A compact model of fringing field induced parasitic capacitance for deep sub-micrometer MOSFETs
2009 ◽
Vol 53
(9)
◽
pp. 1041-1045
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2016 ◽
Vol 4
(1)
◽
pp. 30-32
Keyword(s):
2009 ◽
Vol 25
(1)
◽
pp. 015008
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2017 ◽
Vol 56
(8)
◽
pp. 084301
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2011 ◽
Vol 58
(4)
◽
pp. 1068-1075
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1984 ◽
Vol 45
(C1)
◽
pp. C1-889-C1-892
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2010 ◽
Vol E93-C
(8)
◽
pp. 1349-1358
Keyword(s):
2020 ◽
Vol 2020
(14)
◽
pp. 378-1-378-7
Keyword(s):