both powered and un-powered tests. In addition to time at temperature, these tests include thermal cycling and high impact drop testing. Recent projects have required the use of larger packages and components as we have expanded the variety of circuits that we build. It is desirable to predict the effects of these changes on long-term reliability before investing in tooling. In this study we will compare a new design which contains these larger components to the simpler, smaller designs for which we have extensive life-test data. Using a physics-of-failure approach, component mounting stresses will be analyzed using finite element modeling. These results will be compared to pre and post-aging shear strengths of actual components of varying sizes. Aging models will then be developed to predict the reliability of the new design based on the comparative stress margins of the individual components coupled with circuit complexity. Once validated, the aging models will enable reliability prediction and trade-off analysis for future designs.

Reliability of TLP Tendons Under Storm Sea States

2005 ◽  
Author(s):  
Federico Barranco Cicilia ◽  
Edison Castro Prates de Lima ◽  
Lui´s Volnei Sudati Sagrilo
Keyword(s):  
Reliability Analysis ◽  
Limit State ◽  
Nonlinear Dynamic Analysis ◽  
Analytical Models ◽  
Cumulative Probability ◽  
Wave Forces ◽  
Ultimate Limit State ◽  
Sea State ◽  
Extreme Response

This paper presents a methodology for reliability analysis of Tension Leg Platform (TLP) tendons subjected to extraordinary sea state conditions like hurricanes or winter storms. A coupled approach in time domain is used to carry out TLP random nonlinear dynamic analysis including wind, current and first and second order wave forces. The tendons Ultimate Limit State (ULS) condition is evaluated by an Interaction Ratio (IR) taking into account dynamic combination among tension, bending and hydrostatic pressure. Expected long-term extreme IR is obtained through the integration of cumulative probability functions (CPFs) fitted to response maxima associated to individual short term sea states. The reliability analysis is performed using a time-integrated scheme including uncertainties in loads, tendon strength, and analytical models. Failure probabilities for the most loaded tendon of a TLP in Campeche Bay, Mexico, considering a 100-yr design sea state and the 100-yr extreme response generated by long-term observed storms are compared.

scholarly journals Reliability Dynamic Analysis by Fault Trees and Binary Decision Diagrams

Information ◽  
2020 ◽  
Vol 11 (6) ◽  
pp. 324 ◽  
Author(s):  
Fausto Pedro García Márquez ◽  
Isaac Segovia Ramírez ◽  
Behnam Mohammadi-Ivatloo ◽  
Alberto Pliego Marugán
Keyword(s):  
Wind Turbine ◽  
Reliability Analysis ◽  
Binary Decision Diagrams ◽  
Computational Cost ◽  
Optimal Order ◽  
Decision Diagrams ◽  
Breadth First Search ◽  
Ranking Methods ◽  
Binary Decision

New wind turbines are becoming more complex and reliability analysis of them rising in complexity. The systems are composed of many components. Fault tree is used as an useful tool to analyze these interrelations and provide a scheme of the wind turbine, to get a quick overview of the behavior of the system under certain conditions of the components. However, it is complicated and in some cases not possible, to identify the conditions that would generate a wind turbine failure. A quantitative and qualitative reliability analysis of the wind turbine is proposed in this study. Binary decision diagrams are employed as a suitable and operational method to facilitate this analysis and to get an analytical expression by the Boolean functions. The size of the binary decision diagram, i.e., the computational cost for solving the problem, has an important dependence on the order of the components or events considered. Different heuristic ranking methods are used to find an optimal order or one closed, and to validate the results: AND, level, top-down-left-right, deep-first search and breadth-first-search. Birnbaum and criticality importance measures are proposed to evaluate the relevance of each component. This analysis leads to classify the events according to their importance with respect to the probability of the top event. This analysis provides the basis for making medium and long-term maintenance strategies.

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