Features of two-dimensional to three-dimensional growth mode transition of Ge in SiGe/Si(001) heterostructures with strained layers

2009 ◽  
Vol 95 (15) ◽  
pp. 151902 ◽  
Author(s):  
D. V. Yurasov ◽  
Yu. N. Drozdov ◽  
M. V. Shaleev ◽  
A. V. Novikov
2016 ◽  
Vol 18 (36) ◽  
pp. 25143-25150 ◽  
Author(s):  
F. Rietzler ◽  
B. May ◽  
H.-P. Steinrück ◽  
F. Maier

In vacuo deposition of ultrathin ionic liquid films combined with angle-resolved X-ray photoelectron spectroscopy demonstrates that the initial three-dimensional growth mode of [C2C1Im][OTf] deposited onto the bare Au(111) surface can be switched to two-dimensional growth by adding submonolayer amounts of Pd.


1992 ◽  
Vol 263 ◽  
Author(s):  
T. Schweizer ◽  
K. Köhler ◽  
P. Ganser ◽  
P. Hiesinger ◽  
W. Rothemund

ABSTRACTLattice mismatched InxGa1−xAs layers with InAs mole fractions below 0.25 grow in a two dimensional growth mode on GaAs. If the thickness of these layers is beyond the critical layer thickness the strain relaxes through misfit dislocations. The misfit dislocation density in the <011> and <01-1> direction differs for n-type layers. This results in a highly anisotropic electron mobility for GaAs/InxGa1−xAs/Al0.3Ga0.7As inverted HEMT structures. A higher electron mobility in the < 011 > direction is measured in comparison to the <01-1> direction. The resistance ratio in the two perpendicular directions exceeds 105. For a three dimensional growth mode, the InxGa1−xAs layer shows interface roughness which degrades the transport properties of the normal Al0.3Ga0.7As/ InxGa1−xAs/ GaAs HEMT structures more than the inverted GaAs/InxGa1−xAs/ Al0.3Ga0.7As HEMT structures. For a three dimensional growth mode, an anisotropic electron mobility for Al0.3Ga0.7As/InxGal, As/GaAs HEMT structures is also observed. For these structures the highest electron mobility is measured in the < 01-1 > direction. This anisotropy could be explained by anisotropic growth rates in the <011> and < 01-1 > directions which results in growth islands with asymmetric extensions.


1999 ◽  
Vol 571 ◽  
Author(s):  
K. Leonard ◽  
D. Hommel ◽  
A. Stockmann ◽  
H. Selke ◽  
J. Seufert ◽  
...  

ABSTRACTThe growth mode of CdSe layers grown by migration enhanced epitaxy between ZnSe barriers has been investigated. In situ reflection high-energy electron diffraction shows a gradual transition to a three-dimensional growth mode which, however, is not accompanied by a change of the surface lattice constant. High-resolution transmission electron micrographs reveal a strong Cd diffusion, leading to ternary ZnCdSe quantum wells. Furthermore. composition fluctuations perpendicular to the growth direction on a nanometer scale are found already prior to the beginning of the growth mode transition. In the case of heterostructures containing a CdSe layer that has undergone the growth mode transition, micrographs show Cd-rich quantum dots with diameters of around 8 nm and heights of around 1.5 nm within a ternary quantum well. By spatially resolved photoluminescence the emission from single quantum dots could be observed. The polarization dependence of the emission from single dots indicates an asymmetric shape of the dots with certain preferential orientations along the [110] and [110] directions.


2019 ◽  
Vol 19 (4) ◽  
pp. 542-547
Author(s):  
Agata Jasik ◽  
Iwona Sankowska ◽  
Andrzej Wawro ◽  
Jacek Ratajczak ◽  
Dariusz Smoczyński ◽  
...  

2003 ◽  
Vol 10 (04) ◽  
pp. 669-675
Author(s):  
F. S. Gard ◽  
J. D. Riley ◽  
R. Leckey ◽  
B. F. Usher

ZnSe epilayers have been grown under various Se/Zn atomic flux ratios in the range of 0.22–2.45 at a substrate temperature of 350°C on Zn pre-exposed GaAs (111) A surfaces. Real time reflection high energy electron diffraction (RHEED) observations have shown a transition from a two-dimensional (2D) to a three-dimensional (3D) growth mode. The transition time depends directly upon the growth rate. A detailed discussion is presented to explore the cause of this change in the growth mode.


2011 ◽  
Vol 110-116 ◽  
pp. 3786-3790
Author(s):  
Wen Juan Han ◽  
Guo Qiang Zheng ◽  
Yan Yan Liang ◽  
Chun Tai Liu ◽  
Chang Yu Shen

In this study, PA66 nanofibers were successfully solution electrospun. The crystalline morphological features of HDPE solution induced by nanofibers were investigated by scanning electron microscopy (SEM). Nanohybrid shish-kebab (NHSK) can be formed in HDPE solution via isothermal crystallization, in which PA66 nanofibers serve as shish and HDPE lamellae act as kebabs surrounding the nanofibers periodically. Additionally, crystallization time has significant effect on the structure of HDPE kebab in NHSK, i.e., as crystallization time increases, the size of the kebab increases and the crystals decorated on PA66 nanofibers exhibit a three-dimensional growth (i.e., aggregate of crystallites) rather than a two-dimensional one (i.e., disc-like lamellae normal to the axis of nanofiber).


2012 ◽  
Vol 101 (20) ◽  
pp. 201602 ◽  
Author(s):  
Priya V. Chinta ◽  
Sara J. Callori ◽  
Matthew Dawber ◽  
Almamun Ashrafi ◽  
Randall L. Headrick

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