Very slow decay of a defect related emission band at 2.4 eV in AlN: Signatures of the Si related shallow DX state
2016 ◽
Vol 254
(5)
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pp. 1600338
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Keyword(s):
1982 ◽
Vol 27
(4)
◽
pp. 357-363
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Keyword(s):
2008 ◽
Vol 8
(11)
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pp. 5854-5857
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2016 ◽
Vol 12
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pp. 825-834
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Keyword(s):