CoPt/C NANOGRANULAR MAGNETIC THIN FILM

2005 ◽  
Vol 19 (14) ◽  
pp. 2261-2271 ◽  
Author(s):  
TONG LI ◽  
HUI YAN ◽  
HAI WANG ◽  
WU ZHENG
Keyword(s):  
Thin Film ◽  
Grain Size ◽  
Carbon Matrix ◽  
Magnetic Interactions ◽  
High Coercivity ◽  
Magnetic Thin Film ◽  
X Ray Diffraction ◽  
X Ray ◽  
High Density Recording ◽  
Deposition Mode

Granular Co 30 Pt 70/ C and Co 45 Pt 55/ C films, consisting of nanoparticle CoPt phases embedded in a carbon matrix, have been made by co-sputtering from CoPt and C targets using a tandem deposition mode. X-ray diffraction shows the existence of hard CoPt phase embedded in an amorphous C matrix after annealing. The coercivities for CoPt/C are strongly dependent on C and Pt composition. Films with coercivity of up to 5.4 kOe and grain size of 7 nm can be obtained. The development of shoulder in hysteresis loop may be contributed to the co-existence of magnetic soft CoPt 3 and hard CoPt phases and the magnetic interactions between them. High remanence Mr/Ms (>0.8) found in our samples indicates the presence of the intergranular interactions in the samples. Observed positive contributions of δm also give evidence of the existence of exchange interaction. High coercivity and large Mr/Ms make granular CoPt/C film with magnetic nanoparticles very attractive for next-generation high-density recording.

Lattice parameters and optical absorption of CuIn1-xGaxSe2 thin films

1999 ◽  
Vol 77 (7) ◽  
pp. 515-520
Author(s):  
AAI Al-Bassam
Keyword(s):  
Thin Film ◽  
Crystal Structure ◽  
Thin Films ◽  
Grain Size ◽  
Lattice Parameters ◽  
X Ray Diffraction ◽  
X Ray ◽  
Lattice Constants ◽  
Cubic Structure ◽  
Ga Content

Thin film polycrystalline solar cells based on CuIn1–xGaxSe2 have been fabricated and studied with x values from 0 to 1.0. The lattice parameters, grain size, and band gap were measured. Crystal structure and X-ray data of CuIn1–xGaxSe2 were determined using X-ray diffractometry. These materials had a cubic structure with x ≥ 0.5 and a tetragonal structure with x ≤ 0.5. The lattice constants vary linearly with composition. Grain size was measured using X-ray diffraction where the grain size increased linearly with Ga content. A grain size of 1.83-3.52 μm was observed with x ≤ 0.5, while it increased to 4.53 μm for x = 0.58.PACS No.: 70.73

Solid-Phase Crystallization of a-Si:H by RTA

2010 ◽  
Vol 44-47 ◽  
pp. 4151-4153 ◽  
Author(s):  
Rui Min Jin ◽  
Ding Zhen Li ◽  
Lan Li Chen ◽  
Xiang Ju Han ◽  
Jing Xiao Lu
Keyword(s):  
Thin Film ◽  
Grain Size ◽  
Amorphous Silicon ◽  
Glass Substrate ◽  
Solid Phase ◽  
X Ray Diffraction ◽  
Solid Phase Crystallization ◽  
X Ray ◽  
Average Grain Size ◽  
Electronic Microscope

Amorphous silicon films prepared by PECVD on glass substrate has been crystallized by rapid thermal annealing (RTA) at the same temperature for different time. From X-ray diffraction (XRD) and scanning electronic microscope (SEM), it is found that the grain size is biggest crystallized at 720°C for 8 min, an average grain size of 28nm or so is obtained. The thin film is smoothly and perfect structure.

Composition and Lattice Constant Evaluation of the Garnet System (Dy, Gd)3Ga5O12

1972 ◽  
Vol 16 ◽  
pp. 177-185
Author(s):  
L. A. Moudy ◽  
S. B. Austerman
Keyword(s):  
Thin Film ◽  
Rare Earth ◽  
Lattice Constant ◽  
Direct Measurement ◽  
Magnetic Thin Film ◽  
X Ray Diffraction ◽  
X Ray ◽  
Lattice Matching ◽  
Lattice Constants ◽  
Constant Control

AbstractCompositional and lattice constant control of non-magnetic garnet substrates are required for suitable lattice matching with epitaxially deposited magnetic thin film. Suitable substrates for this purpose are the simple and mixed rare earth garnets. Lattice constants were obtained on Czochralski grown crystals by conventional x-ray diffraction powder techniques with a precision of ± .0005Å. An x-ray fluorescence method was developed to determine crystal composition with a precision of ± 0.5 percent. The precision with which a can be determined indirectly by x-ray fluorescence is ± 0.0082Å, which is comparable with that from direct measurement.

Electrodeposition of Nanocrystalline CoNiFe Thin Films Prepared by Cyclic Voltammetry

2009 ◽  
Vol 620-622 ◽  
pp. 731-734 ◽  
Author(s):  
Chao Cai ◽  
Qiu Ping Wang ◽  
Zhao Zhang ◽  
Jian Feng Yang
Keyword(s):  
Thin Film ◽  
Cyclic Voltammetry ◽  
Growth Process ◽  
Magnetic Flux Density ◽  
Magnetic Thin Film ◽  
X Ray Diffraction ◽  
Soft Magnetic ◽  
X Ray ◽  
Xrd Techniques ◽  
Scanning Electron

The electroplating behavior of nanocrystalline CoNiFe soft magnetic thin film with high saturation magnetic flux density and low coercivity was investigated using cyclic voltammetry and chronoamperometry methods in conjunction with the scanning electron microscopy (SEM/EDX) and X-ray diffraction (XRD) techniques. The results show that, the co-deposition of CoNiFe alloy behaves anomalously. And the nucleation/growth process of CoNiFe ternary alloy followed 3D instantaneous mechanism at higher potentials, while in the case of lower potentials it followed 3D progressive mechanism.

