scholarly journals Characterization of Epitaxial Heavily Doped Silicon Regions Formed by Hot-Wire Chemical Vapor Deposition Using Micro-Raman and Microphotoluminescence Spectroscopy

2018 ◽  
Vol 8 (3) ◽  
pp. 813-819 ◽  
Author(s):  
Tasmiat Rahman ◽  
Hieu T. Nguyen ◽  
Antulio Tarazona ◽  
Jingxing Shi ◽  
Young-Joon Han ◽  
...  
2012 ◽  
Vol 520 (6) ◽  
pp. 2110-2114 ◽  
Author(s):  
Hsin-Yuan Mao ◽  
Dong-Sing Wuu ◽  
Bing-Rui Wu ◽  
Shih-Yung Lo ◽  
Hsin-Yu Hsieh ◽  
...  

2010 ◽  
pp. NA-NA
Author(s):  
T. Chen ◽  
A. Schmalen ◽  
J. Wolff ◽  
D. Yang ◽  
R. Carius ◽  
...  

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