scholarly journals Combined synchrotron X-ray and image-correlation analyses of biaxially deformed W/Cu nanocomposite thin films on Kapton

2011 ◽  
Vol 44 (5) ◽  
pp. 1071-1079 ◽  
Author(s):  
Soundes Djaziri ◽  
Pierre-Olivier Renault ◽  
François Hild ◽  
Eric Le Bourhis ◽  
Philippe Goudeau ◽  
...  
Keyword(s):  
Thin Films ◽  
Testing Machine ◽  
Tensile Tests ◽  
Image Correlation ◽  
X Ray Diffraction ◽  
Biaxial Testing ◽  
X Ray ◽  
Elastic Domain ◽  
Loading Paths ◽  
Nanocomposite Thin Films

In situbiaxial tensile tests within the elastic domain were conducted with W/Cu nanocomposite thin films deposited on a polyimide cruciform substrate using a biaxial testing machine developed on the DiffAbs beamline at the Synchrotron SOLEIL. The mechanical behaviour of the nanocomposite was characterized at the micro- and macroscales using synchrotron X-ray diffraction and digital image-correlation techniques simultaneously. Strain analyses for equibiaxial and non-equibiaxial loading paths were carried out. The results show that the two strain measurements match to within 1 × 10−4in the elastic domain for strain levels less than 0.3% and for both loading paths.

Fabrication and Characterization of Polyaniline–ZnO Hybrid Nanocomposite Thin Films

2008 ◽  
Vol 8 (4) ◽  
pp. 1757-1761 ◽  
Author(s):  
Ajeet Kaushik ◽  
Jitendra Kumar ◽  
M. K. Tiwari ◽  
R. Khan ◽  
B. D. Malhotra ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Thin Films ◽  
Scanning Electron Microscopy ◽  
Atomic Force Microscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanocomposite Thin Films ◽  
Scanning Electron

Polyaniline (PANI)–ZnO nanocomposite thin film has been successfully fabricated on glass substrates by using vacuum deposition technique. The as-grown PANI–ZnO nanocomposite thin films have been characterized using X-ray diffraction, Scanning Electron Microscopy, Atomic Force Microscopy, UV-visible spectrophotometer and Fourier Transform Infrared (FTIR) spectroscopy, respectively. X-ray diffraction of as-grown film shows the reflection of ZnO nanoparticles along with a broad peak of PANI. The surface morphology of nanocomposite films has been investigated using scanning electron microscopy and atomic force microscopy. The hypsochromic shift of the UV absorption band corresponding to π–π* transition in polymeric chain of PANI and a band at 504 cm –1 due to ZnO nanoparticles has been observed in the FTIR spectra. The hydrogen bonding between the imine group of PANI and ZnO nanoparticle has been confirmed from the presence of the absorbance band at 1151 cm–1 in the FTIR spectra of the nanocomposite thin films.

scholarly journals Study of Elastic Behavior of Metallic Thin Films by 2D Synchrotron XRD and in situ Tensile Testing

2007 ◽  
Vol 1027 ◽  
Author(s):  
Geandier Guillaume ◽  
Renault Pierre-Olivier ◽  
Goudeau Philippe ◽  
Eric Le Bourhis ◽  
Girault Baptiste
Keyword(s):  
Thin Films ◽  
Mechanical Response ◽  
Tensile Tests ◽  
Elastic Behavior ◽  
Metallic Thin Films ◽  
X Ray Diffraction ◽  
Synchrotron Source ◽  
X Ray ◽  
Transmission Geometry

AbstractUnderstanding the mechanical behaviour of nano-structured thin films in relation to their structure, in particular to the grain size, is of high importance for the development of technological applications. Model nanometric multilayer W/Au systems exhibiting different structures are elaborated. These films are supported by a (thin) polyimide substrate. Films mechanical response is characterized experimentally by tensile tests carried out in-situ in a X-ray diffractometer installed on a synchrotron source. X-ray diffraction in transmission geometry has been used to study the deformations of both phases as a function of applied load. This geometry has been developed in the aim of optimizing the experiment time.

Effect of Gamma Radiation on ZnO Doped PVA Nanocomposite Thin Films for Escherichia coli Sensor

2015 ◽  
Vol 1107 ◽  
pp. 687-692 ◽  
Author(s):  
Noor Azwen Noor Azmy ◽  
Huda Abdullah ◽  
Norshafadzila Mohammad Naim ◽  
Aidil Abdul Hamid ◽  
Sahbudin Shaari ◽  
...  
Keyword(s):  
Thin Films ◽  
Escherichia Coli ◽  
Atomic Force Microscopy ◽  
Gamma Radiation ◽  
X Ray Diffraction ◽  
X Ray ◽  
Force Microscopy ◽  
Atomic Force ◽  
Current Voltage ◽  
Nanocomposite Thin Films

