Evaluation of a Trapping Potential Measurement Technique for Optical Tweezers Using Simulations and Experiments
A technique to measure the trapping force in an optical tweezers, without making any prior assumptions about the trap shape, has been extended to two-dimensions. The response of a trapped micro or nanoparticle to a step input is measured and then used to calculate the trapping force experienced by the particle as a function of its position in the trap. Langevin dynamics simulations have been implemented to evaluate the performance of this measurement method in two-dimensions and to evaluate whether the particle’s motion away from the measurement plane due to diffusion gives rise to an error in the trapping force measurement. Preliminary experimental results are also presented to demonstrate this method in the laboratory. This force measurement method provides insight into the trapping behavior of micro and nanoparticles in an optical trap beyond the region, close to the trap center, where the trapping force is assumed to vary linearly with the particle’s displacement. The measured trapping forces, from simulations and laboratory experiments, are then integrated to recover the shape of the optical trapping potential.