Mechanical reliability of self-aligned chip assembly after reflow soldering process

2020 ◽  
Vol 33 (1) ◽  
pp. 9-17
Author(s):  
Mohd Najib Ali Mokhtar ◽  
M.Z. Abdullah ◽  
Abdullah Aziz Saad ◽  
Fakhrozi Cheani

Purpose This paper focuses on the reliability of the solder joint after the self-alignment phenomenon during reflow soldering. The aim of this study is to analyse the joint quality of the self-alignment assemblies of SnAg alloy solder joints with varying silver content. Design/methodology/approach The shear strength assessment was conducted in accordance with the JIS Z3 198-7 standard. The standard visual inspection of IPC-A-610G was also performed to inspect the self-alignment features of the solder joint samples. Statistical analysis was conducted to determine the probabilistic relationship of shear strength of the misalignment components. Findings The results from the mechanical reliability study indicate that there were decreasing trends in the shear strength value as misalignment offset increased. For shift mode configuration in the range of 0-300 µm, the resulting chip assembly inspection after the reflow process was in line with the IPC-A-610G standard. The statistical analysis shows that the solder type variation was insignificant to the shear strength of the chip resistor. The study concluded that the fracture occurred partially in the termination metallization at the lower part of the chip resistor. The copper content of the joint on that area shows that the crack occurred in the solder joint, and high silver content on the selected zone indicated that the fracture happened partially in the termination structure, as the termination structure of the lead-free chip resistor consists of an inner layer of silver and an outer layer of tin. Practical implications This study’s findings provide valuable guidelines and references to engineers and integrated circuit designers during the reflow soldering process in the microelectronics industry. Originality/value Studies on the effect of component misalignment on joint mechanical reliability are still limited, and studies on solder joint reliability involving the effect of differing contents of silver on varying chip component offset are rarely reported. Thus, this study is important to effectively bridge the research gap and yield appropriate guidelines in the potential industry.

2016 ◽  
Vol 28 (3) ◽  
pp. 141-148
Author(s):  
Hardinnawirda Kahar ◽  
Zetty Akhtar Abd Malek ◽  
Siti Rabiatull Aisha Idris ◽  
Mahadzir Ishak

Purpose This paper aims to study the effect of aging and cooling rate on the reliability of the solder joint using electroless nickel boron (EN-Boron) as a surface finish in the electronic packaging area. Design/methodology/approach EN-Boron was plated on a Cu substrate through electroless plating method. This process was followed by reflow soldering of Sn–3.0Ag–0.5Cu solder alloy on metallized Cu substrate to form a joining. Then, the specimens were cooled using different cooling mediums such as air (slow cooling) with 15.7 °C/min and water (fast cooling) with 110.5 °C/min. After that, the specimens were subjected to isothermal aging at 150°C for 0, 250 and 1,000 h. Finally, they went through a lap shear test following ASTM D1002. Optical microscope and scanning electron microscopy were used for intermetallic compound (IMC) characterization. The type of IMC formed was confirmed by field emission scanning electron microscope-energy-dispersive X-ray spectroscopy (FESEM-EDX). Findings The results showed that the IMC type changed from the combination of Ni3Sn4 and (Ni, Cu)3Sn4 after reflow soldering into fully (Ni, Cu)3Sn4 when aged for 1,000 h. The formation of (Ni, Cu)3Sn4 and Cu3Sn underneath the IMC layer played a role in reducing the shear strength of joining. Overall, water cooling was reported to provide higher shear strength of solder joint compared to air cooling medium. Originality/value The shear strength when using EN-Boron as the surface finish is comparable to the surface finish conventionally used.


2015 ◽  
Vol 27 (1) ◽  
pp. 52-58 ◽  
Author(s):  
Peter K. Bernasko ◽  
Sabuj Mallik ◽  
G. Takyi

Purpose – The purpose of this paper is to study the effect of intermetallic compound (IMC) layer thickness on the shear strength of surface-mount component 1206 chip resistor solder joints. Design/methodology/approach – To evaluate the shear strength and IMC thickness of the 1206 chip resistor solder joints, the test vehicles were conventionally reflowed for 480 seconds at a peak temperature of 240°C at different isothermal ageing times of 100, 200 and 300 hours. A cross-sectional study was conducted on the reflowed and aged 1206 chip resistor solder joints. The shear strength of the solder joints aged at 100, 200 and 300 hours was measured using a shear tester (Dage-4000PXY bond tester). Findings – It was found that the growth of IMC layer thickness increases as the ageing time increases at a constant temperature of 175°C, which resulted in a reduction of solder joint strength due to its brittle nature. It was also found that the shear strength of the reflowed 1206 chip resistor solder joint was higher than the aged joints. Moreover, it was revealed that the shear strength of the 1206 resistor solder joints aged at 100, 200 and 300 hours was influenced by the ageing reaction times. The results also indicate that an increase in ageing time and temperature does not have much influence on the formation and growth of Kirkendall voids. Research limitations/implications – A proper correlation between shear strength and fracture mode is required. Practical implications – The IMC thickness can be used to predict the shear strength of the component/printed circuit board pad solder joint. Originality/value – The shear strength of the 1206 chip resistor solder joint is a function of ageing time and temperature (°C). Therefore, it is vital to consider the shear strength of the surface-mount chip component in high-temperature electronics.