The effect of gamma radiation on fabricated ZnO doped PVA nanocomposite thin films for determination of Escherichia coli has been investigated. Thin films of ZnO doped PVA were exposed to 60Co γ-radiation source at difference dose rate, ranging from 0 to 30 kGy at room temperature. The structural, morphological and electrical properties of the sample were investigated using X-ray diffraction (XRD), Atomic force microscopy (AFM) and Current-voltage (I-V) measurement. The X-ray diffraction (XRD) spectra have been performed to see the formation of crystal phases of all pure ZnO thin films. The diffraction patterns reveal the good crystalline quality and indicate the crystallization of the ZnO-PVA films strongly depends on radiation dose. The roughness of the thin film surface which can be seen by conducting Atomic force microscopy (AFM) measurement became smoother as the gamma radiation increased. The presence of Escherichia coli as a bacterial contamination in water was identified by measuring the changes of conductivity of thin films using current–voltage (I-V) measurement. The sensitivity of the sensors has been observed to be higher at a higher radiation dose.

Crack Propagating and Stress-Promoted the Precipitate of Ni3Ti in NiTi Thin Films

2009 ◽  
Vol 417-418 ◽  
pp. 657-660 ◽  
Author(s):  
Yong Hua Li ◽  
F.L. Meng ◽  
Wei Tao Zheng ◽  
Y.M. Wang
Keyword(s):  
Thin Films ◽  
Parent Phase ◽  
Testing Machine ◽  
Strain Curve ◽  
Tensile Tests ◽  
X Ray Diffraction ◽  
Stress Strain Curve ◽  
Parallel Cracks ◽  
Peak Intensity ◽  
Two Stages

This study investigated the stress-induced crack propagation and precipitation in Ti-51.45at.%Ni thin films. Tensile tests were carried out on CSS-44100 electron universal testing machine. The strain rate was 1.1×10-4 s-1. The surface micrographs of the NiTi thin film were obtained using scanning electron microscopy (SEM). The precipitates were determined by X-ray diffraction (XRD) experiments (D8 GADDS). The results showed that a series of parallel cracks grew in the film and the cracks were equally spaced. The fracture toughness of the film was estimated, =0.96MPa∙m1/2. The minimum crack spacing was about . The stress-strain curve can be divided into two stages. The first linear stage corresponded to the elastic deformation of the parent phase. In the following stage, the serrations were considered to be the stress relaxation due to the cracks propagating and the precipitate grain transformation. During tension the (102) peak intensity of Ni3Ti phase increased with elongation increased. The precipitate orientation was same.

scholarly journals Optical properties for TiO2 / PMMA nanocomposite thin films prepared by plasma jet

2018 ◽  
Vol 15 (35) ◽  
pp. 24-28
Author(s):  
Saba J. Kadhem
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Titanium Oxide ◽  
Absorption Spectra ◽  
Plasma Jet ◽  
X Ray Diffraction ◽  
Visible Absorption ◽  
X Ray ◽  
Nanocomposite Thin Films ◽  
Uv Visible

PMMA/TiO2 homogeneous thin films were deposited by using plasma jet system under normal atmospheric pressure and room temperature. PMMA/TiO2 nanocomposite thin film synthesized by plasma polymerization. Titanium oxide was mixed with Methyl Methacrylate Monomer (MMA) with specific weight ratios (1, 3 and 5 grams of TiO2 per 100 ml of MMA). Optical properties of PMMA/TiO2 nanocomposite thin films were characterized by UV-Visible absorption spectra using a double beam UV-Vis-NIR Spectrophotometer. The thin films surface morphological analysis is carried out by employing SEM. The structure analysis are achieved by X-ray diffraction. UV-Visible absorption spectra shows that the increasing the concentration of titanium oxide added to the polymer leads to shift the peak position (λmax) toward the infrared region of the electromagnetic spectrum. Also the peak width increases when the concentration of TiO2 increases. It can be controlled optical energy band gap of PMMA/TiO2 nanocomposite thin films by changing concentration of TiO2. SEM indicate a uniform distribution of titanium oxide particles in PMMA matrix. The x-ray diffraction pattern indicated that the thin films have amorphous structure.

Multilayer Synthesized CuInSi Composite Film by Magnetron Sputtering

2011 ◽  
Vol 383-390 ◽  
pp. 2770-2773
Author(s):  
Jian Sheng Xie ◽  
Ping Luan ◽  
Jin Hua Li
Keyword(s):  
Thin Films ◽  
Magnetron Sputtering ◽  
Composite Film ◽  
Film Surface ◽  
Nanocomposite Films ◽  
Crystal Phase ◽  
X Ray Diffraction ◽  
Sem Images ◽  
X Ray ◽  
Nanocomposite Thin Films

Using magnetron sputtering technology, the CuInSi nanocomposite thin films were prepared by multilayer synthesized method. The structure of CuInSi nanocomposite films was detected by X-ray diffraction (XRD), the peak of main crystal phase is at 2θ=42.180°; the morphology of the film surface was studied by SEM. The SEM images show that the crystalline of the film prepared by multilayer synthesized method was granulated, differed from the needle shape which was the morphology of the CuInSi film prepared by magnetron co-sputtering.

