Thermal Resistance of Bond-Lines Formed With Composite Thermal Interface Materials

2005 ◽  
Author(s):  
Gary Lehmann ◽  
Hao Zhang ◽  
Arun Gowda ◽  
David Esler
Keyword(s):  
Thermal Conductivity ◽  
Particle Size ◽  
Thermal Resistance ◽  
Bond Line ◽  
Surface Conductance ◽  
Thermal Interface Materials ◽  
Thermal Interface ◽  
Bond Line Thickness ◽  
Matrix Surface ◽  
Interface Materials

Measurements and modeling of the thermal resistance of thin (< 100 microns) bond-lines are reported for composite thermal interface materials (TIMs). The composite TIMs consist of alumina particles dispersed in a polymer matrix to form six different adhesive materials. These model TIMs have a common matrix material and are distinguished by their particle size distributions. Bond-lines are formed in a three-layer assembly consisting of a substrate-TIM-substrate structure. The thermal resistance of the bond-line is measured, as a function of bond-line thickness, using the laser flash-technique. A linear variation of resistance with bond-line thickness is observed; Rbl = β · Lbl + Ro. A model is presented that predicts the effective thermal conductivity of the composite as a function of the particle and matrix conductivity, the particle-matrix surface conductance, the particle volume fraction and the particle size distribution. Specifically a method is introduced to account for a broad, continuous size distribution. A particle-matrix surface conductance value of ∼10W/mm2K is found to give good agreement between the measured and predicted effective thermal conductivity values of the composite TIMs.

Silicone Phase Change Thermal Interface Materials: Properties and Applications

2003 ◽  
Author(s):  
S. Mark Zhang ◽  
Diane Swarthout ◽  
Thomas Noll ◽  
Susan Gelderbloom ◽  
Douglas Houtman ◽  
...  
Keyword(s):  
Thermal Conductivity ◽  
Thermal Resistance ◽  
Mechanical Strength ◽  
Phase Change ◽  
Bond Line ◽  
Thermal Interface Materials ◽  
Thermal Interface ◽  
Interface Materials ◽  
Change Material ◽  
Aluminum Mesh

Thermal interface materials (TIM) play a very important role in effectively dissipating unwanted heat generated in electronic devices. This requires that the TIM should have a high bulk thermal conductivity, intimate contact with the substrate surfaces, and the capability to form a thin bond line. In designing new TIMs to meet these industry needs, alkyl methyl siloxane (AMS) waxes have been studied as phase change matrices. AMS waxes are synthesized by grafting long chain alpha-olefins on siloxane polymers. The melting point range of the silicone wax is determined by the hydrocarbon chain length and the siloxane structure. When the AMS wax is mixed with thermally conductive fillers such as alumina, a phase change compound is created. The bulk thermal conductivities of the phase change material (PCM) are reduced as they go through the phase change transition from solid to liquid. By coating the PCM onto an aluminum mesh, both the mechanical strength and the thermal conductivity are drastically improved. The thermal conductivity increases from 4.5 W/mK for the PCM without aluminum support to 7.5 W/mK with the supporting mesh. The thermal resistance of the aluminum-supported sheet at a bond line thickness of 115 microns has been found to be ∼0.24 cm2-C/W. Applying pressure at the time of application has a positive effect on the thermal performance of the PCM. Between contact pressures of 5–80 psi, the thermal resistance decreases as the pressure increases. The weak mechanical strength of the phase change material turns out to be a benefit when ease of rework and the effects of shock and vibration during shipping and handling are considered. A stud pull test of the aluminum mesh-supported PCM shows an average of 13 psi stress at the peak of the break.

