Microstructure and microanalysis of silicon nitride ceramics in the Y-Si-Al-O-N and Y-Si-O-N systems
Silicon nitride ceramics are among the leading candidate materials for use in structural applications at high temperatures. Due to the highly covalent nature of the Si-N bond and therefore low self-diffusivity, processing Si3N4 to full density requires the use of additives to provide a medium for liquid-phase sintering. When exposed to temperatures above ∼1000°C the resulting amorphous grain-boundary phases soften, leading to grain-boundary sliding and the eventual failure of the ceramic. The objectives of this work were to modify the grain-boundary phase composition and then attempt to devitrify the resulting intergranular phase to a refractory crystalline phase, producing a sintered Si3N4 with improved high-temperature strength and oxidation resistance. Transmission electron microscopy (TEM) and energy-dispersive x-ray spectroscopy (EDS) were used to characterize these materials. This paper describes these results.