Physical failure analysis of package qualification for new product and process

2010 ◽  
Author(s):  
Yi-Chen Lin ◽  
Hung-Jia Chang
Keyword(s):  
Failure Analysis ◽  
New Product ◽  
Product And Process

New Rapid Failure Analysis Techniques for Multilevel Metallization

MRS Bulletin ◽  
1995 ◽  
Vol 20 (11) ◽  
pp. 74-77
Author(s):  
Edward I. Cole ◽  
Richard E. Anderson
Keyword(s):  
Integrated Circuits ◽  
Product Development ◽  
Failure Analysis ◽  
New Product Development ◽  
New Product ◽  
Electronics Industry ◽  
New Techniques ◽  
Analysis Techniques ◽  
Advantages And Disadvantages ◽  
Failure Site

Open interconnections on integrated circuits (ICs) are a serious and ubiquitous problem throughout the micro-electronics industry. The efforts to understand the mechanisms responsible for producing open interconnections and to develop analytical methods to localize them demonstrate the concern manufacturers have for this problem. Multiple layers of metallization not only increase the probability that an open conductor or via will occur because of the increased number of interconnections and vias but also increase the difficulty in localizing the site of the failure because upper layers may mask the failure site.Rapid failure analysis of open-conductor defects is critical in new product development and reliability assessment of ICs where manufacturing and product development delays can cost millions of dollars a day. In this article, we briefly review some standard failure analysis approaches and then concentrate on new techniques to rapidly locate open-conductor defects that would have been difficult or impossible to identify using earlier methods. Each method is described in terms of the physics of signal generation, application, and advantages and disadvantages when compared to existing methods.

Decision Making and Decision Support Within New Product Development

2014 ◽  
pp. 258-279 ◽  
Author(s):  
Bart MacCarthy ◽  
Robert Pasley
Keyword(s):  
Decision Making ◽  
Decision Support ◽  
New Product Development ◽  
Process Development ◽  
Early Stage ◽  
New Product ◽  
Group Decision Support Systems ◽  
Extensive Literature ◽  
Decision Attributes ◽  
Product And Process

There is an extensive literature on new product and process development (NPD). However, the analysis of decision making and decision support requirements in this area is less well researched. Here we discuss decision making in the context of NPD and identify decision types and decision attributes relevant to the NPD context. They illustrate the approach by analyzing NPD decisions in three industrial cases with a focus on early stage NPD decisions. They create a set of attributes with reference to the decision making literature. They find these attributes can be used to codify decisions in order to characterize them. They find the design decisions in these case studies to be creative and brainstorming-led with a low level of structure. The results provide insights both on decision making in NPD in practice and on the requirements for group decision support systems (GDSS) in this area. The authors suggest that an argumentation-based GDSS that allows structure to be developed may be suitable for these decisions. The cases are used to illustrate the application of the approach and show an interesting set of example decision types, but do not cover the range of NPD decisions that may be evident in a larger set of companies.

scholarly journals The Impact of New-Product R&D on the Circular Flow

2018 ◽  
Vol 64 (1) ◽  
pp. 45-59
Author(s):  
James E. McClure ◽  
David Chandler Thomas
Keyword(s):  
Open System ◽  
Closed System ◽  
Flow Model ◽  
New Product ◽  
Flow Models ◽  
Circular Flow ◽  
Product And Process ◽  
The Impact ◽  
Shed Light ◽  
Jel Classifications

Closed-system circular flow models have been ubiquitous in economics for at least half a century. Because these models account for neither new-product R&D, nor the attendant leakages and injections, they obscure understanding of (a) the distinction between new-product and process R&D, (b) the circular flow leakages and injections attending new-product R&D, and (c) Schumpeterian “creative destruction” and “swarming.” To shed light upon these matters, we present an open-system circular flow model and a price theoretic explanation of the swarming overinvestment that characterizes business cycle downturns. JEL Classifications: B20, O31, E30

