scholarly journals Unzipping a Membrane

2000 ◽  
Vol 8 (9) ◽  
pp. 3-7
Author(s):  
Stephen W. Carmichael ◽  
Julio M. Fernandez
Keyword(s):  
Silicon Nitride ◽  
Atomic Force Microscope ◽  
Spatial Resolution ◽  
High Resistance ◽  
Outer Surface ◽  
Deinococcus Radiodurans ◽  
Force Spectroscopy ◽  
Test Subject ◽  
Atomic Force ◽  
Inner Surface

The atomic force microscope (AFM) is well known for its outstanding spatial resolution, but it is becoming increasingly useful as the instrument for force spectroscopy. In the force spectroscopy mode, the AFM can measure tiny tension forces, in the piconewton (pN) range. Daniel Müller, Wolfgang Baurmeister, and Andreas Engel have used the AFM in both the imaging and force spectroscopy modes to pull proteins out of membranes in a controlled fashion.Müller et al. used Deinococcus radiodurans, a bacterium best known for its high resistance to radiation (as its Genus name implies), as their test subject. They extracted a highly regular membrane from the bacterium, the hexagonally packed intermediate (HPl) layer. They mounted the HPI on mica, so that the hydrophilic outer surface of the HPI adsorbed strongly to the mica, exposing the hydrophobic inner surface to the silicon nitride AFM stylus.

The atomic-force microscope and its future in biology

1993 ◽  
Vol 51 ◽  
pp. 704-705
Author(s):  
Jean-Paul Revel
Keyword(s):  
Silicon Nitride ◽  
Laser Beam ◽  
Atomic Force Microscope ◽  
Scanning Tunneling Microscope ◽  
Point Of View ◽  
Scanning Tunneling ◽  
Close Relative ◽  
Tunneling Microscope ◽  
Atomic Force ◽  
Sharp Point

The last few years have been marked by a series of remarkable developments in microscopy. Perhaps the most amazing of these is the growth of microscopies which use devices where the place of the lens has been taken by probes, which record information about the sample and display it in a spatial from the point of view of the context. From the point of view of the biologist one of the most promising of these microscopies without lenses is the scanned force microscope, aka atomic force microscope.This instrument was invented by Binnig, Quate and Gerber and is a close relative of the scanning tunneling microscope. Today's AFMs consist of a cantilever which bears a sharp point at its end. Often this is a silicon nitride pyramid, but there are many variations, the object of which is to make the tip sharper. A laser beam is directed at the back of the cantilever and is reflected into a split, or quadrant photodiode.

Fundamental Measurements of the Friction on an Atomically-Flat Terrace of Au(100) in Sulfuric Acid Solution under Potential Control Using Electrochemical Atomic Force Microscope

2006 ◽  
Vol 512 ◽  
pp. 395-398
Author(s):  
Nobumitsu Hirai ◽  
Tatsuya Tooyama ◽  
Toshihiro Tanaka
Keyword(s):  
Aqueous Solution ◽  
Sulfuric Acid ◽  
Silicon Nitride ◽  
Acid Solution ◽  
Atomic Force Microscope ◽  
Friction Force ◽  
Potential Range ◽  
Potential Control ◽  
Atomic Force ◽  
Atomically Flat

Potential dependence of the friction force between an atomically-flat terrace of Au(100) single crystal and a tip attached to a silicon nitride cantilever of electrochemical atomic force microscope (EC-AFM) have been investigated qualitatively in 0.05 M H2SO4 aqueous solution. It is found that the friction force gains when the potential increases in the potential range between −400 mV and 400 mV vs Hg/Hg2SO4 electrode.

Atomic force microscope-based single-molecule force spectroscopy of RNA unfolding

2011 ◽  
Vol 414 (1) ◽  
pp. 1-6 ◽  
Author(s):  
Hans A. Heus ◽  
Elias M. Puchner ◽  
Aafke J. van Vugt-Jonker ◽  
Julia L. Zimmermann ◽  
Hermann E. Gaub
Keyword(s):  
Atomic Force Microscope ◽  
Single Molecule ◽  
Force Spectroscopy ◽  
Single Molecule Force Spectroscopy ◽  
Atomic Force

Midas: A Nanotechnological Exploration of Touch

Leonardo ◽  
2009 ◽  
Vol 42 (3) ◽  
pp. 186-192 ◽  
Author(s):  
Paul Thomas
Keyword(s):  
Atomic Force Microscope ◽  
Force Spectroscopy ◽  
Atomic Force ◽  
Atomic Vibrations ◽  
Surface Vibrations

The Midas project investigates the trans-mediational space between skin and gold. Research for the project was conducted through the analysis of data recorded with an Atomic Force Microscope (AFM). The AFM, in its force spectroscopy mode, gathers data by picking up the surface vibrations as the cantilever touches the cell. The Midas project culminated in an installation that included data projection and audio work utilizing subsonic speakers to make the data from the atomic vibrations audible and palpable.

