Growth and shear strength of intermetallic compounds in Sn-Ag-Cu solder joints

Author(s):  
Jiandong Zhu ◽  
Chunqing Wang ◽  
Chunjin Hang ◽  
Yanhong Tian
2020 ◽  
Vol 982 ◽  
pp. 115-120
Author(s):  
Phairote Sungkhaphaitoon ◽  
Tanyaporn Suwansukho

The effects of bismuth content on the microstructure, shear strength and thermal properties of Sn-0.7Cu-0.05Ni solder joints were investigated. Adding 2 wt% elemental Bi to Sn-0.7Cu-0.05Ni solder joints reduced peak temperature by about 6.7 °C, increased pasty range by 4.2 °C and raised undercooling by 3.1 °C. The microstructure of the interfacial layer between solder and Cu substrate was composed of (Cu,Ni)6Sn5 and (Cu,Ni)3Sn intermetallic compounds (IMCs). The solder joint included a phase of SnBi and Cu6Sn5 IMCs. The addition of elemental Bi increased shear strength and suppressed the growth of IMCs in the interfacial layer of the solder joints.


2004 ◽  
Vol 19 (10) ◽  
pp. 2897-2904 ◽  
Author(s):  
M.N. Islam ◽  
Y.C. Chan ◽  
A. Sharif

Lead-free solders with high Sn content cause excessive interfacial reactions at the interface with under-bump metallization during reflow. The interface formed after reflow affects the reliability of the solder joint. For this paper, we investigated the interfacial reactions of Sn0.7Cu and Sn36Pb2Ag solder on electrolytic Ni layer for different reflow times. The traditionally used Sn36Pb2Ag solder was used as a reference. It was found that during as-reflowed, the formation of Cu-rich Sn–Cu–Ni ternary intermetallic compounds (TIMCs) at the interface of Sn0.7Cu solder with electrolytic Ni is much quicker, resulting in the entrapment of some Pb (which is present as impurity in the Sn–Cu solder) rich phase in the TIMCs. During extended time of reflow, high (>30 at.%), medium (30-15 at.%) and low (<15 at.%) Cu TIMCs formed at the interface. The amount of Cu determined the growth rate of TIMCs. Cu-rich TIMCs had higher growth rate and consumed more Ni layer. By contrast, the growth rate of the Ni–Sn binary intermetallic compounds (BIMCs) in the Sn36Pb2Ag solder joint was slower, and the Ni–Sn BIMC was more stable and adherent. The dissolution rate of electrolytic Ni layer for Sn0.7Cu solder joint was higher than the Sn36Pb2Ag solder joints. Less than 3 μm of the electrolytic Ni layer was consumed during molten reaction by the higher Sn containing Sn0.7Cu solder in 180 min at 250 °C. The shear strength of Sn–Pb–Ag solder joints decreased within 30 min of reflow time from 1.938 to 1.579 kgf due to rapid formation of ternary Ni–Sn–Au compounds on the Ni–Sn BIMCs. The shear strength of Sn0.7Cu solder joint is relatively stable from 1.982 to 1.861 kgf during extended time reflow. Cu prevents the resettlement of Au at the interface. The shear strength does not depend on the thickness of intermetallic compounds (IMCs) and reflow time. Ni/Sn–Cu solder system has higher strength and can be used during prolonged reflow.


The objective of this research is to study the effect of laser energy and Nitrogen flow on the solder joints of the Head Gimbal Assembly (HGA). The soldering of the HGA components isn't the same as general semiconductors. Since the soldering figure perpendicular to each other so that, it was used the laser solder jet bonding system. The solder jet bonding system uses a solder ball consisting of Sn-2.0Ag-0.7Cu (SAC207) is used for connection of the HGA pad made from a Cu trace coated with Au. The growth of intermetallic compounds (IMCs) and shear strength will be analyzed to investigate the effects of laser energy and Nitrogen flow on solder joint reliability. In this research, laser energy levels since 2, 2.5, 3, 3.5, 4, and 4.5 mJ and keep the Nitrogen flow value at 90 mbar. As for the Nitrogen flow effect analysis, the Nitrogen flow level was used at 80, 100, 120, and 140 mbar and keep the laser energy value 3.5 mJ. The results of the study show that the increased levels of laser energy can inhibit the growth of intermetallic compounds as well as the AuSn4 phase that can present benefit to solder joints with results showing within the shear strength to increase significantly. The increase in Nitrogen flow levels has the same effect as the increase in laser energy levels, which can decreases the growth of intermetallic compounds and AuSn4 phase also including increased shear strength. The difference between laser energy and Nitrogen flow increasing shows the level of laser energy can clearly distinct the effect on each level. But the increase in Nitrogen flow level is statistically insignificant from each level.


