A comparative study on defect estimation using XPS and Raman spectroscopy in few layer nanographitic structures
2016 ◽
Vol 18
(32)
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pp. 22160-22167
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Keyword(s):
X Ray
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Defects in planar and vertically oriented nanographitic structures (NGSs) synthesized by plasma enhanced chemical vapor deposition (PECVD) have been investigated using Raman and X-ray photoelectron spectroscopy.