TEM studies of solid-state reactions in sputter-deposited Nb/Al multilayer thin films

1996 ◽  
Vol 54 ◽  
pp. 1020-1021
Author(s):  
F. Ma ◽  
S. Vivekanand ◽  
K. Barmak ◽  
C. Michaelsen
Keyword(s):  
Thin Films ◽  
Solid State ◽  
Stoichiometric Composition ◽  
Analytical Electron Microscopy ◽  
Grain Structure ◽  
Solid State Reactions ◽  
Multilayer Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Sputter Deposited

Solid state reactions in sputter-deposited Nb/Al multilayer thin films have been studied by transmission and analytical electron microscopy (TEM/AEM), differential scanning calorimetry (DSC) and X-ray diffraction (XRD). The Nb/Al multilayer thin films for TEM studies were sputter-deposited on (1102)sapphire substrates. The periodicity of the films is in the range 10-500 nm. The overall composition of the films are 1/3, 2/1, and 3/1 Nb/Al, corresponding to the stoichiometric composition of the three intermetallic phases in this system.Figure 1 is a TEM micrograph of an as-deposited film with periodicity A = dA1 + dNb = 72 nm, where d's are layer thicknesses. The polycrystalline nature of the Al and Nb layers with their columnar grain structure is evident in the figure. Both Nb and Al layers exhibit crystallographic texture, with the electron diffraction pattern for this film showing stronger diffraction spots in the direction normal to the multilayer. The X-ray diffraction patterns of all films are dominated by the Al(l 11) and Nb(l 10) peaks and show a merging of these two peaks with decreasing periodicity.

Palladium Nanowire Thin Films via Template Growth

2003 ◽  
Vol 775 ◽  
Author(s):  
Donghai Wang ◽  
David T. Johnson ◽  
Byron F. McCaughey ◽  
J. Eric Hampsey ◽  
Jibao He ◽  
...  
Keyword(s):  
Thin Film ◽  
Electron Microscopy ◽  
Thin Films ◽  
X Ray Diffraction ◽  
X Ray ◽  
Transmission Electron ◽  
Conductive Substrate ◽  
Palladium Nanowires ◽  
Efficient Route ◽  
Silica Thin Film

AbstractPalladium nanowires have been electrodeposited into mesoporous silica thin film templates. Palladium continually grows and fills silica mesopores starting from a bottom conductive substrate, providing a ready and efficient route to fabricate a macroscopic palladium nanowire thin films for potentially use in fuel cells, electrodes, sensors, and other applications. X-ray diffraction (XRD) and transmission electron microscopy (TEM) indicate it is possible to create different nanowire morphology such as bundles and swirling mesostructure based on the template pore structure.

Structural and optical properties of Tin Oxide and Indium doped SnO2 thin films deposited by thermal evaporation technique

2016 ◽  
Vol 12 (3) ◽  
pp. 4394-4399
Author(s):  
Sura Ali Noaman ◽  
Rashid Owaid Kadhim ◽  
Saleem Azara Hussain
Keyword(s):  
Thin Films ◽  
Optical Properties ◽  
Tin Oxide ◽  
Thermal Evaporation ◽  
Pure Sno2 ◽  
X Ray Diffraction ◽  
Structural And Optical Properties ◽  
X Ray ◽  
Evaporation Technique ◽  
Sno2 Thin Films

Tin Oxide and Indium doped Tin Oxide (SnO2:In) thin films were deposited on glass and Silicon  substrates  by  thermal evaporation technique.  X-ray diffraction pattern of  pure SnO2 and SnO2:In thin films annealed at 650oC and the results showed  that the structure have tetragonal phase with preferred orientation in (110) plane. AFM studies showed an inhibition of grain growth with increase in indium concentration. SEM studies of pure  SnO2 and  Indium doped tin oxide (SnO2:In) ) thin films showed that the films with regular distribution of particles and they have spherical shape.  Optical properties such as  Transmission , optical band-gap have been measured and calculated.

X- ray diffraction and dielectric properties of PbSe thin films

2019 ◽  
Vol 15 (34) ◽  
pp. 1-14
Author(s):  
Bushra A. Hasan
Keyword(s):  
Thin Films ◽  
Thermal Activation ◽  
Thermal Evaporation ◽  
Thermal Activation Energy ◽  
Dielectric Constants ◽  
Conductivity Measurements ◽  
X Ray Diffraction ◽  
Thermal Evaporation Method ◽  
X Ray ◽  
Glass Substrates

Lead selenide PbSe thin films of different thicknesses (300, 500, and 700 nm) were deposited under vacuum using thermal evaporation method on glass substrates. X-ray diffraction measurements showed that increasing of thickness lead to well crystallize the prepared samples, such that the crystallite size increases while the dislocation density decreases with thickness increasing. A.C conductivity, dielectric constants, and loss tangent are studied as function to thickness, frequency (10kHz-10MHz) and temperatures (293K-493K). The conductivity measurements confirm confirmed that hopping is the mechanism responsible for the conduction process. Increasing of thickness decreases the thermal activation energy estimated from Arhinus equation is found to decrease with thickness increasing. The increase of thickness lead to reduce the polarizability α while the increasing of temperature lead to increase α.

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