2021 ◽  
Vol 11 (1) ◽  
Author(s):  
Jianguo Cui ◽  
Keke Zhang ◽  
Di Zhao ◽  
Yibo Pan

AbstractThrough ultrasonic wave assisted Sn2.5Ag0.7Cu0.1RExNi/Cu (x = 0, 0.05, 0.1) soldering test and − 40 to 125 °C thermal shock test, the microstructure and shear properties of Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints under thermal cycling were studied by the SEM, EDS and XRD. The results show that the Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints with high quality and high reliability can be obtained by ultrasonic assistance. When the ultrasonic vibration power is 88 W, the ultrasonic-assisted Sn2.5Ag0.7Cu0.1RE0.05Ni/Cu solder joints exhibits the optimized performance. During the thermal cycling process, the shear strength of ultrasonic-assisted Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints had a linear relationship with the thickness of interfacial intermetallic compound (IMC). Under the thermal cycling, the interfacial IMC layer of ultrasonic-assisted Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints consisted of (Cu,Ni)6Sn5 and Cu3Sn. The thickness of interfacial IMC of ultrasonic-assisted Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints was linearly related to the square root of equivalent time. The growth of interfacial IMC of ultrasonic-assisted Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints had an incubation period, and the growth of IMC was slow within 300 cycles. And after 300 cycles, the IMC grew rapidly, the granular IMC began to merge, and the thickness and roughness of IMC increased obviously, which led to a sharp decrease in the shear strength of the solder joints. The 0.05 wt% Ni could inhibit the excessive growth of IMC, improve the shear strength of solder joints and improve the reliability of solder joints. The fracture mechanism of ultrasonic-assisted Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints changed from the ductile–brittle mixed fracture in the solder/IMC transition zone to the brittle fracture in the interfacial IMC.


Metals ◽  
2019 ◽  
Vol 9 (5) ◽  
pp. 518 ◽  
Author(s):  
Congcong Cao ◽  
Keke Zhang ◽  
Baojin Shi ◽  
Huigai Wang ◽  
Di Zhao ◽  
...  

The interface microstructure and shear strength of Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints under thermal-cycle loading were investigated with scanning electron microscope (SEM), energy dispersive spectroscopy (EDS), X-ray diffraction (XRD) and physical and chemical tests. The results show that an intermetallic compound (IMC) layer of Sn2.5Ag0.7Cu0.1RExNi/Cu solder joints evolved gradually from the scalloped into larger wavy forms with increasing number of thermal cycles. The roughness and average thickness of IMC increased with thermal-cycle loading. However, at longer thermal-cycle loading, the shear strength of the joints was reduced by about 40%. The fracture pathway of solder joints was initiated in the solder seam with ductile fracture mechanism and propagated to the solder seam/IMC layer with ductile-brittle mixed-type fracture mechanism, when the number of thermal cycles increased from 100 to 500 cycles. By adding 0.05 wt.% Ni, the growth of the joint interface IMC could be controlled, and the roughness and average thickness of the interfacial IMC layer reduced. As a result, the shear strength of joints is higher than those without Ni. When compared to joint without Ni, the roughness and average thickness of 0.05 wt.% Ni solder joint interface IMC layer reached the minimum after 500 thermal cycles. The shear strength of that joint was reduced to a minimum of 36.4% of the initial state, to a value of 18.2 MPa.


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