scholarly journals Radiolysis of astrophysical ices by heavy ion irradiation: Destruction cross section measurement

2012 ◽  
Vol 38 (8) ◽  
pp. 759-765 ◽  
Author(s):  
A. L. F. de Barros ◽  
P. Boduch ◽  
A. Domaracka ◽  
H. Rothard ◽  
E. F. da Silveira
2011 ◽  
Vol 531 ◽  
pp. A160 ◽  
Author(s):  
A. L. F. de Barros ◽  
V. Bordalo ◽  
E. Seperuelo Duarte ◽  
E. F da Silveira ◽  
A. Domaracka ◽  
...  

2021 ◽  
Author(s):  
Li Dong-Qing ◽  
Liu Tian-Qi ◽  
Zhao Pei-Xiong ◽  
Wu Zhen-Yu ◽  
Wang Tie-Shan ◽  
...  

Abstract 3D TCAD simulations demonstrated that reducing the distance between the well boundary and NMOS or PMOS can mitigate the cross section of Single Event Upset (SEU) in 14 nm CMOS bulk FinFET technology. The competition of charge collection between well boundary and sensitive nodes, the enhanced restore currents and the change of bipolar effect are responsible for the decrease of SEU cross section. Different from Dual-interlock cells (DICE) design, under the presence of enough taps to ensure the rapid recovery of well potential, this approach is more effective under heavy ion irradiation of higher LET. Besides, the feasibility of this method and its effectiveness with feature size scaling down are discussed.


2002 ◽  
Vol 82 (11) ◽  
pp. 2333-2339
Author(s):  
G. Schumacher ◽  
R. C. Birtcher ◽  
D. P. Renusch ◽  
M. Grimsditch ◽  
L. E. Rehn

RSC Advances ◽  
2021 ◽  
Vol 11 (42) ◽  
pp. 26218-26227
Author(s):  
R. Panda ◽  
S. A. Khan ◽  
U. P. Singh ◽  
R. Naik ◽  
N. C. Mishra

Swift heavy ion (SHI) irradiation in thin films significantly modifies the structure and related properties in a controlled manner.


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