Bond Line Thickness of Thermal Interface Materials With Carbon Nanotubes

2005 ◽  
Author(s):  
Senthil A. G. Singaravelu ◽  
Xuejiao Hu ◽  
Kenneth E. Goodson
Keyword(s):  
Thermal Conductivity ◽  
Carbon Nanotubes ◽  
Volume Fraction ◽  
Bond Line ◽  
Thermal Interface Materials ◽  
Thermal Interface ◽  
Line Thickness ◽  
Bond Line Thickness ◽  
The Impact ◽  
Interface Materials

Increasing power dissipation in today’s microprocessors demands thermal interface materials (TIMs) with lower thermal resistances. The TIM thermal resistance depends on the TIM thermal conductivity and the bond line thickness (BLT). Carbon Nanotubes (CNTs) have been proposed to improve the TIM thermal conductivity. However, the rheological properties of TIMs with CNT inclusions are not well understood. In this paper, the transient behavior of the BLT of the TIMs with CNT inclusions has been measured under controlled attachment pressures. The experimental results show that the impact of CNT inclusions on the BLT at low volume fractions (up to 2 vol%) is small; however, higher volume fraction of CNT inclusions (5 vol%) can cause huge increase in TIM thickness. Although thermal conductivities are higher for higher CNT fractions, a minimum TIM resistance exists at some optimum CNT fraction for a given attachment pressure.

Characterizing Bulk Thermal Conductivity and Interface Contact Resistance Effects of Thermal Interface Materials in Electronic Cooling Applications

2003 ◽  
Author(s):  
Vadim Gektin ◽  
Sai Ankireddi ◽  
Jim Jones ◽  
Stan Pecavar ◽  
Paul Hundt
Keyword(s):  
Thermal Conductivity ◽  
Thermal Resistance ◽  
Contact Resistance ◽  
Thermal Performance ◽  
Electronic Cooling ◽  
Thermal Interface Materials ◽  
Thermal Interface ◽  
Interface Contact ◽  
Interface Materials ◽  
Bulk Thermal Conductivity

Thermal Interface Materials (TIMs) are used as thermally conducting media to carry away the heat dissipated by an energy source (e.g. active circuitry on a silicon die). Thermal properties of these interface materials, specified on vendor datasheets, are obtained under conditions that rarely, if at all, represent real life environment. As such, they do not accurately portray the material thermal performance during a field operation. Furthermore, a thermal engineer has no a priori knowledge of how large, in addition to the bulk thermal resistance, the interface contact resistances are, and, hence, how much each influences the cooling strategy. In view of these issues, there exists a need for these materials/interfaces to be characterized experimentally through a series of controlled tests before starting on a thermal design. In this study we present one such characterization for a candidate thermal interface material used in an electronic cooling application. In a controlled test environment, package junction-to-case, Rjc, resistance measurements were obtained for various bondline thicknesses (BLTs) of an interface material over a range of die sizes. These measurements were then curve-fitted to obtain numerical models for the measured thermal resistance for a given die size. Based on the BLT and the associated thermal resistance, the bulk thermal conductivity of the TIM and the interface contact resistance were determined, using the approach described in the paper. The results of this study permit sensitivity analyses of BLT and its effect on thermal performance for future applications, and provide the ability to extrapolate the results obtained for the given die size to a different die size. The suggested methodology presents a readily adaptable approach for the characterization of TIMs and interface/contact resistances in the industry.

Development of a Compliant Nanothermal Interface Material

2011 ◽  
Author(s):  
David Shaddock ◽  
Stanton Weaver ◽  
Ioannis Chasiotis ◽  
Binoy Shah ◽  
Dalong Zhong
Keyword(s):  
Thermal Conductivity ◽  
Thermal Resistance ◽  
Thermal Stresses ◽  
Performance Testing ◽  
High Thermal Conductivity ◽  
Thermal Interface Material ◽  
Thermal Interface Materials ◽  
Thermal Interface ◽  
Bondline Thickness ◽  
Interface Materials

The power density requirements continue to increase and the ability of thermal interface materials has not kept pace. Increasing effective thermal conductivity and reducing bondline thickness reduce thermal resistance. High thermal conductivity materials, such as solders, have been used as thermal interface materials. However, there is a limit to minimum bondline thickness in reducing resistance due to increased fatigue stress. A compliant thermal interface material is proposed that allows for thin solder bondlines using a compliant structure within the bondline to achieve thermal resistance <0.01 cm2C/W. The structure uses an array of nanosprings sandwiched between two plates of materials to match thermal expansion of their respective interface materials (ex. silicon and copper). Thin solder bondlines between these mating surfaces and high thermal conductivity of the nanospring layer results in thermal resistance of 0.01 cm2C/W. The compliance of the nanospring layer is two orders of magnitude more compliant than the solder layers so thermal stresses are carried by the nanosprings rather than the solder layers. The fabrication process and performance testing performed on the material is presented.

