Analyses of defect distributions in ZnO varistors based on the Jonscher’s universal power law and the Dissado–Hill model

The defect distributions in ZnO varistors mixed with Bi2O3, NiO, MnCO3, Co2O3, and SiO2 after doping Sb2O3 were investigated, based on the Jonscher’s universal power law and the Dissado–Hill model. The microstructures were investigated using x-ray diffractometer, scanning electron microscope, energy dispersive spectrometer, and x-ray photoelectron spectrometer. The capacitance–voltage (C–V) method was utilized to obtain the parameters of the double Schottky barrier. The dielectric spectra were analyzed to extract the parameters of defect distribution. The current density–electric field (J–E) characteristics were measured to obtain the parameters of electrical properties. We found that with increasing Sb2O3 content, the ZnO grain size distribution become more homogeneous in the Sb2O3-doped ZnO varistors; the density Zn i × is decreased; except for less homogeneous V O × , more homogeneous distributions of Zn i ∙ in the depletion layers and the extrinsic defects at the interfaces are achieved in the Sb2O3-doped ZnO varistors. Therefore, the enhancement in the electrical properties was achieved by doping Sb2O3 due to the increased number of active grain boundaries per unit volume, i.e. the increased breakdown field and nonlinear coefficient, and the decreased leakage current density. The results of this study suggest that the Jonscher’s universal power law and the Dissado–Hill model can be effectively used to analyze defect distributions in varistor ceramics.