A method to provide rapid in situ determination of tip radius in dynamic atomic force microscopy

2012 ◽  
Vol 83 (4) ◽  
pp. 043707 ◽  
Author(s):  
Sergio Santos ◽  
Li Guang ◽  
Tewfik Souier ◽  
Karim Gadelrab ◽  
Matteo Chiesa ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force ◽  
Tip Radius

In situ determination of effective tip radius in dynamic atomic force microscopy

2014 ◽  
Vol 1652 ◽  
Author(s):  
C. Maragliano ◽  
A. Glia ◽  
M. Stefancich ◽  
M. Chiesa
Keyword(s):  
Atomic Force Microscopy ◽  
Quantitative Information ◽  
Sem Images ◽  
Reliable Technique ◽  
Force Microscopy ◽  
Atomic Force ◽  
Capacitance Curve ◽  
Tip Radius

AbstractAtomic force microscopy (AFM) suffers from an important limitation: it does not provide quantitative information about the scanned sample. This is because too many unknowns come into play in AFM measurements. The shape of the tip is probably the most important. A technique able to characterize in situ the shape of the tip apex would represent an important step ahead to turn the AFM into a quantitative tool.Standard methods can be destructive to the tip and are time consuming. Two main methods are currently used to characterize the tip radius in situ without affecting its shape. The first consists of characterizing the tip radius by monitoring the dynamics of the cantilever. The value of free amplitude, for which transitions from the attractive to repulsive force regimes are observed, strongly depends on the curvature of the tip. The second method to characterize the tip radius consists instead on fitting the capacitance curve of the tip-sample system with an analytical function.In this work we compare the two methods to characterize in situ the tip radius and results are verified with SEM images. The value of the free amplitude is correlated with the value of R while the capacitance curve is derived with a method we proposed. Tips with different tip radii are used. The investigation is conducted with the aim of determining the most reliable technique for characterizing the tip radius for both sharp and blunt tips.

scholarly journals Mirror effect in atomic force microscopy profiles enables tip reconstruction

2020 ◽  
Vol 10 (1) ◽  
Author(s):  
Francisco Marques-Moros ◽  
Alicia Forment-Aliaga ◽  
Elena Pinilla-Cienfuegos ◽  
Josep Canet-Ferrer
Keyword(s):  
Atomic Force Microscopy ◽  
Reconstruction Process ◽  
Calibration Standards ◽  
Force Microscopy ◽  
Atomic Force ◽  
Real Distribution ◽  
Tip Radius ◽  
Convolution Effect ◽  
Good Agreement

Abstract In this work, the tip convolution effect in atomic force microscopy is revisited to illustrate the capabilities of cubic objects for determination of the tip shape and size. Using molecular-based cubic nanoparticles as a reference, a two-step tip reconstruction process has been developed. First, the tip-to-face angle is estimated by means of an analysis of the convolution error while the tip radius is extracted from the experimental profiles. The results obtained are in good agreement with specification of the tip supplier even though the experiments have been conducted using real distribution of nanoparticles with dispersion in size and aspect ratio. This demonstrates the reliability of our method and opens the door for a more accurate tip reconstruction by using calibration standards.

Atomic force microscopy of in situ deformed nickel thin films

1999 ◽  
Vol 353 (1-2) ◽  
pp. 194-200 ◽  
Author(s):  
C. Coupeau ◽  
J.F. Naud ◽  
F. Cleymand ◽  
P. Goudeau ◽  
J. Grilhé
Keyword(s):  
Thin Films ◽  
Atomic Force Microscopy ◽  
Force Microscopy ◽  
Nickel Thin Films ◽  
Atomic Force
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