Numerical and experimental study of a 0.25 µm fully-depleted silicon-on-insulator MOSFET: static and dynamic radio-frequency behaviour

2002 ◽  
Vol 17 (11) ◽  
pp. 1149-1156 ◽  
Author(s):  
R Rengel ◽  
J Mateos ◽  
D Pardo ◽  
T Gonz lez ◽  
M J Mart n ◽  
...  
Electronics ◽  
2021 ◽  
Vol 10 (13) ◽  
pp. 1585
Author(s):  
Hanbin Wang ◽  
Jinshun Bi ◽  
Mengxin Liu ◽  
Tingting Han

This work investigates the different sensitivities of an ion-sensitive field-effect transistor (ISFET) based on fully depleted silicon-on-insulator (FDSOI). Using computer-aided design (TCAD) tools, the sensitivity of a single-gate FDSOI based ISFET (FDSOI-ISFET) at different temperatures and the effects of the planar dual-gate structure on the sensitivity are determined. It is found that the sensitivity increases linearly with increasing temperature, reaching 890 mV/pH at 75 °C. By using a dual-gate structure and adjusting the control gate voltage, the sensitivity can be reduced from 750 mV/pH at 0 V control gate voltage to 540 mV/pH at 1 V control gate voltage. The above sensitivity changes are produced because the Nernst limit changes with temperature or the electric field generated by different control gate voltages causes changes in the carrier movement. It is proved that a single FDSOI-ISFET can have adjustable sensitivity by adjusting the operating temperature or the control gate voltage of the dual-gate device.


2015 ◽  
Vol 118 (18) ◽  
pp. 184504 ◽  
Author(s):  
C. Navarro ◽  
M. Bawedin ◽  
F. Andrieu ◽  
B. Sagnes ◽  
F. Martinez ◽  
...  

2021 ◽  
pp. 1-1
Author(s):  
Yu-Hung Liao ◽  
Khandker Akif Aabrar ◽  
Wriddhi Chakraborty ◽  
Wenshen Li ◽  
Suman Datta ◽  
...  

2000 ◽  
Author(s):  
T. Fujino ◽  
Y. Watanabe ◽  
K. Uchiyama ◽  
H. Kouka ◽  
H. Suzuki ◽  
...  

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