Copper Indium Silicon Nanocomposite Thin Film Deposited by Magnetron Co-Sputtering

2011 ◽  
Vol 110-116 ◽  
pp. 3289-3292
Author(s):  
Jian Sheng Xie ◽  
Jin Hua Li ◽  
Ping Luan
Keyword(s):  
Thin Film ◽  
Grain Size ◽  
Film Surface ◽  
Nanocomposite Films ◽  
Nanocomposite Thin Film ◽  
X Ray Diffraction ◽  
X Ray ◽  
Copper Indium ◽  
Xrd Studies

Thin CuInSi nanocomposite films were prepared by magnetron co-sputtering. The structures of CuInSi nanocomposite films were detected by X-ray diffraction (XRD); XRD studies of the annealed films indicate the presence of CuInSi, a peak at about 2θ=42.400°. The morphology of the film surface was studied by SEM. The nanocrystallization with needle shape of CuInSi could be seen clearly. The grain size is a few hundred angstroms.

Palladium Nanowire Thin Films via Template Growth

2003 ◽  
Vol 775 ◽  
Author(s):  
Donghai Wang ◽  
David T. Johnson ◽  
Byron F. McCaughey ◽  
J. Eric Hampsey ◽  
Jibao He ◽  
...  
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Conductive Substrate ◽  
Palladium Nanowires ◽  
Efficient Route ◽  
Silica Thin Film

AbstractPalladium nanowires have been electrodeposited into mesoporous silica thin film templates. Palladium continually grows and fills silica mesopores starting from a bottom conductive substrate, providing a ready and efficient route to fabricate a macroscopic palladium nanowire thin films for potentially use in fuel cells, electrodes, sensors, and other applications. X-ray diffraction (XRD) and transmission electron microscopy (TEM) indicate it is possible to create different nanowire morphology such as bundles and swirling mesostructure based on the template pore structure.

scholarly journals Deep learning for visualization and novelty detection in large X-ray diffraction datasets

2021 ◽  
Vol 7 (1) ◽  
Author(s):  
Lars Banko ◽  
Phillip M. Maffettone ◽  
Dennis Naujoks ◽  
Daniel Olds ◽  
Alfred Ludwig
Keyword(s):  
Thin Film ◽  
Crystal Structure ◽  
Artificial Intelligence ◽  
Deep Learning ◽  
Novelty Detection ◽  
Structural Similarity ◽  
X Ray Diffraction ◽  
X Ray ◽  
Diffraction Patterns ◽  
Post Hoc

AbstractWe apply variational autoencoders (VAE) to X-ray diffraction (XRD) data analysis on both simulated and experimental thin-film data. We show that crystal structure representations learned by a VAE reveal latent information, such as the structural similarity of textured diffraction patterns. While other artificial intelligence (AI) agents are effective at classifying XRD data into known phases, a similarly conditioned VAE is uniquely effective at knowing what it doesn’t know: it can rapidly identify data outside the distribution it was trained on, such as novel phases and mixtures. These capabilities demonstrate that a VAE is a valuable AI agent for aiding materials discovery and understanding XRD measurements both ‘on-the-fly’ and during post hoc analysis.

scholarly journals Preparation of high-entropy carbides by different sintering techniques

2021 ◽  
Vol 56 (19) ◽  
pp. 11237-11247 ◽  
Author(s):  
Johannes Pötschke ◽  
Manisha Dahal ◽  
Mathias Herrmann ◽  
Anne Vornberger ◽  
Björn Matthey ◽  
...  
Keyword(s):  
Grain Size ◽  
Single Phase ◽  
X Ray Diffraction ◽  
Vacuum Sintering ◽  
X Ray ◽  
High Entropy ◽  
Mean Grain Size ◽  
The Mean ◽  
Gas Pressure Sintering ◽  
Hardness Values

AbstractDense (Hf, Ta, Nb, Ti, V)C- and (Ta, Nb, Ti, V, W)C-based high-entropy carbides (HEC) were produced by three different sintering techniques: gas pressure sintering/sinter–HIP at 1900 °C and 100 bar Ar, vacuum sintering at 2250 °C and 0.001 bar as well as SPS/FAST at 2000 °C and 60 MPa pressure. The relative density varied from 97.9 to 100%, with SPS producing 100% dense samples with both compositions. Grain size measurements showed that the substitution of Hf with W leads to an increase in the mean grain size of 5–10 times the size of the (Hf, Ta, Nb, Ti, V,)C samples. Vacuum-sintered samples showed uniform grain size distribution regardless of composition. EDS mapping revealed the formation of a solid solution with no intermetallic phases or element clustering. X-ray diffraction analysis showed the structure of mostly single-phase cubic high-entropy carbides. Hardness measurements revealed that (Hf, Ta, Nb, Ti, V)C samples possess higher hardness values than (Ta, Nb, Ti, V, W)C samples.

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