Effect of high-frequency variation on the etch characteristics of ArF photoresist and silicon nitride layers in dual frequency superimposed capacitively coupled plasma
2005 ◽
Vol 23
(5)
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pp. 2203
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Keyword(s):
2007 ◽
Vol 25
(4)
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pp. 1073-1077
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2010 ◽
Vol 28
(4)
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pp. 755-760
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2010 ◽
Vol 19
(5)
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pp. 055011
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Keyword(s):
2011 ◽
Vol 13
(1)
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pp. 61-67
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2010 ◽
Vol 12
(1)
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pp. 53-58
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