A Novel Algorithm of Target Pseudo-Color Fusion Based on Image Features

2008 ◽  
Author(s):  
Qingwang Qin ◽  
Tingfa Xu ◽  
Manjun Xiao ◽  
Guoqiang Ni
Keyword(s):  
Image Features ◽  
Color Fusion ◽  
Pseudo Color ◽  
Novel Algorithm

An Image Fusion Algorithm Based on Pseudo-Color

2012 ◽  
Vol 433-440 ◽  
pp. 5436-5442
Author(s):  
Lei Li
Keyword(s):  
Image Fusion ◽  
Color Image ◽  
Target Identification ◽  
Fusion Image ◽  
Fusion Algorithm ◽  
Color Processing ◽  
False Color ◽  
Fused Image ◽  
Color Fusion ◽  
Pseudo Color

The pseudo-color processing for target identification and tracking is very meaningful Experimental results show that the pseudo-color image fusion is a very effective methods. This paper presents a false color image fusion based on the new method. Fusion using wavelet transform grayscale images, find the gray fused image and the difference between the original image, respectively, as the image of l, α, β components are color fusion image, and then after the color transformation, the final false color fused image. The results showed that the color fusion image colors more vivid, more in line with human visual characteristics.

Target Recognition Using Infrared Polarization Imaging System

2011 ◽  
Vol 135-136 ◽  
pp. 983-988
Author(s):  
Na Ding ◽  
Jiao Bo Gao ◽  
Jun Wang
Keyword(s):  
Imaging System ◽  
Target Recognition ◽  
Analysis Data ◽  
Stokes Parameters ◽  
Ir Detector ◽  
Polarization Imaging ◽  
Image Acquisition System ◽  
Color Fusion ◽  
Images Processing ◽  
Pseudo Color

In this paper, we developed an infrared polarization imaging system. The system is composed of imaging lens, IR polarizing filter, medium wave IR detector, and image acquisition system. The design scheme of implementing target recognition with IR polarization imaging system was presented, and the IR Images with polarization information have been acquired by this system. On the basis of Stokes parameters and polarization IR images processing, the images of linear Stokes parameters (I, Q, U), the image of degree of linear polarization (P image) and the image of angle of polarization (X image) could been obtained. The image of PUX fusion image could be achieved by the pseudo color fusion. The results of actual experiment and quantitative analysis data confirm that the target in the processed images obtained from IR polarization imaging system is much clear than that in the original IR image.

7-beam lattice images of (110) oriented Ge

1978 ◽  
Vol 36 (1) ◽  
pp. 290-291
Author(s):  
J.R. Parsons ◽  
C.W. Hoelke
Keyword(s):  
Image Features ◽  
Objective Lens ◽  
Lattice Plane ◽  
Lattice Image ◽  
Crystalline Defects ◽  
Transmission Electron ◽  
Lattice Images ◽  
Electron Microscopes ◽  
Structural Aspects ◽  
Beam Lattice

The direct imaging of a crystal lattice has intrigued electron microscopists for many years. What is of interest, of course, is the way in which defects perturb their atomic regularity. There are problems, however, when one wishes to relate aperiodic image features to structural aspects of crystalline defects. If the defect is inclined to the foil plane and if, as is the case with present 100 kV transmission electron microscopes, the objective lens is not perfect, then terminating fringes and fringe bending seen in the image cannot be related in a simple way to lattice plane geometry in the specimen (1).The purpose of the present work was to devise an experimental test which could be used to confirm, or not, the existence of a one-to-one correspondence between lattice image and specimen structure over the desired range of specimen spacings. Through a study of computed images the following test emerged.

High-resolution electron microscopy of the atomic structure of some grain boundaries in Au

1986 ◽  
Vol 44 ◽  
pp. 414-415
Author(s):  
W. Krakow ◽  
D. A. Smith
Keyword(s):  
Atomic Structure ◽  
High Resolution Electron Microscopy ◽  
Image Features ◽  
Image Feature ◽  
Resolution Electron ◽  
Tilt Boundaries ◽  
Processing Techniques ◽  
Atom Position ◽  
Structure Configuration

The successful determination of the atomic structure of [110] tilt boundaries in Au stems from the investigation of microscope performance at intermediate accelerating voltages (200 and 400kV) as well as a detailed understanding of how grain boundary image features depend on dynamical diffraction processes variation with specimen and beam orientations. This success is also facilitated by improving image quality by digital image processing techniques to the point where a structure image is obtained and each atom position is represented by a resolved image feature. Figure 1 shows an example of a low angle (∼10°) Σ = 129/[110] tilt boundary in a ∼250Å Au film, taken under tilted beam brightfield imaging conditions, to illustrate the steps necessary to obtain the atomic structure configuration from the image. The original image of Fig. 1a shows the regular arrangement of strain-field images associated with the cores of ½ [10] primary dislocations which are separated by ∼15Å.

Imaging of polymer single crystals in low-voltage, high-resolution scanning electron microscopy

1990 ◽  
Vol 48 (4) ◽  
pp. 1106-1107
Author(s):  
W.W. Adams ◽  
G. Price ◽  
A. Krause
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
High Resolution ◽  
Single Crystals ◽  
Low Voltage ◽  
Polymer Surface ◽  
Beam Current ◽  
Image Features ◽  
First Results ◽  
Scanning Electron

It has been shown that there are numerous advantages in imaging both coated and uncoated polymers in scanning electron microscopy (SEM) at low voltages (LV) from 0.5 to 2.0 keV compared to imaging at conventional voltages of 10 to 20 keV. The disadvantages of LVSEM of degraded resolution and decreased beam current have been overcome with the new generation of field emission gun SEMs. In imaging metal coated polymers in LVSEM beam damage is reduced, contrast is improved, and charging from irregularly shaped features (which may be unevenly coated) is reduced or eliminated. Imaging uncoated polymers in LVSEM allows direct observation of the surface with little or no charging and with no alterations of surface features from the metal coating process required for higher voltage imaging. This is particularly important for high resolution (HR) studies of polymers where it is desired to image features 1 to 10 nm in size. Metal sputter coating techniques produce a 10 - 20 nm film that has its own texture which can obscure topographical features of the original polymer surface. In examining thin, uncoated insulating samples on a conducting substrate at low voltages the effect of sample-beam interactions on image formation and resolution will differ significantly from the effect at higher accelerating voltages. We discuss here sample-beam interactions in single crystals on conducting substrates at low voltages and also present the first results on HRSEM of single crystal morphologies which show some of these effects.

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