Effect of heavy ion irradiation on the interface traps of AlGaN/GaN High Electron Mobility Transistors

2021 ◽  
Author(s):  
Zheng-Zhao Lin ◽  
Ling Lü ◽  
Xue-Feng Zheng ◽  
Yan-Rong Cao ◽  
Pei-Pei Hu ◽  
...  
Keyword(s):  
Electron Mobility ◽  
Ion Irradiation ◽  
High Electron Mobility Transistors ◽  
Heavy Ion ◽  
High Electron ◽  
Interface Traps ◽  
High Electron Mobility ◽  
Heavy Ion Irradiation ◽  
Electron Mobility Transistors

Method of evaluating interface traps in Al2O3/AlGaN/GaN high electron mobility transistors

2019 ◽  
Vol 28 (6) ◽  
pp. 067304 ◽  
Author(s):  
Si-Qin-Gao-Wa Bao ◽  
Xiao-Hua Ma ◽  
Wei-Wei Chen ◽  
Ling Yang ◽  
Bin Hou ◽  
...  
Keyword(s):  
Electron Mobility ◽  
High Electron Mobility Transistors ◽  
High Electron ◽  
Interface Traps ◽  
High Electron Mobility ◽  
Electron Mobility Transistors

scholarly journals Heavy ion irradiation effects on GaN/AlGaN high electron mobility transistor failure at off-state

2019 ◽  
Vol 102 ◽  
pp. 113493 ◽  
Author(s):  
Zahabul Islam ◽  
Angela L. Paoletta ◽  
Anthony M. Monterrosa ◽  
Jennifer D. Schuler ◽  
Timothy J. Rupert ◽  
...  
Keyword(s):  
Electron Mobility ◽  
Ion Irradiation ◽  
High Electron Mobility Transistor ◽  
Heavy Ion ◽  
High Electron ◽  
Irradiation Effects ◽  
High Electron Mobility ◽  
Heavy Ion Irradiation

Low-Frequency Noise Investigation of AlGaN/GaN High-Electron-Mobility Transistors

2021 ◽  
pp. 108050
Author(s):  
Maria Glória Caño de Andrade ◽  
Luis Felipe de Oliveira Bergamim ◽  
Braz Baptista Júnior ◽  
Carlos Roberto Nogueira ◽  
Fábio Alex da Silva ◽  
...  
Keyword(s):  
Electron Mobility ◽  
Low Frequency ◽  
High Electron Mobility Transistors ◽  
Frequency Noise ◽  
High Electron ◽  
Low Frequency Noise ◽  
High Electron Mobility ◽  
Electron Mobility Transistors
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