Chemical Imaging With a Scanning Probe Microscope

1999 ◽  
Vol 5 (S2) ◽  
pp. 970-971
Author(s):  
Dmitri A. Kossakovski ◽  
John D. Baldeschwieler ◽  
J. L. Beauchamp
Keyword(s):  
Beam Quality ◽  
Near Field ◽  
Ambient Air ◽  
Chemical Imaging ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Visible Range ◽  
Spectrometric Analysis ◽  
Chemical Information ◽  
Near Field Scanning

Scanning Probe Microscopy (SPM) is a superb tool for topographical analysis of samples. However, traditional varieties of SPM such as Atomic Force, Scanning Tunneling and Near-field Scanning Optical Microscopy have limited chemical contrast capability. Recently, several advanced techniques have been reported which provide chemical information in addition to topographical data. All these methods derive advantage from combinations of scanning probe methodologies and some other, chemically sensitive technique. Examples of such approaches are: Near-field Scanning Raman Imaging, Near-field Scanning Infrared Microscopy and mass spectrometric analysis with laser ablation through fiber probes.In this contribution we report the development of a new method in this family of chemically sensitive scanning probe techniques: Laser Induced Breakdown Spectroscopy with Shear Force Microscopy, LIBS-SFM. Traditional LIBS experiments involve focusing a pulsed laser beam onto the sample and observing optical emission from the plasma formed in the ablation area. The emissions are mostly in the UV/visible range, and the signal is due to electronic transitions in excited atoms and ions in the plasma plume. The spectra are analyzed to identify chemical elements. The spatial resolution of LIBS is limited by the wavelength and beam quality of the laser used for ablation. The experiments may be conducted in vacuum, controlled atmosphere, or ambient air.

Corrections to “Effect of Inhomogeneous Medium on Fields Above GCPW PCB for Near-Field Scanning Probe Calibration Application”

2019 ◽  
Vol 61 (2) ◽  
pp. 599-599
Author(s):  
Shubhankar Marathe ◽  
Hamed Kajbaf ◽  
Morten Soerensen ◽  
Victor Khilkevich ◽  
David Pommerenke ◽  
...  
Keyword(s):  
Inhomogeneous Medium ◽  
Near Field ◽  
Scanning Probe ◽  
Probe Calibration ◽  
Near Field Scanning

Nanostructuring With Scanning Probe Microscope Tip Irradiated With Femtosecond Laser

2002 ◽  
Author(s):  
Anant Chimmalgi ◽  
Taeyoul Choi ◽  
Costas P. Grigoropoulos
Keyword(s):  
Femtosecond Laser ◽  
Data Storage ◽  
Near Field ◽  
Laser System ◽  
Ambient Air ◽  
Femtosecond Laser Pulses ◽  
Scanning Probe Microscope ◽  
Scanning Probe ◽  
Fdtd Simulation ◽  
Probe Microscope

Nanostructures, which have characteristic dimensions that are difficult to achieve by conventional optical lithography techniques, are finding ever-increasing applications in a variety of fields. High resolution, reliability and throughput fabrication of these nanostructures is essential if applications incorporating nanodevices are to gain widespread acceptance. Owing to the minimal thermal and mechanical damage, ultra-short pulsed laser radiation has been shown to be effective for precision material processing and surface micro-modification. In this work, nanostructuring based on local field enhancement in the near field of a Scanning Probe Microscope (SPM) probe tip irradiated with femtosecond laser pulses has been studied. High spatial resolution (~10–12nm), flexibility in the choice of the substrate material and possibility of massive integration of the tips make this method highly attractive for nanomodification. We report results of nanostructuring of gold thin film utilizing an 800nm femtosecond laser system in conjunction with a commercial SPM in ambient air. Further, Finite Difference Time Domain (FDTD) simulation results for the spatial distribution of the laser field intensity beneath the tip are presented. Potential applications of this method include nanolithography, nanodeposition, high-density data storage, as well as various biotechnology related applications.

scholarly journals Nanoscale chemical imaging by photoinduced force microscopy

2016 ◽  
Vol 2 (3) ◽  
pp. e1501571 ◽  
Author(s):  
Derek Nowak ◽  
William Morrison ◽  
H. Kumar Wickramasinghe ◽  
Junghoon Jahng ◽  
Eric Potma ◽  
...  
Keyword(s):  
Self Assembly ◽  
Low Cost ◽  
Near Field ◽  
Chemical Species ◽  
Real Space ◽  
Chemical Imaging ◽  
Chemical Components ◽  
Chemical Information ◽  
Force Microscopy ◽  
The Individual

