scholarly journals Study of nonlinear optical phenomena in silicon nanowires

2021 ◽  
Vol 2086 (1) ◽  
pp. 012023
Author(s):  
V A Mastalieva ◽  
V Neplokh ◽  
A I Morozov ◽  
A A Nikolaeva ◽  
A S Gudovskikh ◽  
...  

Abstract This work studies generation of second and third harmonics in arrays of vertically oriented silicon nanowires (SiNWs) encapsulated into a silicone membrane and separated from the growth substrate. The structures were produced by plasma-chemical etching of silicon substrate resulting in a formation of homogeneous arrays of SiNWs. Such SiNW-based membranes demonstrated efficient infrared-to-visible light conversion by generation of second and third harmonic signals visible by a naked eye. This study contributes to the development of technology of optical devices based on silicon and presents a new route for visualization of infrared radiation.

2021 ◽  
Vol 2103 (1) ◽  
pp. 012119
Author(s):  
V Mastalieva ◽  
A Nikolaeva ◽  
V Neplokh ◽  
D Eurov ◽  
S Makarov ◽  
...  

Abstract Infrared converters to visible range are in demand for creation of optoelectronic devices, infrared visualizers and other non-linear optical devices. In this work we study nonlinear optical properties of monodisperse SiO2 and Si/SiO2 spheres encapsulated into silicone films. The fabricated silicone films containing SiO2 spheres demonstrated a bright third harmonic generation signal, and films with Si/SiO2 spheres demonstrated a significant second harmonic generation signal in the whole visible range. The developed materials and methods provide a platform for future infrared to visible converters based on silicon.


2020 ◽  
Vol 96 (3s) ◽  
pp. 343-346
Author(s):  
А.Н. Алексеев ◽  
С.И. Петров

Представлены результаты разработки базовых технологических процессов, используемых при получении мощных полевых транзисторов и МИС СВЧ-диапазона на основе GaN и GaAs, таких как: выращивание гетероструктур методом МЛЭ, металлизация и отжиг омических контактов, травление мезаизоляции, затворная металлизация, пассивация диэлектриком и др. Обсуждаются основные проблемы и пути их решения, в том числе особенности технологических процессов глубокого плазмохимического травления для формирования сквозных металлизированных отверстий в SiC и GaAs. Отдельное внимание уделено вопросам обеспечения однородности и воспроизводимости и их влиянию на выход годных структур. Продемонстрированы результаты использования ряда технологических процессов в производственном цикле АО «Светлана-Рост» и других предприятий радиоэлектронной промышленности. The paper presents the results of the development of basic technological processes used in the production of microwave high-power field-effect transistors based on GaN and GaAs such as: MBE growth, metallization and annealing of ohmic contacts, etching of mesa insulation, gate metallization, passivation by dielectric etc. The main problems and solutions including features of technological processes of deep plasma-chemical etching in SiC and GaAs have been discussed. Special attention is paid to the issues of uniformity and reproducibility and their impact on the yield of structures. The results of the use of technological processes in the production cycle of Svetlana-Rost JSC and other enterprises of the radio-electronic industry have been demonstrated.


2012 ◽  
Vol 12 (5) ◽  
Author(s):  
Sergey Odinokov ◽  
Gaik Sagatelyan ◽  
Anton Goncharov ◽  
Mikhail Kovalev ◽  
Artem Solomashenko ◽  
...  

Author(s):  
A. N. Kuznetsov ◽  
S. A. Doberstein ◽  
I. V. Veremeev

This paper presents the data for frequency trimming of the single port STW resona-tors in a frequency range of 500–1000 MHz by plasma chemical etching method. The main parameters of resonators after frequency trimming are given: frequency tolerance <±100·10–6, quality factor of 8600–9500, equivalent elements needed for use of the STW resonators.


Author(s):  
Charu Lata Dube ◽  
Subhash C. Kashyap ◽  
D. C. Dube ◽  
D. K. Agarwal

2019 ◽  
Vol 822 ◽  
pp. 594-600
Author(s):  
E.V. Endiiarova ◽  
Singh Ruby

. The calculation of nominal values of the matching device for the modified plasma chemical etching installation "Plasma 600T" was based on the estimated values of the discharge impedance (plasma). It turned out that for optimal performance, one can use a matching device consisting of two capacitors whose capacitances are: С1 [20; 1000] pF, С2 [4; 100] pF, and inductor with inductance 2,5 μH.


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