scholarly journals Correlative Raman spectroscopy and focused ion beam for targeted phase boundary analysis of titania polymorphs

2018 ◽  
Vol 188 ◽  
pp. 48-51 ◽  
Author(s):  
John S. Mangum ◽  
Lisa H. Chan ◽  
Ute Schmidt ◽  
Lauren M. Garten ◽  
David S. Ginley ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Phase Boundary ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Boundary Analysis

Localized High-Resolution Stress Measurements on MEMS Structures

2009 ◽  
Author(s):  
Dietmar Vogel ◽  
Astrid Gollhardt ◽  
Bernd Michel
Keyword(s):  
Raman Spectroscopy ◽  
High Resolution ◽  
Spatial Resolution ◽  
Focused Ion Beam ◽  
Stress Measurement ◽  
Ion Beam ◽  
Stress Relief ◽  
Stokes Line ◽  
Stress Measurements ◽  
Electron Backscattering

Three different methods of stress measurement with strong spatial resolution are presented. They base on stress relief techniques caused by focused ion beam milling, on altered electron backscattering by deformed lattices and on Stokes line shift measurements by Raman spectroscopy. The capability of these methods is demonstrated by their application to typical MEMS structures. A comparison between the methods is performed in order to outline potentials and limitations.

Tip-enhanced Raman spectroscopy of graphite irradiated by focused ion beam

2009 ◽  
Vol 34 (15) ◽  
pp. 2246 ◽  
Author(s):  
Tsu-Shin Chan ◽  
Mykhaylo M. Dvoynenko ◽  
Chih-Yi Liu ◽  
Juen-Kai Wang ◽  
Yuh-Lin Wang
Keyword(s):  
Raman Spectroscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Tip Enhanced Raman Spectroscopy

scholarly journals Correlative Raman Spectroscopy and Focused Ion Beam for Targeted Microstructural Analysis of Titania Polymorphs

2017 ◽  
Vol 23 (S1) ◽  
pp. 1642-1643
Author(s):  
John Mangum ◽  
Lisa H Chan ◽  
Lauren Garten ◽  
Brian Gorman
Keyword(s):  
Raman Spectroscopy ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Microstructural Analysis

scholarly journals Effect of wet chemical treatment on the properties of GaAs FIB-modified surface

2021 ◽  
Vol 2086 (1) ◽  
pp. 012036
Author(s):  
N A Shandyba ◽  
N E Chernenko ◽  
J Y Zhityaeva ◽  
O I Osotova ◽  
M M Eremenko ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Chemical Treatment ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Complete Removal ◽  
Small Doses ◽  
Additional Processing ◽  
Modified Surface ◽  
Wet Chemical ◽  
Surface Modified

Abstract We present the results of studies of the effect of wet chemical treatment on the properties of a GaAs surface modified by a gallium focused ion beam. Our studies based on results of AFM, KpAFM and Raman spectroscopy measurements have shown that, during wet chemical treatment, the damaged areas disappear completely in the case of low accelerating voltages and small doses of ions. At the same time, large accelerating voltages lead to the formation of extended damaged regions, the complete removal of which requires a longer treatment or additional processing.

Nanocomposite Polyurethane Foams Via POSS Blends

2002 ◽  
Vol 733 ◽  
Author(s):  
Brock McCabe ◽  
Steven Nutt ◽  
Brent Viers ◽  
Tim Haddad
Keyword(s):  
High Temperature ◽  
Sample Preparation ◽  
Room Temperature ◽  
Focused Ion Beam ◽  
Ion Beam ◽  
Polyurethane Foams ◽  
Development Projects ◽  
Polymer Systems ◽  
Polyurethane Resin ◽  
Military Development

AbstractPolyhedral Oligomeric Silsequioxane molecules have been incorporated into a commercial polyurethane formulation to produce nanocomposite polyurethane foam. This tiny POSS silica molecule has been used successfully to enhance the performance of polymer systems using co-polymerization and blend strategies. In our investigation, we chose a high-temperature MDI Polyurethane resin foam currently used in military development projects. For the nanofiller, or “blend”, Cp7T7(OH)3 POSS was chosen. Structural characterization was accomplished by TEM and SEM to determine POSS dispersion and cell morphology, respectively. Thermal behavior was investigated by TGA. Two methods of TEM sample preparation were employed, Focused Ion Beam and Ultramicrotomy (room temperature).

An Study of Influence of Imperfections on the Delamination of Diamond-Like Carbon Films

2002 ◽  
Vol 719 ◽  
Author(s):  
Myoung-Woon Moon ◽  
Kyang-Ryel Lee ◽  
Jin-Won Chung ◽  
Kyu Hwan Oh
Keyword(s):  
Cross Sections ◽  
Focused Ion Beam ◽  
Imaging System ◽  
Ion Beam ◽  
Carbon Films ◽  
Diamond Like Carbon ◽  
Glass Substrates ◽  
Atomic Force ◽  
Initiation And Propagation

AbstractThe role of imperfections on the initiation and propagation of interface delaminations in compressed thin films has been analyzed using experiments with diamond-like carbon (DLC) films deposited onto glass substrates. The surface topologies and interface separations have been characterized by using the Atomic Force Microscope (AFM) and the Focused Ion Beam (FIB) imaging system. The lengths and amplitudes of numerous imperfections have been measured by AFM and the interface separations characterized on cross sections made with the FIB. Chemical analysis of several sites, performed using Auger Electron Spectroscopy (AES), has revealed the origin of the imperfections. The incidence of buckles has been correlated with the imperfection length.

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