Advanced Cooling With Embedded Heat Pipes for High Power Microelectronics
The transient thermal behavior of a complex testing system including multiple fans, a mixing enclosure, Cu inserts and a leaded package dissipating large amounts of power over short time durations is evaluated via numerical simulations. The system performance is optimized with heat sink/fan structure for device efficient operation under constant powering. The study provides meaningful understanding and prediction of a transient powering scenario at high powering levels, evaluating the impact of alternative cooling fan/heat pipe configurations on the thermal performance of the system. One design is chosen due to its effective thermal performance and assembly simplicity, with the package embedded in heat sink base with multiple (5) heat pipes. The peak temperature reached by the modified design with 4 cooling fans is ∼95°C, with the corresponding Rja thermal resistance ∼0.58°C/W. For the transient study (with embedded heat pipes and 4 fans), after one cycle, both peak temperature (at 45 s) and the end temperature (at 49 s) decrease as compared to the previous no heat pipe/single fan case (especially the end temperature reduces by ∼16%). The temperature drop between peak and end for each cycle is ∼80.2°C, while the average power per transient cycle is ∼31.27W. With this power, the design with 5 perpendicular heat pipes, 4 fans and insert reaches a steady state peak temperature of ∼98°C. Applying the superposition principle, the maximum transient temperature after a large number of operating cycles will not exceed ∼138.1°C, satisfying the thermal budget under the current operating conditions. The benefit of the study is related to the possibility to extract the maximum/minimum temperatures for a real test involving a large number of heating-cooling cycles, yet maintaining the initial and peak temperatures within a certain range for the optimal operation of the device. The flow and heat transfer fields are thoroughly investigated: using a combination of numerical and analytical study, the thermal performance of the device undergoing large number of periodic thermal cycles is predicted. Further comparison between measurement and simulation results reveals good agreement.