Low-loss aluminum epitaxial film for scalable and sustainable plasmonics: direct comparison with silver epitaxial film

Nanoscale ◽  
2020 ◽  
Vol 12 (46) ◽  
pp. 23809-23816
Author(s):  
Soniya S. Raja ◽  
Chang-Wei Cheng ◽  
Shangjr Gwo
Keyword(s):  
Epitaxial Film ◽  
Visible Region ◽  
Aluminum Film ◽  
Low Loss ◽  
Blue Region ◽  
Deep Blue

The epitaxial aluminum film exhibits long plasmon lengths in the full visible region and outperforms silver in the deep blue region.

Highly efficient deep-blue organic light-emitting diodes based on pyreno[4,5-d]imidazole-anthracene structural isomers

2019 ◽  
Vol 7 (33) ◽  
pp. 10273-10280 ◽  
Author(s):  
Hui Liu ◽  
Liangliang Kang ◽  
Jinyu Li ◽  
Futong Liu ◽  
Xin He ◽  
...  
Keyword(s):  
High Efficiency ◽  
Light Emitting Diodes ◽  
Organic Light Emitting Diodes ◽  
Device Performance ◽  
Structural Isomers ◽  
Light Emitting ◽  
Blue Region ◽  
Deep Blue ◽  
Organic Light ◽  
Blue Emitters

By integrating PyI with anthracene, two high-efficiency blue emitters C-BPyIA and N-BPyIA are obtained. Especially, N-BPyIA exhibits decent device performance with an EQEmax of 7.67% in the deep blue region.

Novel Fluoranthene Structure for Deep-Blue Organic Light-Emitting Diodes

2008 ◽  
Vol 8 (9) ◽  
pp. 4787-4792 ◽  
Author(s):  
Soo-Kang Kim ◽  
Jong-Wook Park
Keyword(s):  
High Efficiency ◽  
Light Emitting Diodes ◽  
Organic Light Emitting Diodes ◽  
Light Emitting ◽  
Blue Region ◽  
Deep Blue ◽  
Organic Light ◽  
Color Coordinate ◽  
Excellent Color

As a new fluoranthene derivative, a synthesis of benzo[k]fluoranthene was suggested, so new blue emitting materials, 7,12-diphenylbenzo[k]fluoranthene [DPBF] and 7,8,10-triphenylfluoranthene [TPF] were synthesized. PLmax values of both compounds showed the wavelengths of 458 nm (TPF) and 434 nm, 453 nm (DPBF) that are in blue region. ELmax wavelength of the device using DPBF as an emitting layer was 436 and 454 nm in the deep-blue region, which are similar values with PL. The device that used DPBF as an emitting layer showed high efficiency of 2.11 cd/A and the excellent color coordinate value of (0.161, 0.131) in deep-blue region.

Enhancing Optical Gain Stability for a Deep-Blue Emitter Enabled by a Low-Loss Transparent Matrix

2018 ◽  
Vol 122 (37) ◽  
pp. 21569-21578 ◽  
Author(s):  
Jin-Qiang Pan ◽  
Jian-Peng Yi ◽  
Guohua Xie ◽  
Wen-Yong Lai ◽  
Wei Huang
Keyword(s):  
Optical Gain ◽  
Low Loss ◽  
Deep Blue

CANALISATION D'ONDES ÉLECTROMAGNÉTIQUES PAR DIFFRACTION ITÉRÉE

1963 ◽  
Vol 41 (10) ◽  
pp. 1604-1613 ◽  
Author(s):  
Germain Boivin ◽  
Réal Tremblay
Keyword(s):  
Visible Region ◽  
Periodic Sequence ◽  
Wave Guide ◽  
Beam Power ◽  
Low Loss ◽  
Amplitude Function ◽  
Beam Wave ◽  
Microwave Beam ◽  
Varied Function

The determination of a state of steady wave propagation through a periodic sequence of lenses with minimal beam power loss is based on a previously published study of encircled energy in the visible region. The amplitude function T(x) derived from an extremum of the factor of encircled energy E(W) for a fixed abscissa W = Wm = 5 can be replaced with sufficient accuracy by the varied function [Formula: see text]; the periodic sequence of lenses illuminated by a field distribution [Formula: see text] is analogous to a low-loss beam wave guide.With regard to this theoretical analysis and practical application, the authors describe the characteristics of a beam wave guide for millimeter waves which maintains an optimum compromise between diffraction losses and line dimensions. This analysis is completed by experimental results from a microwave beam wave guide operating at the 1.25 cm wavelength.

Low-Loss Images in a Stem/Tem Microscope

1976 ◽  
Vol 34 ◽  
pp. 496-497 ◽  
Author(s):  
David C. Joy ◽  
Dennis M. Maher
Keyword(s):  
High Resolution ◽  
Surface Topography ◽  
Beam Direction ◽  
Low Loss ◽  
Specimen Holder ◽  
Glancing Angle ◽  
High Resolution Images ◽  
Set Up ◽  
Conventional Manner ◽  
Objective Type

High-resolution images of the surface topography of solid specimens can be obtained using the low-loss technique of Wells. If the specimen is placed inside a lens of the condenser/objective type, then it has been shown that the lens itself can be used to collect and filter the low-loss electrons. Since the probeforming lenses in TEM instruments fitted with scanning attachments are of this type, low-loss imaging should be possible.High-resolution, low-loss images have been obtained in a JEOL JEM 100B fitted with a scanning attachment and a thermal, fieldemission gun. No modifications were made to the instrument, but a wedge-shaped, specimen holder was made to fit the side-entry, goniometer stage. Thus the specimen is oriented initially at a glancing angle of about 30° to the beam direction. The instrument is set up in the conventional manner for STEM operation with all the lenses, including the projector, excited.

