scholarly journals Morphological Analysis of Fabricated 5.0 μM Interdigitated Electrode (IDE)

2021 ◽  
Vol 2129 (1) ◽  
pp. 012100
Author(s):  
M N A Uda ◽  
Subash C B Gopinath ◽  
Uda Hashim ◽  
M N Afnan Uda ◽  
N A Parmin ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Morphological Analysis ◽  
Energy Dispersive ◽  
Interdigitated Electrode ◽  
X Ray ◽  
Atomic Force

Abstract The aim of this research is to study the morphological analysis of fabricated Interdigitated Electrode (IDE). This device electrode was physically characterized using 3D nano profiler, scanning electrode microscope (SEM), Energy-dispersive X-ray spectroscopy (EDX) and Atomic Force Microscope (AFM). Based on this analysis, IDE pattern was analyzed thoroughly based on the IDE pattern specifications with 5 μM finger gap and this research significantly will stand as a platform quantify the biomolecules in further analysis.

Anin situatomic force microscope for normal-incidence nanofocus X-ray experiments

2016 ◽  
Vol 23 (5) ◽  
pp. 1110-1117 ◽  
Author(s):  
M. V. Vitorino ◽  
Y. Fuchs ◽  
T. Dane ◽  
M. S. Rodrigues ◽  
M. Rosenthal ◽  
...  
Keyword(s):  
Thin Film ◽  
Atomic Force Microscope ◽  
High Speed ◽  
Normal Incidence ◽  
Organic Thin Film ◽  
X Ray ◽  
Atomic Force ◽  
Synchrotron Beamlines

A compact high-speed X-ray atomic force microscope has been developed forin situuse in normal-incidence X-ray experiments on synchrotron beamlines, allowing for simultaneous characterization of samples in direct space with nanometric lateral resolution while employing nanofocused X-ray beams. In the present work the instrument is used to observe radiation damage effects produced by an intense X-ray nanobeam on a semiconducting organic thin film. The formation of micrometric holes induced by the beam occurring on a timescale of seconds is characterized.

25 nm pitch comparison between a traceable x-ray diffractometer and a metrological atomic force microscope

2011 ◽  
Vol 23 (1) ◽  
pp. 015002 ◽  
Author(s):  
Ichiko Misumi ◽  
Jun-ichiro Kitta ◽  
Hiroyuki Fujimoto ◽  
Satoshi Gonda ◽  
Yasushi Azuma ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
X Ray ◽  
Atomic Force

scholarly journals X-ray microscopy of living multicellular organisms with the Prague Asterix Iodine Laser System

2003 ◽  
Vol 21 (4) ◽  
pp. 511-516 ◽  
Author(s):  
T. DESAI ◽  
D. BATANI ◽  
A. BERNARDINELLO ◽  
G. POLETTI ◽  
F. ORSINI ◽  
...  
Keyword(s):  
Caenorhabditis Elegans ◽  
Atomic Force Microscope ◽  
Laser System ◽  
Laser Wavelength ◽  
X Rays ◽  
Contact Mode ◽  
Iodine Laser ◽  
X Ray ◽  
Atomic Force ◽  
Multicellular Organisms

Soft X-ray contact microscopy (SXCM) experiments have been performed using the Prague Asterix Iodine Laser System (PALS). Laser wavelength and pulse duration were λ = 1.314 μm and τ (FWHM) = 450 ps, respectively. Pulsed X rays were generated using teflon, gold, and molybdenum targets with laser intensities I ≥ 1014 W/cm2. Experiments have been performed on the nematodes Caenorhabditis elegans. Images were recorded on PMMA photo resists and analyzed using an atomic force microscope operating in contact mode. Our preliminary results indicate the suitability of the SXCM for multicellular specimens.

Studies on Lanthanum Complexes of 1-Aryl-2,5-Dithiohydrazodicarbonamides in Paraffin Oil as Extreme Pressure Lubrication Additives

2013 ◽  
Vol 135 (4) ◽  
Author(s):  
R. B. Rastogi ◽  
J. L. Maurya ◽  
V. Jaiswal ◽  
D. Tiwary
Keyword(s):  
Wear Scar ◽  
Energy Dispersive ◽  
Extreme Pressure ◽  
Wear Scar Diameter ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Temperature Parameter ◽  
Steel Balls ◽  
Worn Surface

Testing of lanthanum complexes of 1-aryl-2,5-dithiohydrazodicarbonamides of the formula LaL3 [LH=1-phenyl-2,5-dithiohydrazodicarbonamide(PhTHC), 1-methylphenyl-2,5-dithiohydrazodicarbon-amide(p-MePhTHC), 1-methoxyphenyl-2,5-dithiohydrazodicarbonamide(p-MeOPhTHC), 1-phenyl-2,5-dithiohydrazodicarbonamide(p-ClPhTHC)] for their application as extreme pressure lubrication (EPL) additives was performed on four ball tester using steel balls of 12.7 mm diameter and MoS2 as reference additive. The efficiency of the complexes has been evaluated using the tribological parameters, wear scar diameter, friction coefficient, initial seizure load, 2.5 s seizure delay load, weld load, mean Hertz load, flash temperature parameter and pressure wear index. The tested complexes behave as good extreme pressure additives; however, the best performance is shown by the p-methoxyphenyl derivative. The surface morphology of the wear scar on steel ball has been studied by atomic force microscopy and scanning electron microscopy. In presence of this complex, roughness of the worn surface is significantly reduced. The composition of wear scar has been analyzed by energy dispersive X-ray spectroscopy. The presence of lanthanum and sulfur in energy dispersive X-ray spectrum emphasizes role of additive in the tribofilm formed on the surface.

X-ray holographic microscopy by means of photoresist recording and atomic-force microscope readout

1996 ◽  
Vol 13 (9) ◽  
pp. 1788 ◽  
Author(s):  
Steve Lindaas ◽  
Chris Jacobsen ◽  
Alex Kalinovsky ◽  
Malcolm Howells
Keyword(s):  
Atomic Force Microscope ◽  
X Ray ◽  
Atomic Force ◽  
Holographic Microscopy

scholarly journals Local detection of X-ray spectroscopies with an in-situ Atomic Force Microscope

2008 ◽  
Vol 3 (12) ◽  
pp. P12004-P12004 ◽  
Author(s):  
M S Rodrigues ◽  
O Dhez ◽  
S Le Denmat ◽  
J Chevrier ◽  
R Felici ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
X Ray ◽  
Atomic Force ◽  
Local Detection
Sign in / Sign up

Export Citation Format

Share Document