The Observation of Slip Phenomena in Single Crystal Fe Samples During In Situ Micro-Mechanical Testing Through Orientation Imaging

2014 ◽  
Vol 20 (4) ◽  
pp. 1060-1069 ◽  
Author(s):  
Dhriti Bhattacharyya ◽  
Robert W. Wheeler ◽  
Robert P. Harrison ◽  
Lyndon Edwards
Keyword(s):  
Single Crystal ◽  
Mechanical Testing ◽  
Electron Backscatter Diffraction ◽  
Tensile Axis ◽  
Orientation Data ◽  
Direction Parallel ◽  
Entire Area ◽  
Orientation Change ◽  
Gauge Section

AbstractThis paper reports a study of local orientation change occurring within micro-scale tensile samples as a function of strain. These samples were fabricated from a thin film of single crystal bcc Fe and deformed in tension using an in situ micro-mechanical testing device inside a scanning electron microscope. Samples were loaded along the <110> direction parallel to the specimen axis, strained to different levels, and then subjected to electron backscatter diffraction scans over the entire area of the gauge section. Analysis of the surface orientation data shows that, within a necked zone of the micro-sample gauge section, there are two distinct regions of significant orientation change, in which local crystal rotations occur in opposite directions. These two regions are separated by an intermediate band that shows minimal misorientation from the original state. Crystal rotations within the two regions that develop opposite orientations are found to be consistent with classic single crystal slip, where the slip direction rotates toward the tensile axis. It is shown that increasing tensile strain causes an increasing degree of rotation away from the starting orientation. The tests also illustrate the occurrence of slip on at least two different slip systems, based on the slip traces and orientation change.

Evaluating Deformation-Induced Grain Orientation Change in a Polycrystal During In Situ Tensile Deformation using EBSD

2015 ◽  
Vol 21 (4) ◽  
pp. 969-984 ◽  
Author(s):  
Thomas E. Buchheit ◽  
Jay D. Carroll ◽  
Blythe G. Clark ◽  
Brad L. Boyce
Keyword(s):  
Tensile Deformation ◽  
Electron Backscatter Diffraction ◽  
Correlation Technique ◽  
Polycrystalline Specimen ◽  
Initial Development ◽  
Orientation Change ◽  
Reference Orientation ◽  
Orientation Deviation ◽  
Backscatter Diffraction

AbstractUsing an in situ load frame within a scanning electron microscope, a microstructural section on the surface of an annealed tantalum (Ta) polycrystalline specimen was mapped at successive tensile strain intervals, up to ~20% strain, using electron backscatter diffraction. A grain identification and correlation technique was developed for characterizing the evolving microstructure during loading. Presenting the correlated results builds on the reference orientation deviation (ROD) map concept where individual orientation measurements within a grain are compared with a reference orientation associated with that grain. In this case, individual orientation measurements in a deformed grain are measured relative to a reference orientation derived from the undeformed (initial) configuration rather than the current deformed configuration as has been done for previous ROD schemes. Using this technique helps reveal the evolution of crystallographic orientation gradients and development of deformation-induced substructure within grains. Although overall crystallographic texture evolved slowly during deformation, orientation spread within grains developed quickly. In some locations, misorientation relative to the original orientation of a grain exceeded 20° by 15% strain. The largest orientation changes often appeared near grain boundaries suggesting that these regions were preferred locations for the initial development of subgrains.

scholarly journals Crystal rotation in Cu single crystal micropillars: In situ Laue and electron backscatter diffraction

2008 ◽  
Vol 92 (7) ◽  
pp. 071905 ◽  
Author(s):  
R. Maaß ◽  
S. Van Petegem ◽  
D. Grolimund ◽  
H. Van Swygenhoven ◽  
D. Kiener ◽  
...  
Keyword(s):  
Single Crystal ◽  
Electron Backscatter Diffraction ◽  
Crystal Rotation ◽  
Electron Backscatter ◽  
Backscatter Diffraction

Structure of Palladium Single-Crystal Films Prepared by Flash Evaporation onto (001) NaCl Substrates

1970 ◽  
Vol 28 ◽  
pp. 456-457
Author(s):  
L. E. Murr ◽  
G. Wong
Keyword(s):  
Single Crystal ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
High Rate ◽  
Flash Evaporation ◽  
Optimum Load ◽  
Single Crystal Films ◽  
Crystal Films ◽  
A Current

Palladium single-crystal films have been prepared by Matthews in ultra-high vacuum by evaporation onto (001) NaCl substrates cleaved in-situ, and maintained at ∼ 350° C. Murr has also produced large-grained and single-crystal Pd films by high-rate evaporation onto (001) NaCl air-cleaved substrates at 350°C. In the present work, very large (∼ 3cm2), continuous single-crystal films of Pd have been prepared by flash evaporation onto air-cleaved (001) NaCl substrates at temperatures at or below 250°C. Evaporation rates estimated to be ≧ 2000 Å/sec, were obtained by effectively short-circuiting 1 mil tungsten evaporation boats in a self-regulating system which maintained an optimum load current of approximately 90 amperes; corresponding to a current density through the boat of ∼ 4 × 104 amperes/cm2.