Edge Penetration Effects in the Low-Loss Electron Image in the SEM

1988 ◽  
Vol 46 ◽  
pp. 202-203
Author(s):  
Oliver C. Wells
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Beam Energy ◽  
Secondary Electron ◽  
Sharp Edge ◽  
Beam Diameter ◽  
Low Loss ◽  
Additional Information ◽  
Electron Image ◽  
Scanning Electron

The low-loss electron (LLE) image in the scanning electron microscope (SEM) is useful for the study of uncoated photoresist and some other poorly conducting specimens because it is less sensitive to specimen charging than is the secondary electron (SE) image. A second advantage can arise from a significant reduction in the width of the “penetration fringe” close to a sharp edge. Although both of these problems can also be solved by operating with a beam energy of about 1 keV, the LLE image has the advantage that it permits the use of a higher beam energy and therefore (for a given SEM) a smaller beam diameter. It is an additional attraction of the LLE image that it can be obtained simultaneously with the SE image, and this gives additional information in many cases. This paper shows the reduction in penetration effects given by the use of the LLE image.

Background Fitting in the Low-Loss Region of Electron Energy Loss Spectra

1990 ◽  
Vol 48 (2) ◽  
pp. 56-57
Author(s):  
C P Scott ◽  
A J Craven ◽  
C J Gilmore ◽  
A W Bowen
Keyword(s):  
Energy Loss ◽  
Multiple Scattering ◽  
Simple Form ◽  
Single Scattering ◽  
Low Loss ◽  
Characteristic Energy ◽  
Normal Method ◽  
Fitting In ◽  
Electron Energy Loss ◽  
Electron Energy Loss Spectra

The normal method of background subtraction in quantitative EELS analysis involves fitting an expression of the form I=AE-r to an energy window preceding the edge of interest; E is energy loss, A and r are fitting parameters. The calculated fit is then extrapolated under the edge, allowing the required signal to be extracted. In the case where the characteristic energy loss is small (E < 100eV), the background does not approximate to this simple form. One cause of this is multiple scattering. Even if the effects of multiple scattering are removed by deconvolution, it is not clear that the background from the recovered single scattering distribution follows this simple form, and, in any case, deconvolution can introduce artefacts.The above difficulties are particularly severe in the case of Al-Li alloys, where the Li K edge at ~52eV overlaps the Al L2,3 edge at ~72eV, and sharp plasmon peaks occur at intervals of ~15eV in the low loss region. An alternative background fitting technique, based on the work of Zanchi et al, has been tested on spectra taken from pure Al films, with a view to extending the analysis to Al-Li alloys.

STEM Study of Surface Plasmon Excitation in Small Spherical Particles

1990 ◽  
Vol 48 (2) ◽  
pp. 42-43
Author(s):  
Daniel UGARTE
Keyword(s):  
Energy Loss ◽  
Spherical Particles ◽  
Small Particles ◽  
Bulk Materials ◽  
Low Loss ◽  
Plasmon Excitation ◽  
Surface Modes ◽  
Surface Plasmon Excitation ◽  
Analytical Electron ◽  
Analytical Electron Microscope

Small particles exhibit chemical and physical behaviors substantially different from bulk materials. This is due to the fact that boundary conditions can induce specific constraints on the observed properties. As an example, energy loss experiments carried out in an analytical electron microscope, constitute a powerful technique to investigate the excitation of collective surface modes (plasmons), which are modified in a limited size medium. In this work a STEM VG HB501 has been used to study the low energy loss spectrum (1-40 eV) of silicon spherical particles [1], and the spatial localization of the different modes has been analyzed through digitally acquired energy filtered images. This material and its oxides have been extensively studied and are very well characterized, because of their applications in microelectronics. These particles are thus ideal objects to test the validity of theories developed up to now.Typical EELS spectra in the low loss region are shown in fig. 2 and energy filtered images for the main spectral features in fig. 3.

Investigation of cluster layers of small netal particles by TEM, SEM, EELS and by photoacoustic spectroscopy

1990 ◽  
Vol 48 (4) ◽  
pp. 250-251
Author(s):  
H. Seiler ◽  
U. Haas ◽  
K.H. Körtje
Keyword(s):  
Bulk Material ◽  
High Vacuum ◽  
Optical Methods ◽  
Metal Particles ◽  
Silver Particles ◽  
Low Loss ◽  
Plasmon Excitation ◽  
First Results ◽  
Diffraction Patterns ◽  
Small Metal Particles

The physical properties of small metal particles reveal an intermediate position between atomic and bulk material. Especially Ag has shown pronounced size effects. We compared silver layers evaporated in high vacuum with cluster layers of small silver particles, evaporated in N2 at a pressure of about 102 Pa. The investigations were performed by electron optical methods (TEM, SEM, EELS) and by Photoacoustic (PA) Spectroscopy (gas-microphone detection).The observation of cluster layers with TEM and high resolution SEM show small silver particles with diameters of about 50 nm (Fig. 1 and Figure 2, respectively). The electron diffraction patterns of homogeneous Ag layers and of cluster layers are similar, whereas the low loss EELS spectra due to plasmon excitation are quite different. Fig. 3 and Figure 4 show first results of EELS spectra of a cluster layer of small silver particles on carbon foil and of a homogeneous Ag layer, respectively.

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