X-ray diffraction study of CdS/CdTe heterostructure for thin-film solar cell: influence of CdS grain size on subsequent growth of (111)-oriented CdTe film

2006 ◽  
Vol 39 (8) ◽  
pp. 1537-1542 ◽  
Author(s):  
T Toyama ◽  
K Matsune ◽  
H Oda ◽  
M Ohta ◽  
H Okamoto
Keyword(s):  
Thin Film ◽  
Grain Size ◽  
Solar Cell ◽  
Diffraction Study ◽  
Thin Film Solar Cell ◽  
Cdte Film ◽  
X Ray Diffraction ◽  
Subsequent Growth ◽  
X Ray

Lattice parameters and optical absorption of CuIn1-xGaxSe2 thin films

1999 ◽  
Vol 77 (7) ◽  
pp. 515-520
Author(s):  
AAI Al-Bassam
Keyword(s):  
Thin Film ◽  
Crystal Structure ◽  
Thin Films ◽  
Grain Size ◽  
Lattice Parameters ◽  
X Ray Diffraction ◽  
X Ray ◽  
Lattice Constants ◽  
Cubic Structure ◽  
Ga Content

Thin film polycrystalline solar cells based on CuIn1–xGaxSe2 have been fabricated and studied with x values from 0 to 1.0. The lattice parameters, grain size, and band gap were measured. Crystal structure and X-ray data of CuIn1–xGaxSe2 were determined using X-ray diffractometry. These materials had a cubic structure with x ≥ 0.5 and a tetragonal structure with x ≤ 0.5. The lattice constants vary linearly with composition. Grain size was measured using X-ray diffraction where the grain size increased linearly with Ga content. A grain size of 1.83-3.52 μm was observed with x ≤ 0.5, while it increased to 4.53 μm for x = 0.58.PACS No.: 70.73

Solid-Phase Crystallization of a-Si:H by RTA

2010 ◽  
Vol 44-47 ◽  
pp. 4151-4153 ◽  
Author(s):  
Rui Min Jin ◽  
Ding Zhen Li ◽  
Lan Li Chen ◽  
Xiang Ju Han ◽  
Jing Xiao Lu
Keyword(s):  
Thin Film ◽  
Grain Size ◽  
Amorphous Silicon ◽  
Glass Substrate ◽  
Solid Phase ◽  
X Ray Diffraction ◽  
Solid Phase Crystallization ◽  
X Ray ◽  
Average Grain Size ◽  
Electronic Microscope

Amorphous silicon films prepared by PECVD on glass substrate has been crystallized by rapid thermal annealing (RTA) at the same temperature for different time. From X-ray diffraction (XRD) and scanning electronic microscope (SEM), it is found that the grain size is biggest crystallized at 720°C for 8 min, an average grain size of 28nm or so is obtained. The thin film is smoothly and perfect structure.

CoPt/C NANOGRANULAR MAGNETIC THIN FILM

2005 ◽  
Vol 19 (14) ◽  
pp. 2261-2271 ◽  
Author(s):  
TONG LI ◽  
HUI YAN ◽  
HAI WANG ◽  
WU ZHENG
Keyword(s):  
Thin Film ◽  
Grain Size ◽  
Carbon Matrix ◽  
Magnetic Interactions ◽  
High Coercivity ◽  
Magnetic Thin Film ◽  
X Ray Diffraction ◽  
X Ray ◽  
High Density Recording ◽  
Deposition Mode

Granular Co 30 Pt 70/ C and Co 45 Pt 55/ C films, consisting of nanoparticle CoPt phases embedded in a carbon matrix, have been made by co-sputtering from CoPt and C targets using a tandem deposition mode. X-ray diffraction shows the existence of hard CoPt phase embedded in an amorphous C matrix after annealing. The coercivities for CoPt/C are strongly dependent on C and Pt composition. Films with coercivity of up to 5.4 kOe and grain size of 7 nm can be obtained. The development of shoulder in hysteresis loop may be contributed to the co-existence of magnetic soft CoPt 3 and hard CoPt phases and the magnetic interactions between them. High remanence Mr/Ms (>0.8) found in our samples indicates the presence of the intergranular interactions in the samples. Observed positive contributions of δm also give evidence of the existence of exchange interaction. High coercivity and large Mr/Ms make granular CoPt/C film with magnetic nanoparticles very attractive for next-generation high-density recording.

The X-ray diffraction study of epitaxial La0.67Sr0.33MnO3 single crystal thin film

1997 ◽  
Vol 42 (22) ◽  
pp. 1932-1936 ◽  
Author(s):  
Jie Gao ◽  
Caoshui Xiong ◽  
Yeqing Tang ◽  
Hong Zhu ◽  
Li Pi ◽  
...  
Keyword(s):  
Thin Film ◽  
Single Crystal ◽  
Diffraction Study ◽  
X Ray Diffraction ◽  
X Ray
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