scholarly journals Detecting nanometric displacements with optical ruler metrology

Science ◽  
2019 ◽  
Vol 364 (6442) ◽  
pp. 771-775 ◽  
Author(s):  
Guang Hui Yuan ◽  
Nikolay I. Zheludev
Keyword(s):  
Electromagnetic Field ◽  
Berry Phase ◽  
Resolving Power ◽  
Smart Manufacturing ◽  
High Magnification ◽  
Typical Size ◽  
Diffraction Of Light ◽  
Interferometric Observation ◽  
Confined Environment ◽  
Better Than

We introduce the optical ruler, an electromagnetic analog of a physical ruler, for nanoscale displacement metrology. The optical ruler is a complex electromagnetic field in which singularities serve as the marks on the scale. It is created by the diffraction of light on a metasurface, with singularity marks then revealed by high-magnification interferometric observation. Using a Pancharatnam-Berry phase metasurface, we demonstrate a displacement resolving power of better than 1 nanometer (λ/800, where λ is the wavelength of light) at a wavelength of 800 nanometers. We argue that a resolving power of ~λ/4000, the typical size of an atom, may be achievable. An optical ruler with dimensions of only a few tens of micrometers offers applications in nanometrology, nanomonitoring, and nanofabrication, particularly in the demanding and confined environment of future smart manufacturing tools.

Closing the GAP—A 5Å Scanning Microscope

1969 ◽  
Vol 27 ◽  
pp. 6-7
Author(s):  
A. V. Crewe
Keyword(s):  
Normal Form ◽  
The Other ◽  
Resolving Power ◽  
Scanning Microscope ◽  
Conventional Microscope ◽  
Other Hand ◽  
Closing The Gap ◽  
Thermal Sources ◽  
Better Than ◽  
Transmission Microscope

We have become accustomed to differentiating between the scanning microscope and the conventional transmission microscope according to the resolving power which the two instruments offer. The conventional microscope is capable of a point resolution of a few angstroms and line resolutions of periodic objects of about 1Å. On the other hand, the scanning microscope, in its normal form, is not ordinarily capable of a point resolution better than 100Å. Upon examining reasons for the 100Å limitation, it becomes clear that this is based more on tradition than reason, and in particular, it is a condition imposed upon the microscope by adherence to thermal sources of electrons.

Resolution and measurement in the scanning electron microscope

1987 ◽  
Vol 45 ◽  
pp. 534-537 ◽  
Author(s):  
Michael T. Postek
Keyword(s):  
Electron Microscope ◽  
Scanning Electron Microscope ◽  
Engineering Design ◽  
Resolving Power ◽  
Practical Applications ◽  
Instrument Resolution ◽  
Accurate Definition ◽  
Definition Of ◽  
Scanning Electron ◽  
Better Than

The term ultimate resolution or resolving power is the very best performance that can be obtained from a scanning electron microscope (SEM) given the optimum instrumental conditions and sample. However, as it relates to SEM users, the conventional definitions of this figure are ambiguous. The numbers quoted for the resolution of an instrument are not only theoretically derived, but are also verified through the direct measurement of images on micrographs. However, the samples commonly used for this purpose are specifically optimized for the measurement of instrument resolution and are most often not typical of the sample used in practical applications.SEM RESOLUTION. Some instruments resolve better than others either due to engineering design or other reasons. There is no definitively accurate definition of how to quantify instrument resolution and its measurement in the SEM.

scholarly journals ESA’s X-Ray Astronomy Mission, XMM

1990 ◽  
Vol 123 ◽  
pp. 129-140
Author(s):  
B.G. Taylor ◽  
A. Peacock
Keyword(s):  
Resolving Power ◽  
Science Program ◽  
Eccentric Orbit ◽  
Ccd Cameras ◽  
Optical Telescope ◽  
X Ray ◽  
Medium Resolution ◽  
Reflection Gratings ◽  
Better Than

AbstractESA’s X-ray Astronomy Mission, XMM, scheduled for launch in 1998, is the second of four cornerstones of ESA’s long term science program Horizon 2000. Covering the range from about 0.1 to 10 keV, it will provide a high throughput of 5000 cm2 at 7 keV with three independant telescopes, and have a spatial resolution better than 30 arcsec. Broadband spectrophotometry is provided by CCD cameras while reflection gratings provide medium resolution spectroscopy (resolving power of about 400) in the range 0.3–3 keV. Long uninterrupted observations will be made from the 24 hr period, highly eccentric orbit, reaching a sensitivity approaching 10−15 erg cm−2 s−1 in one orbit. A 30 cm UV/optical telescope is bore-sighted with the x-ray telescopes to provide simultaneous optical counterparts to the numerous serendipitous X-ray sources which will be detected during every observation.

