Permittivity Relaxation Variation for Additive Doping in Cobalt Ferrite at High Frequencies
Keyword(s):
C 30
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We present a comparative study of the variation in dielectric relaxation for the additives SiO2, TiO2 and ZrO2 in cobalt ferrite. CoFe2O4 was prepared using microwave hydrothermal system and sintered at 900 °C/30 min using microwave sintering method. Real and imaginary parts of permittivity were measured in the frequency range of 1 MHz to 1.8 GHz for these samples. A shift in the dielectric relaxation towards higher frequencies for doped samples is observed as expected in percolating systems. A non-linear least square fit of the electron oscillator model is used to parameterize absorption in the samples.