Product Debug: Speed Problem Related to Unexpected RC Delay

2010 ◽  
Author(s):  
J.G. van Hassel ◽  
F. Zachariasse
Keyword(s):  
Failure Analysis ◽  
Failure Mechanisms ◽  
Audio Signal ◽  
New Product ◽  
Analysis Method ◽  
Standard Analysis ◽  
Time Resolved ◽  
Defect Localization ◽  
Rc Delay ◽  
Comprehensive Study

Abstract In new product designs increasing effort is needed to observe and prove failure mechanisms or process marginalities. For advanced failure analysis Soft Defect Localization (SDL) [1] and Time Resolved Emission (TRE) [2,3] have now become a standard analysis method. Both techniques require a close co-operation between designers and analysts. In this paper we will discuss a comprehensive study to find the mechanism behind a speed problem in the digital part of an audio signal processor. The additional delay was related to unwanted routing through poly-silicide in timing critical circuitry.

Device Characterization Using AFP Nanoprobing for the Localization of New Product Design Weakness

2013 ◽  
Author(s):  
Ghim Boon Ang ◽  
Alfred Quah ◽  
Changqing Chen ◽  
Si Ping Zhao ◽  
Dayanand Nagalingam ◽  
...  
Keyword(s):  
Problem Solving ◽  
Failure Analysis ◽  
Product Design ◽  
New Product ◽  
Analysis Tool ◽  
Deep Dive ◽  
Root Cause ◽  
Strong Emphasis ◽  
New Product Design ◽  
Testing Issue

Abstract This paper illustrated the beauty of AFP nano-probing as the critical failure analysis tool in localizing new product design weakness. A 40nm case of HTOL Pin Leakage due to Source/Drain punch-through at a systematic location was discussed. The root cause and mechanism was due to VDS overdrive testing issue. This paper placed a strong emphasis on systematic problem solving approach, deep dive and use of right FA approach/tool that are essentially critical to FA analysts in wafer foundry since there is always minimal available data provided. It would serve as a good reference to wafer Fab that encountered such issue.

Appraisal of New Product Development Success Indicators in the Aerospace Industry

2011 ◽  
Vol 133 (10) ◽  
Author(s):  
Afrooz Moatari Kazerouni ◽  
Sofiane Achiche ◽  
Onur Hisarciklilar ◽  
Vincent Thomson
Keyword(s):  
Product Development ◽  
New Product Development ◽  
Process Management ◽  
New Product ◽  
Practical Case ◽  
Aerospace Companies ◽  
Success Measurement ◽  
Success Indicators ◽  
Product And Process ◽  
Measurement Of Success

Assessing performance in developing new aerospace products is essential. However, choosing an accurate set of success indicators to measure the performance of complex products is a nontrivial task. Moreover, the most useful success indicators can change over the life of the product; therefore, different metrics need to be used at different phases of the product lifecycle (PLC). This paper describes the research undertaken to determine success measurement metrics for new product development (NPD) processes. The goal of this research was to ascertain an appropriate set of metrics used by aerospace companies for assessing success during different phases of the PLC. Furthermore, an evaluation of the differences and similarities of NPD success measurement was carried out between aerospace companies and the nonaerospace companies practicing in the business-to-business (B2B) market. Practical case studies were carried out for 16 Canadian and Danish companies. Seven companies belong to the aerospace sector, while nine are nonaerospace companies that are in the B2B market. The data were gathered from relevant product managers at participating companies. The outcomes of this research indicate that: (1) the measurement of success of aerospace NPD practices depends on the PLC phase being measured, (2) product and process management performance are the more important indicators of success in the early PLC phases with revenue and market share indicators being important during late phases, and (3) there are reasonable similarities in success measurement between aerospace and nonaerospace B2B companies. Sets of metrics for measuring success during each PLC phase of aerospace products are proposed, which can guide companies in determining their ideal practices.

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