Influence of stress-induced void formation on electromigration endurance in quarter-micron aluminum interconnects
2018 ◽
Vol 9
(1)
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pp. 51-93
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2009 ◽
Vol 40
(12)
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pp. 2803-2811
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2016 ◽
Vol 6
(1)
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pp. 68-73
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1989 ◽
Vol 36
(6)
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pp. 1050-1055
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