Cell structure properties during in situ creep experiments in the H.V.E.M.

1978 ◽  
Vol 36 (1) ◽  
pp. 574-575
Author(s):  
D. Caillard ◽  
J.L. Martin
Keyword(s):  
Tensile Axis ◽  
Cell Structure ◽  
Image Intensifier ◽  
Foil Thickness ◽  
Average Cell Size ◽  
Average Cell ◽  
Voltage Electron ◽  
Steady Stage ◽  
Stationary Creep

The behaviour of the dislocation substructure during the steady stage regime of creep, as well as its contribution to the creep rate, are poorly known. In particular, the stability of the subboundaries has been questioned recently, on the basis of experimental observations |1||2| and theoretical estimates |1||3|. In situ deformation experiments in the high voltage electron microscope are well adapted to the direct observation of this behaviour. We report here recent results on dislocation and subboundary properties during stationary creep of an aluminium polycristal at 200°C.During a macroscopic creep test at 200°C, a cell substructure is developed with an average cell size of a few microns. Microsamples are cut out of these specimens |4| with the same tensile axis, and then further deformed in the microscope at the same temperature and stain rate. At 1 MeV, one or a few cells can be observed in the foil thickness |5|. Low electron fluxes and an image intensifier were used to reduce radiation damage effects.

In situ Tensile Experiments at Low Temperatures on Niobium Single Crystals by H.V.E.M.

1975 ◽  
Vol 33 ◽  
pp. 58-59
Author(s):  
F. H. Louchet ◽  
L. P. Kubin
Keyword(s):  
Electron Microscope ◽  
Transition Temperature ◽  
Low Temperature ◽  
Slip System ◽  
Low Temperatures ◽  
Tensile Axis ◽  
Image Intensifier ◽  
Screw Dislocations ◽  
Source Operation

Experiments have been carried out on the 3 MeV electron microscope in Toulouse. The low temperature straining holder has been previously described Images given by an image intensifier are recorded on magnetic tape.The microtensile niobium samples are cut in a plane with the two operative slip directions [111] and lying in the foil plane. The tensile axis is near [011].Our results concern:- The transition temperature of niobium near 220 K: at this temperature and below an increasing difference appears between the mobilities of the screw and edge portions of dislocations loops. Source operation and interactions between screw dislocations of different slip system have been recorded.

Single Crystal Growth of High-Pressure Phases of Ice and Salt Hydrate Far Below the Original Melting Point by Mixing Alcohol: Crystal Structure Determination of Magnesium Chloride Heptahydrate

2020 ◽  
Author(s):  
Keishiro Yamashita ◽  
Kazuki Komatsu ◽  
Hiroyuki Kagi
Keyword(s):  
Crystal Structure ◽  
High Pressure ◽  
Crystal Growth ◽  
Single Crystal ◽  
Room Temperature ◽  
Growth Technique ◽  
Salt Hydrate ◽  
X Ray

An crystal-growth technique for single crystal x-ray structure analysis of high-pressure forms of hydrogen-bonded crystals is proposed. We used alcohol mixture (methanol: ethanol = 4:1 in volumetric ratio), which is a widely used pressure transmitting medium, inhibiting the nucleation and growth of unwanted crystals. In this paper, two kinds of single crystals which have not been obtained using a conventional experimental technique were obtained using this technique: ice VI at 1.99 GPa and MgCl<sub>2</sub>·7H<sub>2</sub>O at 2.50 GPa at room temperature. Here we first report the crystal structure of MgCl2·7H2O. This technique simultaneously meets the requirement of hydrostaticity for high-pressure experiments and has feasibility for further in-situ measurements.

Laser damage mechanism and in-situ observation of stacking fault relaxation in β-Ga2O3 single crystal by EFG method

CrystEngComm ◽  
2021 ◽  
Author(s):  
Bo Fu ◽  
Gaohang He ◽  
Wenxiang Mu ◽  
Yang Li ◽  
Boyuan Feng ◽  
...  
Keyword(s):  
Single Crystal ◽  
Light Field ◽  
Damage Mechanism ◽  
Stacking Fault ◽  
High Light ◽  
Laser Damage ◽  
In Situ Observation ◽  
Structure Destruction

We designed an original and effective method to study the laser damage mechanism of β-Ga2O3 single crystal grown by edge-defined film-fed growth (EFG). The structure destruction under high light field...

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