Advanced Thermal Interface Materials

2006 ◽  
Vol 968 ◽  
Author(s):  
Yimin Zhang ◽  
Allison Xiao ◽  
Jeff McVey
Keyword(s):  
Thermal Conductivity ◽  
Thermal Resistance ◽  
Thermal Energy ◽  
Heat Sink ◽  
Electronic Device ◽  
Thermal Interface Materials ◽  
Thermal Interface ◽  
Current State ◽  
Interface Materials ◽  
State Of Art

ABSTRACTThermal interface materials (TIMs) are used to dissipate thermal energy from a heat-generating device to a heat sink via conduction. The growing power density of the electronic device demands next-generation high thermal conductivity and/or low thermal resistance TIMs. This paper discusses the current state-of-art TIM solutions, particularly fusible particles for improved thermal conductivity. The paper will address the benefits and limitations of this approach, and describe a system with unique filler morphology. Thermal resistance and diffusivity/conductivity characterization techniques are also discussed.

Rheological Study of Micro Particle Laden Polymeric Thermal Interface Materials: Part 1 — Experimental

2002 ◽  
Author(s):  
Ravi S. Prasher ◽  
Jim Shipley ◽  
Suzana Prstic ◽  
Paul Koning ◽  
Jin-Lin Wang
Keyword(s):  
Thermal Conductivity ◽  
Volume Fraction ◽  
Particle Volume Fraction ◽  
Electronics Cooling ◽  
Bond Line ◽  
Rheological Parameters ◽  
Thermal Interface Materials ◽  
Particle Volume ◽  
Thermal Interface ◽  
Interface Materials

Particle laden polymers are one of the most prominent thermal interface materials (TIM) used in electronics cooling. Most of the research groups have primarily dealt with the understanding of the thermal conductivity of these types of TIMs. Thermal resistance is not only dependent on the thermal conductivity but also on the bond line thickness (BLT) of these TIMs. It is not clear that which material property(s) of these particle laden TIMs affects the BLT. This paper discusses the experimental measurement of rheological parameters such as non-Newtonian strain rate dependent viscosity and yield stress for 3 different particle volume fraction and 3 different base polymer viscosity materials. These rheological and BLT measurements vs. pressure will be used to model the BLT of particle-laden systems for factors such as volume fraction.

Fatigue life of lead-free solder thermal interface materials at varying bond line thickness in microelectronics

2014 ◽  
Vol 54 (1) ◽  
pp. 239-244 ◽  
Author(s):  
Mathias Ekpu ◽  
Raj Bhatti ◽  
Michael I. Okereke ◽  
Sabuj Mallik ◽  
Kenny Otiaba
Keyword(s):  
Fatigue Life ◽  
Bond Line ◽  
Lead Free ◽  
Thermal Interface Materials ◽  
Lead Free Solder ◽  
Thermal Interface ◽  
Line Thickness ◽  
Bond Line Thickness ◽  
Free Solder ◽  
Interface Materials

Rheological Study of Micro Particle Laden Polymeric Thermal Interface Materials: Part 2 — Modeling

2002 ◽  
Author(s):  
Ravi S. Prasher ◽  
Jim Shipley ◽  
Suzana Prstic ◽  
Paul Koning ◽  
Jin-Lin Wang
Keyword(s):  
Thermal Conductivity ◽  
Thermal Resistance ◽  
Yield Stress ◽  
Volume Fraction ◽  
Particle Volume Fraction ◽  
Thermal Interface Materials ◽  
Particle Volume ◽  
Thermal Interface ◽  
Complete Set ◽  
Interface Materials

