scholarly journals X-ray microscopy of living multicellular organisms with the Prague Asterix Iodine Laser System

2003 ◽  
Vol 21 (4) ◽  
pp. 511-516 ◽  
Author(s):  
T. DESAI ◽  
D. BATANI ◽  
A. BERNARDINELLO ◽  
G. POLETTI ◽  
F. ORSINI ◽  
...  
Keyword(s):  
Caenorhabditis Elegans ◽  
Atomic Force Microscope ◽  
Laser System ◽  
Laser Wavelength ◽  
X Rays ◽  
Contact Mode ◽  
Iodine Laser ◽  
X Ray ◽  
Atomic Force ◽  
Multicellular Organisms

Soft X-ray contact microscopy (SXCM) experiments have been performed using the Prague Asterix Iodine Laser System (PALS). Laser wavelength and pulse duration were λ = 1.314 μm and τ (FWHM) = 450 ps, respectively. Pulsed X rays were generated using teflon, gold, and molybdenum targets with laser intensities I ≥ 1014 W/cm2. Experiments have been performed on the nematodes Caenorhabditis elegans. Images were recorded on PMMA photo resists and analyzed using an atomic force microscope operating in contact mode. Our preliminary results indicate the suitability of the SXCM for multicellular specimens.

Study of Multicellular Living Organisms by SXCM (Soft X-Ray Contact Microscopy)

2005 ◽  
Vol 107 ◽  
pp. 7-10 ◽  
Author(s):  
G. Poletti ◽  
F. Orsini ◽  
D. Batani
Keyword(s):  
Neuronal Cell ◽  
Laser Source ◽  
X Rays ◽  
Cell Nuclei ◽  
Internal Organs ◽  
Contact Mode ◽  
Lateral Field ◽  
X Ray ◽  
Atomic Force ◽  
Living Organisms

Soft X-ray Contact Microscopy (SXCM) of Caenorhabditis elegans nematodes wit typical length 800 μm and diameter 30 μm has been performed using the PALS laser source of wavelength λ = 1.314 μm and pulse duration τ (FWHM) = 400 ps. Pulsed soft X-rays were generated using molybdenum and gold targets with laser intensities I ≥ 1014 W/cm2. Images have been recorded on PMMA photo resists and analyzed using an atomic force microscope operating in contact mode. Cuticle features and several internal organs have been identified in the SXCM images including lateral field, cuticle annuli, pharynx, and hypodermal and neuronal cell nuclei.

X-ray Gabor holography

1995 ◽  
Vol 53 ◽  
pp. 612-613
Author(s):  
Steve Lindaas ◽  
Chris Jacobsen ◽  
Alex Kalinovsky ◽  
Malcolm Howells
Keyword(s):  
Surface Relief ◽  
Biological Imaging ◽  
Specimen Preparation ◽  
X Rays ◽  
X Ray ◽  
Water Window ◽  
Biological Objects ◽  
Transmission Imaging ◽  
Atomic Force ◽  
Electron Microscopes

Soft x-ray microscopy offers an approach to transmission imaging of wet, micron-thick biological objects at a resolution superior to that of optical microscopes and with less specimen preparation/manipulation than electron microscopes. Gabor holography has unique characteristics which make it particularly well suited for certain investigations: it requires no prefocussing, it is compatible with flash x-ray sources, and it is able to use the whole footprint of multimode sources. Our method serves to refine this technique in anticipation of the development of suitable flash sources (such as x-ray lasers) and to develop cryo capabilities with which to reduce specimen damage. Our primary emphasis has been on biological imaging so we use x-rays in the water window (between the Oxygen-K and Carbon-K absorption edges) with which we record holograms in vacuum or in air.The hologram is recorded on a high resolution recording medium; our work employs the photoresist poly(methylmethacrylate) (PMMA). Following resist “development” (solvent etching), a surface relief pattern is produced which an atomic force microscope is aptly suited to image.

scholarly journals Redesigned Sensor Holder for an Atomic Force Microscope with an Adjustable Probe Direction

2021 ◽  
Author(s):  
Janik Schaude ◽  
Maxim Fimushkin ◽  
Tino Hausotte
Keyword(s):  
Atomic Force Microscope ◽  
Piezoelectric Actuator ◽  
High Speed ◽  
Closed Loop ◽  
Coefficient Of Thermal Expansion ◽  
Measuring System ◽  
Contact Mode ◽  
Loop Control ◽  
Atomic Force ◽  
Measuring Machine

AbstractThe article presents a redesigned sensor holder for an atomic force microscope (AFM) with an adjustable probe direction, which is integrated into a nano measuring machine (NMM-1). The AFM, consisting of a commercial piezoresistive cantilever operated in closed-loop intermitted contact-mode, is based on two rotational axes, which enable the adjustment of the probe direction to cover a complete hemisphere. The axes greatly enlarge the metrology frame of the measuring system by materials with a comparatively high coefficient of thermal expansion. The AFM is therefore operated within a thermostating housing with a long-term temperature stability of 17 mK. The sensor holder, connecting the rotational axes and the cantilever, inserted one adhesive bond, a soldered connection and a geometrically undefined clamping into the metrology circle, which might also be a source of measurement error. It has therefore been redesigned to a clamped senor holder, which is presented, evaluated and compared to the previous glued sensor holder within this paper. As will be shown, there are no significant differences between the two sensor holders. This leads to the conclusion, that the three aforementioned connections do not deteriorate the measurement precision, significantly. As only a minor portion of the positioning range of the piezoelectric actuator is needed to stimulate the cantilever near its resonance frequency, a high-speed closed-loop control that keeps the cantilever within its operating range using this piezoelectric actuator further on as actuator was implemented and is presented within this article.