2021 ◽  
Vol ahead-of-print (ahead-of-print) ◽  
Author(s):  
Elwin Heng ◽  
Mohd Zulkifly Abdullah

Purpose This paper focuses on the fluid-structure interaction (FSI) analysis of moisture induced stress for the flip chip ball grid array (FCBGA) package with hydrophobic and hydrophilic materials during the reflow soldering process. The purpose of this paper is to analyze the influence of moisture concentration and FCBGA with hydrophobic material on induced pressure and stress in the package at varies times. Design/methodology/approach The present study analyzed the warpage deformation during the reflow process via visual inspection machine (complied to Joint Electron Device Engineering Council standard) and FSI simulation by using ANSYS/FLUENT package. The direct concentration approach is used to model moisture diffusion and ANSYS is used to predict the Von-Misses stress. Models of Test Vehicle 1 (similar to Xie et al., 2009b) and Test Vehicle 2 (FCBGA package) with the combination of hydrophobic and hydrophilic materials are performed. The simulation for different moisture concentrations with reflows process time has been conducted. Findings The results from the mechanical reliability study indicate that the FSI analysis is found to be in good agreement with the published study and acceptable agreement with the experimental result. The maximum Von-Misses stress induced by the moisture significantly increased on FCBGA with hydrophobic material compared to FCBGA with a hydrophilic material. The presence of hydrophobic material that hinders the moisture desorption process. The analysis also illustrated the moisture could very possibly reside in electronic packaging and developed beyond saturated vapor into superheated vapor or compressed liquid, which exposed electronic packaging to higher stresses. Practical implications The findings provide valuable guidelines and references to engineers and packaging designers during the reflow soldering process in the microelectronics industry. Originality/value Studies on the influence of moisture concentration and hydrophobic material are still limited and studies on FCBGA package warpage under reflow process involving the effect of hydrophobic and hydrophilic materials are rarely reported. Thus, this study is important to effectively bridge the research gap and yield appropriate guidelines in the microelectronics industry.


2016 ◽  
Vol 28 (2) ◽  
pp. 41-62 ◽  
Author(s):  
Chun Sean Lau ◽  
C.Y. Khor ◽  
D. Soares ◽  
J.C. Teixeira ◽  
M.Z. Abdullah

Purpose The purpose of the present study was to review the thermo-mechanical challenges of reflowed lead-free solder joints in surface mount components (SMCs). The topics of the review include challenges in modelling of the reflow soldering process, optimization and the future challenges in the reflow soldering process. Besides, the numerical approach of lead-free solder reliability is also discussed. Design/methodology/approach Lead-free reflow soldering is one of the most significant processes in the development of surface mount technology, especially toward the miniaturization of the advanced SMCs package. The challenges lead to more complex thermal responses when the PCB assembly passes through the reflow oven. The virtual modelling tools facilitate the modelling and simulation of the lead-free reflow process, which provide more data and clear visualization on the particular process. Findings With the growing trend of computer power and software capability, the multidisciplinary simulation, such as the temperature and thermal stress of lead-free SMCs, under the influenced of a specific process atmosphere can be provided. A simulation modelling technique for the thermal response and flow field prediction of a reflow process is cost-effective and has greatly helped the engineer to eliminate guesswork. Besides, simulated-based optimization methods of the reflow process have gained popularity because of them being economical and have reduced time-consumption, and these provide more information compared to the experimental hardware. The advantages and disadvantages of the simulation modelling in the reflow soldering process are also briefly discussed. Practical implications This literature review provides the engineers and researchers with a profound understanding of the thermo-mechanical challenges of reflowed lead-free solder joints in SMCs and the challenges of simulation modelling in the reflow process. Originality/value The unique challenges in solder joint reliability, and direction of future research in reflow process were identified to clarify the solutions to solve lead-free reliability issues in the electronics manufacturing industry.


Circuit World ◽  
2018 ◽  
Vol 44 (1) ◽  
pp. 37-44 ◽  
Author(s):  
Petr Veselý ◽  
Eva Horynová ◽  
Jiří Starý ◽  
David Bušek ◽  
Karel Dušek ◽  
...  

Purpose The purpose of this paper is to increase the reliability of manufactured electronics and to reveal reliability significant factors. The experiments were focused especially on the influence of the reflow oven parameters presented by a heating factor. Design/methodology/approach The shear strength of the surface mount device (SMD) resistors and their joint resistance were analyzed. The resistors were assembled with two Sn/Ag/Cu-based and one Bi-based solder pastes, and the analysis was done for several values of the heating factor and before and after isothermal aging. The measurement of thickness of intermetallic compounds was conducted on the micro-sections of the solder joints. Findings The shear strength of solder joints based on the Sn/Ag/Cu-based solder alloy started to decline after the heating factor reached the value of 500 s · K, whereas the shear strength of the solder alloy based on the Bi alloy (in the measured range) always increased with an increase in the heating factor. Also, the Bi-based solder joints showed shear strength increase after isothermal aging in contrast to Sn/Ag/Cu-based solder joints, which showed shear strength decrease. Originality/value The interpretation of the results of such a comprehensive measurement leads to a better understanding of the mutual relation between reliability and other technological parameters such as solder alloy type, surface finish and parameters of the soldering process.