Modulus Mapping of Rubbers Using Micro- and Nano-Indentation Techniques

2001 ◽  
Vol 74 (3) ◽  
pp. 428-450 ◽  
Author(s):  
Kenneth T. Gillen ◽  
Edward R. Terrill ◽  
Robb M. Winter
Keyword(s):  
Atomic Force Microscope ◽  
Spatial Resolution ◽  
Tensile Modulus ◽  
Alternative Methods ◽  
Nano Indentation ◽  
Hard Materials ◽  
The Past ◽  
Atomic Force ◽  
Quantitative Estimates ◽  
Interfacial Force

Abstract Modulus measurements are among the most useful properties available for monitoring the cure and aging of rubbers. Historically, such measurements were done on macroscopic samples, but over the past 15 years, several penetration techniques have been and are being developed that allow quantitative estimates of modulus to be made with lateral resolutions of 100 μm or better. This review summarizes these developments and the types of unique information that can be generated on rubbery materials. A large part of the review focuses on the types of results available from a modulus profiling apparatus that has been used to study rubbers for the past 15 years. This instrument allows estimates to be made of the inverse tensile compliance (closely related to Young's tensile modulus) with a lateral resolution of around 50 to 100 μm. Several recently developed alternative methods for achieving similar spatial resolution are also described. Finally, a brief review is given of the recent attempts to measure quantitative modulus values for rubbers with even better resolution using instruments historically focused on metals and other hard materials such as nano-indenters, the atomic force microscope and the interfacial force microscope.

Quantifying bacterial adhesion on antifouling polymer brushes via single-cell force spectroscopy

2015 ◽  
Vol 6 (31) ◽  
pp. 5740-5751 ◽  
Author(s):  
Cesar Rodriguez-Emmenegger ◽  
Sébastien Janel ◽  
Andres de los Santos Pereira ◽  
Michael Bruns ◽  
Frank Lafont
Keyword(s):  
Atomic Force Microscope ◽  
Single Cell ◽  
Bacterial Adhesion ◽  
Bacterial Cell ◽  
Polymer Brushes ◽  
Force Spectroscopy ◽  
Adhesion Forces ◽  
Atomic Force ◽  
Cell Force

The adhesion forces between a single bacterial cell and different polymer brushes were measured directly with an atomic force microscope and correlated with their resistance to fouling.

Fast imaging and fast force spectroscopy of single biopolymers with a new atomic force microscope designed for small cantilevers

1999 ◽  
Vol 70 (11) ◽  
pp. 4300-4303 ◽  
Author(s):  
M. B. Viani ◽  
T. E. Schäffer ◽  
G. T. Paloczi ◽  
L. I. Pietrasanta ◽  
B. L. Smith ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Force Spectroscopy ◽  
Fast Imaging ◽  
Atomic Force

Nano-Grating Fabrication Technique

2006 ◽  
Vol 326-328 ◽  
pp. 131-134 ◽  
Author(s):  
Hui Min Xie ◽  
Zhan Wei Liu ◽  
Ming Zhang ◽  
Peng Wan Chen ◽  
Feng Lei Huang ◽  
...  
Keyword(s):  
Atomic Force Microscope ◽  
Spatial Resolution ◽  
Deformation Measurement ◽  
Fabrication Process ◽  
Fabrication Technique ◽  
Micro Fabrication ◽  
Grating Fabrication ◽  
Atomic Force ◽  
Experimental Parameters ◽  
Moire Method

In this paper, a novel nano-moiré grating fabrication technique was proposed for nanometer deformation measurement. The grating fabrication process was performed with the aid of Atomic Force Microscope (AFM) on the basis of micro-fabrication technique. On the analysis of some correlative factors of influencing grating line quality, some important experimental parameters were optimized. In this study, some parallel and cross nano-gratings with frequencies of from 10000lines/mm to 20000lines/mm were fabricated. The successful experimental results demonstrate that the nano-grating fabrication technique is feasible and also indicated that these nano-gratings with nano-moiré method can be applied to deformation measurement, which offers a nanometer sensitivity and spatial resolution.

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