scholarly journals Design and Fabrication of a High-Speed Atomic Force Microscope Scan-Head

Sensors ◽  
2021 ◽  
Vol 21 (2) ◽  
pp. 362
Author(s):  
Luke Oduor Otieno ◽  
Bernard Ouma Alunda ◽  
Jaehyun Kim ◽  
Yong Joong Lee
Keyword(s):  
Atomic Force Microscope ◽  
Natural Frequency ◽  
High Speed ◽  
Contact Mode ◽  
Ongoing Process ◽  
Atomic Force ◽  
Constant Height ◽  
Mode Tracking

A high-speed atomic force microscope (HS-AFM) requires a specialized set of hardware and software and therefore improving video-rate HS-AFMs for general applications is an ongoing process. To improve the imaging rate of an AFM, all components have to be carefully redesigned since the slowest component determines the overall bandwidth of the instrument. In this work, we present a design of a compact HS-AFM scan-head featuring minimal loading on the Z-scanner. Using a custom-programmed controller and a high-speed lateral scanner, we demonstrate its working by obtaining topographic images of Blu-ray disk data tracks in contact- and tapping-modes. Images acquired using a contact-mode cantilever with a natural frequency of 60 kHz in constant deflection mode show good tracking of topography at 400 Hz. In constant height mode, tracking of topography is demonstrated at rates up to 1.9 kHz for the scan size of 1μm×1μm with 100×100 pixels.

Anin situatomic force microscope for normal-incidence nanofocus X-ray experiments

2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
High Speed ◽  
Normal Incidence ◽  
Organic Thin Film ◽  
X Ray ◽  
Atomic Force ◽  
Synchrotron Beamlines

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.

scholarly journals Morphological Analysis of Fabricated 5.0 μM Interdigitated Electrode (IDE)

2021 ◽  
Vol 2129 (1) ◽  
pp. 012100
Author(s):  
M N A Uda ◽  
Subash C B Gopinath ◽  
Uda Hashim ◽  
M N Afnan Uda ◽  
N A Parmin ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Morphological Analysis ◽  
Energy Dispersive ◽  
Interdigitated Electrode ◽  
X Ray ◽  
Atomic Force

Abstract The aim of this research is to study the morphological analysis of fabricated Interdigitated Electrode (IDE). This device electrode was physically characterized using 3D nano profiler, scanning electrode microscope (SEM), Energy-dispersive X-ray spectroscopy (EDX) and Atomic Force Microscope (AFM). Based on this analysis, IDE pattern was analyzed thoroughly based on the IDE pattern specifications with 5 μM finger gap and this research significantly will stand as a platform quantify the biomolecules in further analysis.

Manipulation of Nickel Nanoparticles Deposited on HOPG

2004 ◽  
Vol 853 ◽  
Author(s):  
Massood Z. Atashbar ◽  
Valery N. Bliznyuk ◽  
Srikanth Singamaneni
Keyword(s):  
Atomic Force Microscope ◽  
Magnetic Force ◽  
Nickel Nanoparticles ◽  
Pyrolytic Graphite ◽  
Critical Force ◽  
Contact Mode ◽  
Cyclic Voltametry ◽  
Atomic Force ◽  
Nickel Nanowires ◽  
Plating Solution

ABSTRACTNickel nanowires were fabricated by electrodepositing Ni from an aqueous plating solution onto the step edges of Highly Oriented Pyrolytic Graphite (HOPG). Freshly cleaved HOPG was exposed to a plating solution of nickel and electro chemically deposited by cyclic voltametry. The morphology of the deposited nanoparticles was studied using an Atomic Force Microscope (AFM) in non-contact mode. The magnetic force of interaction between the nanoparticles was studied by magnetizing the particles. The critical force to displace the nanoparticles was estimated using contact mode of AFM.

Atomic Paths in Scanning of the AFM Tip above the Close-Packed Surface in Repulsive Mode

1998 ◽  
Vol 05 (05) ◽  
pp. 989-996
Author(s):  
E. V. Blagov ◽  
G. L. Klimchitskaya ◽  
V. M. Mostepanenko
Keyword(s):  
Atomic Force Microscope ◽  
Vertical Resolution ◽  
Contact Mode ◽  
Atomic Force ◽  
Elastic Approximation

The paths are calculated for the surface and tip apex atoms when scanning the AFM tip above the close-packed lattice in contact mode. The interaction of the sample and the tip atoms is considered in elastic approximation. The dependence of the atomic paths on the type of the tip and its orientation is investigated. It is shown that the vertical characteristic sizes of the atomic paths are several times larger than the vertical resolution of the atomic force microscope.

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