A TCAD Simulation Study of Three-Independent-Gate Field-Effect Transistors at the 10-nm Node
Keyword(s):
2008 ◽
Vol 55
(4)
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pp. 1094-1095
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Keyword(s):
2010 ◽
Vol 28
(1)
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pp. C1G12-C1G17
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2018 ◽
Vol 88
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pp. 110-119
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2021 ◽