Quantitative measurement of deformation-induced martensite in 304 stainless steel by X-ray diffraction

2004 ◽  
Vol 50 (12) ◽  
pp. 1445-1449 ◽  
Author(s):  
Amar K. De ◽  
David C. Murdock ◽  
Martin C. Mataya ◽  
John G. Speer ◽  
David K. Matlock
Keyword(s):  
Stainless Steel ◽  
Quantitative Measurement ◽  
304 Stainless Steel ◽  
X Ray Diffraction ◽  
X Ray

scholarly journals X-ray Diffraction Investigation of Stainless Steel—Nitrogen Thin Films Deposited Using Reactive Sputter Deposition

Coatings ◽  
2020 ◽  
Vol 10 (10) ◽  
pp. 984
Author(s):  
Faisal I. Alresheedi ◽  
James E. Krzanowski
Keyword(s):  
Thin Films ◽  
Stainless Steel ◽  
Substrate Temperature ◽  
Peak Shift ◽  
304 Stainless Steel ◽  
Tetragonal Structure ◽  
X Ray Diffraction ◽  
X Ray ◽  
Area Detector ◽  
Calculated Parameter

An X-ray diffraction investigation was carried out on nitrogen-containing 304 stainless steel thin films deposited by reactive rf magnetron sputtering over a range of substrate temperature and bias levels. The resulting films contained between ~28 and 32 at.% nitrogen. X-ray analysis was carried out using both the standard Bragg-Brentano method as well as area-detector diffractometry analysis. The extent of the diffraction anomaly ((002) peak shift) was determined using a calculated parameter, denoted RB, which is based on the (111) and (002) peak positions. The normal value for RB for FCC-based structures is 0.75 but increases as the (002) peak is anomalously displaced closer to the (111) peak. In this study, the RB values for the deposited films were found to increase with substrate bias but decrease with substrate temperature (but still always >0.75). Using area detector diffractometry, we were able to measure d111/d002 values for similarly oriented grains within the films, and using these values calculate c/a ratios based on a tetragonal-structure model. These results allowed prediction of the (002)/(200) peak split for tetragonal structures. Despite predicting a reasonably accessible split (~0.6°–2.9°–2θ), no peak splitting observed, negating the tetragonal-structure hypothesis. Based on the effects of film bias/temperature on RB values, a defect-based hypothesis is more viable as an explanation for the diffraction anomaly.

Photocathode Protection Properties of TiO2/V2O5 Coating

2009 ◽  
Vol 79-82 ◽  
pp. 651-654 ◽  
Author(s):  
Min Jie Zhou ◽  
Li Zhong
Keyword(s):  
Stainless Steel ◽  
Steel Substrate ◽  
Sol Gel ◽  
304 Stainless Steel ◽  
X Ray Diffraction ◽  
X Ray ◽  
Uv Illumination ◽  
Type 304 ◽  
Type 304 Stainless Steel ◽  
Cathode Protection

Nano-sized TiO2/V2O5 bilayer coatings were prepared on type304 stainless steel substrate by sol-gel method and were characterized by scanning electron microscope (SEM), X-ray diffraction (XRD). The performance of photocathode protection of the coating was investigated by the electrochemical method. SEM results indicate that the coating surface is continuous, uniform and dense, XRD spectra show that the coating is of anatase TiO2 and V2O5. The experimental results demonstrate that type 304 stainless steel with the bilayer coating can maintain cathode protection for 6h in the dark after irradiation by UV illumination for 1 h.

Synthesis and Characterization of Eu-Doped SrTiO3 Photocatalytic Materials Using in the Cathodic Protection of 304 Stainless Steel

2019 ◽  
Vol 793 ◽  
pp. 87-91 ◽  
Author(s):  
Zhi Feng Zhang ◽  
Feng Juan Wang ◽  
Wei Sun ◽  
Jin Yang Jiang
Keyword(s):  
Stainless Steel ◽  
Cathodic Protection ◽  
304 Stainless Steel ◽  
Synthesis And Characterization ◽  
X Ray Diffraction ◽  
Paper Sample ◽  
X Ray ◽  
Scanning Electron ◽  
The Eu

In this paper, sample of Eu-doped SrTiO3was synthesized using hydrothermal method, in which the Eu (NO3)3and Sr (OH)2were as the Eu and Sr source. X-ray diffraction (XRD), scanning electron microscope (SEM) were used to characterize the structure and ingredient of the as-prepared samples. The results show that high-purity of SrTiO3was prepared and structure of SrTiO3without change with Eu doping. Also, performance of cathodic protection of stainless steel was tested in the photoelectricity cell. Furthermore, the mechanism of the improvement by the rare earth was also detected.

