scholarly journals Stress-induced failure modes in high-tuning range RF MEMS varactors

Author(s):  
T. Chokshi ◽  
D. Peroulis
Keyword(s):  

PIERS Online ◽  
2008 ◽  
Vol 4 (4) ◽  
pp. 433-436 ◽  
Author(s):  
Yaping Liang ◽  
Calvin W. Domier ◽  
Neville C. Luhmann, Jr.


2019 ◽  
Vol 9 (9) ◽  
pp. 1838 ◽  
Author(s):  
Abbas El Mostrah ◽  
Andrei Muller ◽  
Jean-François Favennec ◽  
Benjamin Potelon ◽  
Alexandre Manchec ◽  
...  

This paper presents a digitally tunable SIW (substrate integrated waveguide) filter designed for X-band, based on RF-MEMS (radio frequency micro-electrical-mechanical systems) technology. Four commercial off-the-shelf RF-MEMS single-pole single-throw (SPST) switches were directly mounted on the upper surface of the filter, with metallic tuning posts specifically located within each cavity to define the potential achievable frequency range. Fabricated on standard alumina substrate, the design of the filter and the biasing network enabled fine digital frequency control of up to four functional states by the inclusion of wire bondings between each switch and the substrate. A relative tuning range of 2.3% was achieved between the lower and upper discrete states of 2.76% and 2.89% in the 3 dB fractional bandwidths.



Author(s):  
Ibrahim Chamseddine ◽  
Hadi Kasab ◽  
Maya Antoun ◽  
Tawfiq Dahdah ◽  
Mohammed Mirhi ◽  
...  

A MEMS RF switch is expected to undergo 10 billion switching cycles before failure. Until complete physical explanation for these failure modes that include contact adhesion, damping effects, stiction, increases in resistance with time, dielectric breakdown, and electron trapping is fully established, the technology’s numerous advantages cannot be harvested reliably and efficiently. This paper investigates prospective solutions to problems in switch designs by proposing a new design for the switch. We consider the new design from different perspectives: dynamic, electric, fluidic, etc. It is billed to overcome the difficulties and involves the implementation of liquid metal contact electrostatically actuated to ensure the same switching performance, with prolonged life span, and robust switching speed.



Author(s):  
Lei L. Mercado ◽  
Shun-Meen Kuo ◽  
Tien-Yu Tom Lee ◽  
Russ Lee

RF MEMS switches offer significant performance advantages in high frequency RF applications. The switches are actuated by electrostatic force when voltage was applied to the electrodes. Such devices provide high isolation when open and low contact resistance when closed. However, during the packaging process, there are various possible failure modes that may affect the switch yield and performance. The RF MEMS switches were first placed in a package and went through lid seal at 320°C. The assembled packages were then attached to a printed circuit board at 220°C. During the process, some switches failed due to electrical shorting. More interestingly, more failures were observed at the lower temperature of 220°C rather than 320°C. The failure mode was associated with the shorting bar and the cantilever design. Finite element simulations and simplified analytical solutions were used to understand the mechanics driving the behaviors. Simulation results have shown excellent agreement with experimental observations and measurements. Various solutions in package configurations were explored to overcome the hurdles in MEMS packaging and achieve better yield and performance.



Author(s):  
Chris Brown ◽  
Jacqueline Krim ◽  
Art Morris

RF MEMS switch lifetimes are limited by stiction of the moving components and degradation of the metal to metal contact points during cycling. Currently, maximum switch lifetimes are around 10 to 25 billion cycles. Past experimentation has shown that some stiction problems can be overcome by carefully controlling the operating parameters, but problems at the contact points remain [1]. It is believed that by developing a set of tribological design rules which limit the factors leading to catastrophic failure, switches can operate in excess of 100 billion cycles. Recent research has quantified the reliability and durability of gold contact points on RF MEMS switches as a function of current [2]. Most experimentation on RF MEMS switches has focused on controlling the operating parameters such as current, voltage, electrode materials, contact area, switching mode and force; however, limited work has been performed on a single device type in multiple environmentally controlled testing conditions such as vacuum, cryogenic temperatures, etc. This presentation will discuss performance of the wiSpry RF MEMS switch focusing on quantification of device reliability and failure mechanisms under various atmospheric and temperature conditions. Environmental testing conditions include switching in open air, vacuum and inert gasses, in temperatures ranging from 294 K to 4 K.



Author(s):  
Alessandro Cazzorla ◽  
Roberto Sorrentino ◽  
Paola Farinelli
Keyword(s):  




Author(s):  
Qing Rao ◽  
Jun Yao ◽  
Li Zhang ◽  
Dajia Wang ◽  
Mohua Yang

A novel electrostatic RF MEMS variable capacitor consisting of a suspended top plate and two fixed bottom electrodes is presented. The fixed bottom electrodes are constructed by an inner fixed plate and an outer fixed plate. The inner fixed bottom plate is designed to provide electrostatic actuation for capacitance tuning and the outer one is coupled with the top plate to form a variable capacitor. The mechanical suspension of the top plate is served by four L-shaped cantilever beams, the spring constant of which has been analyzed. The characteristics of the proposed device have been analyzed through FEA software IntelliSuite and HFSS, and an extended tuning range of 78.9% is obtained. The achievable pull-in voltage is 20.2V. This capacitor operates over a wide frequency range from 1GHz to 20GHz with the return loss lower than 0.16 dB. Its quality factor is 119 at 5GHz when the applied voltage is zero.



2012 ◽  
Vol 48 (17) ◽  
pp. 1065-1067 ◽  
Author(s):  
I. Llamas-Garro ◽  
S. Colpo ◽  
L. Pradell ◽  
F. Giacomozzi ◽  
Z. Brito-Brito


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