2021 ◽  
Vol ahead-of-print (ahead-of-print) ◽  
Author(s):  
Guisheng Gan ◽  
Donghua Yang ◽  
Yi-ping Wu ◽  
Xin Liu ◽  
Pengfei Sun ◽  
...  

Purpose The impact strength of solder joint under high strain rate was evaluated by board level test method. However, the impact shear test of single solder bump was more convenient and economical than the board level test method. With the miniaturization of solder joints, solder joints were more prone to failure under thermal shock and more attention has been paid to the impact reliability of solder joint. But Pb-free solder joints may be paid too much attention and Sn-Pb solder joints may be ignored. Design/methodology/approach In this study, thermal shock test between −55°C and 125°C was conducted on Sn-37Pb solder bumps in the BGA package to investigate microstructural evolution and growth mechanism of interfacial intermetallic compounds (IMCs) layer. The effects of thermal shock and ball diameter on the mechanical property and fracture behavior of Sn-37Pb solder bumps were discussed. Findings With the increase of ball size, the same change tendency of shear strength with thermal shock cycles. The shear strength of the solder bumps was the highest after reflow; with the increase of the number of thermal shocks, the shear strength of the solder bumps was decreased. But at the time of 2,000 cycles, the shear strength was increased to the initial strength. Minimum shear strength almost took place at 1,500 cycles in all solder bumps. The differences between maximum shear strength and minimum shear strength were 9.11 MPa and 16.83 MPa, 17.07 MPa and 15.59 MPa in φ0.3 mm and φ0.4 mm, φ0.5 mm and φ0.6 mm, respectively, differences were increased with increasing of ball size. With similar reflow profile, the thickness of IMC decreased as the diameter of the ball increased. The thickness of IMC was 2.42 µm and 2.17 µm, 1.63 µm and 1.77 µm with increasing of the ball size, respectively. Originality/value Pb-free solder was gradually used to replace traditional Sn-Pb solder and has been widely used in industry. Nevertheless, some products inevitably used a mixture of Sn-Pb and Pb-free solder to make the transition from Sn-Pb to Pb-free solder. Therefore, it was very important to understand the reliability of Sn-Pb solder joint and more further research works were also needed.


2021 ◽  
Vol ahead-of-print (ahead-of-print) ◽  
Author(s):  
Fuminobu Ozaki ◽  
Ying Liu ◽  
Kai Ye

PurposeThe purpose of this study is to clarify both tensile and shear strength for self-drilling screws, which are manufactured from high-strength, martensitic-stainless and austenitic stainless-steel bars, and the load-bearing capacity of single overlapped screwed connections using steel sheets and self-drilling screws at elevated temperatures.Design/methodology/approachTensile/shear loading tests for the self-drilling screw were conducted to obtain basic information on the tensile and shear strengths at elevated temperatures and examine the relationships between both. Shear loading tests for the screwed connections at elevated temperatures were conducted to examine the shear strength and transition of failure modes depending on the test temperature.FindingsThe tensile and shear strengths as well as the reduction factors at the elevated temperature for each steel grade of the self-drilling screw were quantified. Furthermore, either screw shear or sheet bearing failure mode depending on the test temperature was observed for the screwed connection.Originality/valueThe transition of the failure modes for the screwed connection could be explained using the calculation formulae for the shear strengths at elevated temperatures, which were proposed in this study.


2019 ◽  
Vol 31 (3) ◽  
pp. 146-156 ◽  
Author(s):  
Balázs Illés ◽  
Attila Géczy ◽  
Bálint Medgyes ◽  
Gábor Harsányi

Purpose This paper aims to present a review of the recent developments in vapour phase soldering (VPS) technology. This study focuses on the following topics: recent developments of the technology, i.e. soft and vacuum VPS; measurement and characterization methods of vapour space, i.e. temperature and pressure; numerical simulation of the VPS soldering process, i.e. condensate layer and solder joint formation; and quality and reliability studies of the solder joints prepared by VPS, i.e. void content and microstructure of the solder joints. Design/methodology/approach This study was written according to the results of a wide literature review about the substantial previous works in the past decade and according to the authors’ own results. Findings Up to now, a part of the electronics industry believes that the reflow soldering with VPS method is a significant alternative of convection and infrared technologies. The summarized results of the field in this study support this idea. Research limitations/implications This literature review provides engineers and researchers with understanding of the limitations and application possibilities of the VPS technology and the current challenges in soldering technology. Originality/value This paper summarizes the most important advantages and disadvantages of VPS technology compared to the other reflow soldering methods, as well as points out the necessary further developments and possible research directions.


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