Single carrier trapping and de-trapping in scaled silicon complementary metal-oxide-semiconductor field-effect transistors at low temperatures
2017 ◽
Vol 32
(7)
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pp. 075001
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2009 ◽
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pp. 04C051
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2001 ◽
pp. 1343-1350
1995 ◽
Vol 34
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pp. L978-L980
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pp. 9982-9990
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2002 ◽
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pp. 1030-1033
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