Characterization of the oxides formed at 1000°C on the AISI 304 stainless steel by X-ray diffraction and infrared spectroscopy

2008 ◽  
Vol 254 (8) ◽  
pp. 2292-2299 ◽  
Author(s):  
N. Karimi ◽  
F. Riffard ◽  
F. Rabaste ◽  
S. Perrier ◽  
R. Cueff ◽  
...  
Keyword(s):  
Stainless Steel ◽  
Infrared Spectroscopy ◽  
304 Stainless Steel ◽  
X Ray Diffraction ◽  
Aisi 304 Stainless Steel ◽  
Aisi 304 ◽  
X Ray

Preparation of β-PbO2 and β-PbO2-MnO2 Coating on Stainless Steel Substrate

2012 ◽  
Vol 490-495 ◽  
pp. 3486-3490
Author(s):  
Qiang Yu ◽  
Zhen Chen ◽  
Zhong Cheng Guo
Keyword(s):  
Stainless Steel ◽  
Mass Fraction ◽  
Stainless Steel Substrate ◽  
Steel Substrate ◽  
Substrate Material ◽  
X Ray Diffraction ◽  
X Ray ◽  
New Type ◽  
Plating Solution ◽  
Element Mass Fraction

In order to prepare a new type of anode material, stainless steel was selected as substrate material. The β-PbO2 coating on stainless steel substrate was prepared under the appropriate plating solution, and the PbO2-MnO2 coating was prepared with thermal decomposition. The crystal structure was determined by X-ray diffraction; Surface morphology was test by Scanning Electron Microscopy; the energy spectrum was used to determine element mass-fraction and the ratio of atomic number of the coatings.

Stacking Faults in a High Nitrogen Face-Centered-Cubic Phase Formed on Nitrogen-Modified Austenitic Stainless Steel

2008 ◽  
Vol 373-374 ◽  
pp. 318-321
Author(s):  
J. Liang ◽  
M.K. Lei
Keyword(s):  
Stainless Steel ◽  
Plasma Source ◽  
Peak Shift ◽  
Cubic Phase ◽  
Face Centered Cubic ◽  
X Ray Diffraction ◽  
High Nitrogen ◽  
X Ray ◽  
Peak Asymmetry ◽  
Face Centered

Effects of stacking faults in a high nitrogen face-centered-cubic phase (γΝ) formed on plasma source ion nitrided 1Cr18Ni9Ti (18-8 type) austenitic stainless steel on peak shift and peak asymmetry of x-ray diffraction were investigated based on Warren’s theory and Wagner’s method, respectively. The peak shift from peak position of the γΝ phase is ascribed to the deformation faults density α, while the peak asymmetry of the γΝ phase is characterized by deviation of the center of gravity of a peak from the peak maximum (Δ C.G.) due to the twin faults density β. The calculated peak positions of x-ray diffraction patterns are consistent with that measured for plasma source ion nitrided 1Cr18Ni9Ti stainless steel.

A Method for Quantitative Phase Analysis of Silicon Nitride by X-Ray Diffraction

1990 ◽  
Vol 5 (3) ◽  
pp. 121-124 ◽  
Author(s):  
David J. Devlin ◽  
Kamal E. Amin
Keyword(s):  
Silicon Nitride ◽  
Iterative Method ◽  
Calibration Curve ◽  
Quantitative Measurement ◽  
Quantitative Phase Analysis ◽  
X Ray Diffraction ◽  
X Ray ◽  
Pure Phases ◽  
Yttrium Disilicate

AbstractThe relative intensities ratios for the determination of the relative amounts of alpha and beta phases in silicon nitride and the relative amounts of delta yttrium disilicate (Y2Si2O7) and nitrogen apatite [Y5(SiO4)3N] are reported. These constants were determined using an iterative method applicable when the pure phases are not easily prepared. In addition, a calibration curve was obtained for the quantitative measurement of free silicon in silicon nitride over the range 0 to 0.3% by weight of Si.

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