Correlating spatial chemical information with the morphology of closely packed nanostructures remains a challenge for the scientific community. For example, supramolecular self-assembly, which provides a powerful and low-cost way to create nanoscale patterns and engineered nanostructures, is not easily interrogated in real space via existing nondestructive techniques based on optics or electrons. A novel scanning probe technique called infrared photoinduced force microscopy (IR PiFM) directly measures the photoinduced polarizability of the sample in the near field by detecting the time-integrated force between the tip and the sample. By imaging at multiple IR wavelengths corresponding to absorption peaks of different chemical species, PiFM has demonstrated the ability to spatially map nm-scale patterns of the individual chemical components of two different types of self-assembled block copolymer films. With chemical-specific nanometer-scale imaging, PiFM provides a powerful new analytical method for deepening our understanding of nanomaterials.

scholarly journals Effect of Inhomogeneous Medium on Fields Above GCPW PCB for Near-Field Scanning Probe Calibration Application

2019 ◽  
Vol 61 (1) ◽  
pp. 3-10 ◽  
Author(s):  
Shubhankar Marathe ◽  
Morten Soerensen ◽  
Victor Khilkevich ◽  
David Pommerenke ◽  
Jin Min ◽  
...  
Keyword(s):  
Inhomogeneous Medium ◽  
Near Field ◽  
Scanning Probe ◽  
Probe Calibration ◽  
Near Field Scanning

Scanning Probe Microscopy of Surface Plasmons

1997 ◽  
Vol 11 (21) ◽  
pp. 2465-2510 ◽  
Author(s):  
Igor I. Smolyaninov
Keyword(s):  
Surface Plasmons ◽  
Local Field ◽  
Electromagnetic Waves ◽  
Light Emission ◽  
Near Field ◽  
Field Enhancement ◽  
Weak Localization ◽  
Scanning Probe ◽  
Scanning Tunneling ◽  
Tunneling Microscopy

Recent development of novel scanning probe techniques such as Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), and Near-Field Optical Microscopy (NFOM) has opened new ways to study local field distribution of surface electromagnetic waves. A lot of experimental efforts have been concentrated on the study of surface plasmons (SP). Different techniques allow to excite and probe SPs with wavelengths from 1 nm down to the optical range along its entire dispersion curve. Large number of phenomena have been studied directly, such as SP scattering by individual defects, strong and weak localization of SP, SP induced local field enhancement, light emission from the tunneling junction, etc. Scanning probe techniques allow not only topography and field mapping but also surface modification and lithography on the nanometer scale. Combination of these features in the same experimental setup proved to be extremely useful in SP studies. For example, some prototype two dimensional optical elements able to control SP propagation have been demonstrated.

Progress in near-field scanning optical microscopy (NSOM)

1988 ◽  
Vol 46 ◽  
pp. 436-437
Author(s):  
E. Betzig ◽  
M. Isaacson ◽  
H. Barshatzky ◽  
K. Lin ◽  
A. Lewis
Keyword(s):  
Optical Microscopy ◽  
Near Field ◽  
Visible Region ◽  
Optical Microscope ◽  
Scanning Tunneling ◽  
Far Field ◽  
Tunneling Microscopy ◽  
Scanning Optical Microscopy ◽  
Near Field Scanning ◽  
Scanning Electron

The concept of near field scanning optical microscopy was first described more than thirty years ago1 almost two decades before the validity of the technique was verified experimentally for electromagnetic radiation of 3cm wavelength.2 The extension of the method to the visible region of the spectrum took another decade since it required the development of micropositioning and aperture fabrication on a scale five orders of magnitude smaller than that used for the microwave experiments. Since initial reports on near field optical imaging8-6, there has been a growing effort by ourselves6 and other groups7 to extend the technology and develop the near field scanning optical microscope (NSOM) into a useful tool to complement conventional (i.e., far field) scanning optical microscopy (SOM), scanning electron microscopy (SEM) and scanning tunneling microscopy. In the context of this symposium on “Microscopy Without Lenses”, NSOM can be thought of as an addition to the exploding field of scanned tip microscopy although we did not originally conceive it as such.

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