Currently there are no models to predict the thickness or the bondline thickness (BLT) of particle laden polymeric thermal interface materials (TIM) for parameters such as particle volume fraction and pressure. TIMs are used to reduce the thermal resistance. Typically this is achieved by increasing the thermal conductivity of these TIMs by increasing the particle volume fraction, however increasing the particle volume fraction also increases the BLT. Therefore, increasing the particle volume fraction may lead to an increase in the thermal resistance after certain volume fraction. This paper introduces a model for the prediction of the BLT of these particle laden TIMs. Currently thermal conductivity is the only metric for differentiating one TIM formulation from another. The model developed in this paper introduces another metric: the yield stress of these TIMs. Thermal conductivity and the yield stress together constitute the complete set of material parameters needed to define the thermal performance of particle laden TIMs.

Thermal Resistance of Particle Laden Polymeric Thermal Interface Materials

2003 ◽  
Author(s):  
Ravi S. Prasher ◽  
Jim Shipley ◽  
Suzana Prstic ◽  
Paul Koning ◽  
Jin-Lin Wang
Keyword(s):  
Thermal Conductivity ◽  
Thermal Resistance ◽  
Volume Fraction ◽  
Applied Pressure ◽  
Electronics Cooling ◽  
Thermal Design ◽  
Thermal Interface Materials ◽  
Particle Volume ◽  
Thermal Interface ◽  
Interface Materials

Particle laden polymers are one of the most prominent thermal interface materials (TIM) used in electronics cooling. Most of the research has primarily dealt with the understanding of the thermal conductivity of these types of TIMs. For thermal design, reduction of the thermal resistance is the end goal. Thermal resistance is not only dependent on the thermal conductivity, but also on the bond line thickness (BLT) of these TIMs. It is not clear which material property(s) of these particle laden TIMs affects the BLT and eventually the thermal resistance. This paper introduces a rheology based semi-empirical model for the prediction of the BLT of these TIMs. BLT depends on the yield stress of the particle laden polymer and the applied pressure. The BLT model combined with the thermal conductivity model can be used for modeling the thermal resistance of these TIMs for factors such as particle volume faction, particle shape, base polymer viscosity, etc. This paper shows that there exists an optimal filler volume fraction at which thermal resistance is minimum. Finally this paper develops design rules for the optimization of thermal resistance for particle laden TIMs.

Two-Medium Model for the Bond Line Thickness of Particle Filled Thermal Interface Materials

2004 ◽  
Author(s):  
Xuejiao Hu ◽  
Senthil Govindasamy ◽  
Kenneth E. Goodson
Keyword(s):  
Filler Particle ◽  
Bond Line ◽  
Thermal Interface Materials ◽  
Heterogeneous Structure ◽  
Thermal Interface ◽  
Line Thickness ◽  
Medium Model ◽  
Bond Line Thickness ◽  
The Impact ◽  
Interface Materials

Thermal interface materials (TIMs) are widely used in electronics packaging. Increasing heat generation rates require lower values of the TIM thermal resistance, which depends on the material thermal conductivity and the TIM thickness, or the bond line thickness (BLT). The variation of the TIM thickness is not well understood. The major difficulty comes from the complexity of TIMs as condensed particle systems, especially when the TIM thickness is squeezed to several multiples of the filler particle diameter. This confined heterogeneous structure makes the behavior of TIMs different from that of homogeneous fluids. In this study, we propose a two-medium model for the BLT. The variation of BLT with attachment pressure is modeled using two parameters: the viscidity of the fluids and the interactions of particles. The predictions are compared with the measurements for TIMs made of aluminum oxide particles (sizes: 0.6–6 microns, volume fractions: 30%–50%) and silicon oil (kinematic viscosity: 100 cst and 1000 cst). Reasonable agreement is obtained for different applied pressures. Results indicate that the impact of the particle interactions is an important factor governing the variation of the TIM BLT, especially when the BLT is small.

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