Apparatus for nuclear electron double resonance at 12500 gauss

1964 ◽  
Vol 279 (1379) ◽  
pp. 474-480 ◽  
Keyword(s):  
Double Resonance ◽  
Resolving Power ◽  
Microwave Cavity ◽  
Microwave Circuit ◽  
Nuclear Resonance ◽  
Radio Frequency Coil ◽  
Polar Solvents ◽  
Resonance Frequencies ◽  
Better Than ◽  
Double Resonances

Apparatus is described for measuring nuclear electron double resonances a t magnetic fields of 12500 G, in the microwave radiation of about 35000 Mc/s and at nuclear resonance frequencies from 3 to 60 Mc/s. The microwave circuit permits saturation of solutions of certain organic free radicals in solution in non-polar solvents when placed in a microwave cavity with a radio-frequency coil mounted inside. The resolving power of the nuclear resonance spectrometer is better than 1 in 10 8 . Recordings are presented to illustrate the performance of the apparatus.

scholarly journals Observational Approach and Perspective

1983 ◽  
Vol 71 ◽  
pp. 651-652
Author(s):  
G.S. Vaiana
Keyword(s):  
Angular Resolution ◽  
Resolving Power ◽  
Speckle Imaging ◽  
Lunar Occultation ◽  
Better Than

Goldberg: Well you did not cover more than half of my planned talk! (laughter). Let me comment on interferometric techniques, in particular speckle imaging which you mentioned. Doing speckle imaging with the largest telescopes now available will not give you better than the theoretical resolving power of the telescope. With a 4m telescope that is about 30 marc sec in the visible. That happens to be the radius of the supergiant Betelguese. So you are not going to achieve much with speckle imaging on these stars. One technique which has not been adequately exploited is that of lunar occultation which can give much better angular resolution than speckle, of the order of 2-3 marc sec. By using suitably chosen filters it may be possible to see structure on the disks of stars.

scholarly journals High Resolution Imaging Forty Years Ago

1994 ◽  
Vol 158 ◽  
pp. 337-341
Author(s):  
R. C. Jennison
Keyword(s):  
High Resolution ◽  
Point Sources ◽  
Resolving Power ◽  
High Angular Resolution ◽  
Electromagnetic Spectrum ◽  
High Resolution Imaging ◽  
Resolution Imaging ◽  
Optical Telescopes ◽  
Very High ◽  
Better Than

This conference is concerned with the very high resolution imaging of cosmic sources in many parts of the electromagnetic spectrum. Various techniques are now available and the equipment is often automated and highly sophisticated but the term ‘very high angular resolution’ is comparative. Many of the problems existed over forty years ago when the best resolving power was about half a degree and the two major radio ‘stars’ appeared to be point sources. Very high resolution imaging in those days was the struggle to reach one minute of arc and Hanbury Brown had set his sights on considerably better than one second of arc with the concept of the intensity interferometer. The dream was to achieve a resolving power comparable to that of optical telescopes.

scholarly journals Diffraction of Light by a Two-Dimensional Lattice of Spheres

2012 ◽  
Vol 2012 ◽  
pp. 1-10
Author(s):  
Bernard de Dormale ◽  
Vo-Van Truong
Keyword(s):  
Electromagnetic Field ◽  
Optical Properties ◽  
Multipole Expansion ◽  
Two Dimensional ◽  
Dimensional Lattice ◽  
Theoretical Approaches ◽  
Diffraction Of Light ◽  
Potential Applications ◽  
Computational Procedures ◽  
A New Technique

Two-dimensional arrays of particles are of great interest because of their very characteristic optical properties and numerous potential applications. Although a variety of theoretical approaches are available for the description of their properties, methods that are accurate and convenient for computational procedures are always sought. In this work, a new technique to study the diffraction of a monochromatic electromagnetic field by a two-dimensional lattice of spheres is presented. The method, based on Fourier series, can take into account an arbitrary number of terms in the multipole expansion of the field scattered by each sphere. This method has the advantage of leading to simple formulas that can be readily programmed and used as a powerful tool for nanostructure characterization.

scholarly journals Liquid flexRIXS: A RIXS endstation for molecular systems at BESSY II

2016 ◽  
Vol 2 ◽  
Author(s):  
Annette Pietzsch
Keyword(s):  
Gas Flow ◽  
Flow Cell ◽  
Resolving Power ◽  
Liquid Jet ◽  
X Ray ◽  
Molecular Systems ◽  
X Ray Scattering ◽  
Liquid Samples ◽  
Better Than ◽  
Ray Scattering

The liquid flexRIXS endstation is dedicated to resonant inelastic x-ray scattering experiments on liquid samples and gasses in the soft x-ray range. The liquids are injected into the chamber via a liquid jet system whereas gasses and also small amounts of liquids can be investigated using a liquid/gas flow cell. The MCP-based RIXS spectrometer allows for a resolving power of better than 1000.

scholarly journals A new radio telescope of high resolving power

1959 ◽  
Vol 9 ◽  
pp. 166-170
Author(s):  
S. E. Khaĭkin ◽  
N. L. Kaĭdanovskiĭ
Keyword(s):  
Relative Accuracy ◽  
Resolving Power ◽  
Normal Operation ◽  
Radio Telescopes ◽  
New Radio ◽  
Parabolic Reflectors ◽  
Half Power ◽  
Reflecting Surface ◽  
Permissible Deviation ◽  
Better Than

Attempts to construct large parabolic reflectors for microwaves have met with the following difficulty. For normal operation of radio telescopes, the form of the reflecting surface must not deviate from the theoretical by more than 0.1λ; therefore, the larger its size the higher the requirements for relative accuracy (i.e., the ratio of the largest permissible deviation to the cross-section of the reflector). So far, a relative accuracy better than 10–4 has not been attained in any of the existing radio telescopes, and there are no grounds for supposing that it can be increased considerably.Since the deviation from the theoretical form of the surface should not be more than 0.1λ, then for a relative accuracy of 10–4, the diameter of the reflector D cannot be much larger than 1000λ, and the beamwidth cannot be less than 3 minutes of arc (the beam angle is equal to about λ/D at half-power width).

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