Characterization of silicon carbide epitaxial films by differential reflectance spectroscopy
2007 ◽
Vol 36
(4)
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pp. 285-296
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1983 ◽
Vol 41
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pp. 72-73
Keyword(s):
2014 ◽
Vol 36
(6)
◽
pp. 410-414
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2007 ◽
Vol 46
(4A)
◽
pp. 1415-1426
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1998 ◽
Vol 13
(7)
◽
pp. 2003-2014
◽
Keyword(s):